A test device for a lens module in respect of visible light and in respect of infrared light includes a test fixture and a display able to show both types of light in images captured. The test fixture supports the lens module. The display is configured to display pictures of test cards captured by the lens module. The display includes a display panel and a backlight module located on a side of the display panel. The backlight module includes a first light source and a second light source, the first light source emits visible light, and the second light source emits infrared light.

A detection device adapted to detect lens surface and a stitching interferometer including the same are disclosed. The detection device includes: a cylindrical detection frame comprising support bosses arranged on an inner wall of the detection frame in a circumferential direction of the detection frame, the lens to be detected being placed on the support bosses; and a plurality of support units mounted at a bottom of the detection frame in the circumferential direction of the detection frame, each of the support units comprising: a support mechanism configured to be movable in an axial direction of the detection frame and cooperate with the support bosses so as to support the lens to be detected together; and a balance mechanism configured to provide a balancing force for balancing with force of the support mechanism for supporting the lens to be detected, so that axial support force of each supporting unit for the lens to be detected is equal to axial support force of each support boss for the lens to be detected in both cases where the axial direction of the detection frame is parallel to a gravity direction of the lens to be detected and inclined with respect to the gravity direction of the lens to be detected.

An optical measurement apparatus includes a thermal insulation housing, a first light-transmissive plate, a second light-transmissive plate, a heat-conductive layer, a cooling source and a photosensor. The thermal insulation housing, the first light-transmissive plate and the second light-transmissive plate define a chamber. The heat-conductive layer is disposed in the chamber, the cooling source is coupled to the heat-conductive layer, and the photosensor is disposed outside the chamber and on one side of the second light-transmissive plate facing away from the first light-transmissive plate.

A camera-testing box for testing optical properties of an image-capturing device includes a box body, a light source, a photographic film, a mask, and a base. The light source is disposed inside the light-free box body. The photographic film is disposed on a side of the light source inside the box body. The mask is disposed on a side of the photographic film away from or facing the light source, and the mask includes a transparent area and a shielding area to reduce flare-causing light reflected by screws and other extraneous objects in the camera-testing box. The base is disposed inside the box body, and on a side of the mask away from the light source. The base supports the to-be-tested image-capturing device.

The present invention discloses a phase alignment system and method of oscillating mirror. The present invention utilizes the reciprocating scanning symmetry feature of the simple harmonic oscillation motion of the oscillating mirror to construct scanning pattern data with complementary pixel brightness and darkness. When the phase difference parameter applied by the scan controller is consistent with the actual phase of simple harmonic oscillation of the oscillating mirror, the scanning pattern data with complementary pixel brightness and darkness and the reciprocating motion of the oscillating mirror are accurately matched, and a perfect stitched continuous scanning line with uniform brightness is obtained on the projection plane, thereby achieving the effect of being clearly distinguishable, easy to detect, and convenient for alignment operation.

A system for measuring (200) a sample (2) by deflectometry comprising: a source (10) for generating a light beam in a source plane (105); an illumination module (19) for forming an illumination beam (9) comprising: a first converging optical element (18); a first selection optical element (16) with a first aperture (160); reflective matrix optical modulation means (30) to form a pattern (7), said first aperture (160) being configured to control the angles of said illumination beam (9) on said reflective matrix optical modulation means (30); a Schlieren lens (20) for obtaining an angle-intensity encoding of said pattern (7) on the sample (2); imaging (40) and detecting means (50) for detecting an image of said sample (2).

The present disclosure provides an apparatus and method for wavefront reconstruction based on rotationally symmetric extended structured light illumination. The apparatus includes a laser device, a neutral density filter, a microscope objective, a pinhole, a collimating lens, a beam splitter prism, a spatial light modulator, a lens to be measured, and an image acquisition device that are sequentially arranged. The method permits modulation of incident parallel light into phase grating-like structured light by using a spatial light modulator. Based on the characteristic of non-infinitely small pixel unit of the spatial light modulator, changing the modulation pattern of the spatial light modulator may result in different forms of structured light. Not only the object to be measured but also the real structured light wavefront can be recovered by acquiring diffraction spots at the focal plane and simultaneously updating the object plane and the structured light plane using an algorithm

The invention relates to a method for detecting the absolute temperature or temperature changes and/or the absolute wavelength or wavelength changes of an optical probe signal using an optical detection device including an optical waveguide structure defining an optical input port adapted to receive the optical probe signal and a first and a second optical output port adapted to output a first and a second optical detection signal, respectively. As a response to the optical probe signal, the optical waveguide structure being configured in such a way that a first power transfer function characterizing the transmission of the optical probe signal from the optical input port to the first optical output port differs, with respect to its wavelength and temperature dependency, from a second power transfer function characterizing the transmission of the optical probe signal from the optical input port to the second optical output port. The method includes the steps of transmitting the optical probe signal having a predetermined, but not necessarily constant, wavelength to the optical input port; detecting the first and second optical detection signal at the first and second optical output port by means of a first a and second opto-electrical converter which create a first and second electrical signal corresponding to the optical power of the respective first or second optical detection signal; measuring values of the first and second electrical signal and determining an absolute temperature value or a value of a temperature change of the optical waveguide structure and/or an absolute wavelength value or a value of a wavelength change of the optical probe signal by using the values measured of the first and second electrical signal and a first and a second previously determined wavelength and temperature dependency of both the first and second power transfer function. The invention further relates to an optical detection device for implementing this method.

A metrology system is disclosed, in accordance with one or more embodiments of the present disclosure. The metrology system includes a stage configured to secure a sample, one or more diffraction-based overlay (DBO) metrology targets disposed on the sample. The metrology system includes a light source and one or more sensors. The metrology system includes a set of optics configured to direct illumination light from the light source to the one or more DBO metrology targets of the sample, the set of optics including a half-wave plate, the half-wave plate selectively insertable into an optical path such that the half-wave plate selectively passes both illumination light from an illumination channel and collection light from a collection channel, the half-wave plate being configured to selectively align an orientation of linearly polarized illumination light from the light source to an orientation of a grating of the one or more DBO metrology targets.

A system for testing an optical surface, the system comprising a non-coherent light source, a detector, a test plate positioned between the non-coherent light source and the optical surface, the test plate separated from the optical surface by a gap, and a processor. The processer is configured to cause the non-coherent light source to illuminate the test plate and optical surface with non-coherent light, control the detector to capture an interferogram produced by interference between light reflected from the test plate and light reflected from the optical surface, and perform quantitative analysis on the interferogram to characterize aberrations in the optical surface.