An optical path test system includes a return light test unit for emitting laser light to an optical path monitoring unit to simulate return light received by the optical path monitoring unit in a normal operation; a light path monitoring unit arranged on a light path of the return light testing unit for receiving the return light and normally emitting laser light; and a power detector for receiving the laser light emitted by the light path monitoring unit so as to monitor stability of output power of the chip when the light path monitoring unit receives the return light emitted by the return light testing unit. The technical solution in the present invention emits laser light to a tested laser chip to simulate return light received by the tested laser chip in a normal operation, and a return light resistance threshold of the laser chip can be accurately evaluated.

A method for optimization of photonic devices is disclosed. The method includes receiving a set of unconstrained latent variables; mapping the set of unconstrained latent variables to a constrained space to generate a constrained device; calculating the permittivity across each element of the constrained device; determining a permittivity-constrained width gradient based at least partially on the permittivity across each element; and optimizing the set of unconstrained latent variables by at least partially using the permittivity-constrained width gradient.

Disclosed herein is a method including: providing a light guiding arrangement (LGA) configured to redirect light, incident thereon in a direction perpendicular to an external surface of the sample, into or onto the sample, such that light impinges on an internal facet of the sample nominally normally thereto; generating a first incident light beam (LB), directed at the external surface normally thereto, and a second incident LB, parallel to the first incident LB and directed at the LGA; obtaining a first returned LB by reflection of the first incident LB off the external surface, and a second returned LB by redirection by the LGA of the second incident LB into or onto the sample, reflection thereof off the internal facet, and inverse redirection by the LGA; measuring an angular deviation between the returned LBs and deducing therefrom an actual inclination angle of the internal facet relative to the external surface.

An object of the present invention is to provide an information processing apparatus, an information processing method, and a program which make it possible to appropriately identify a lens from an image showing a cross section of the lens.

In the present invention, a processor detects an existing region of a lens in a target image showing a cross section of a part including the lens in a target device including the lens, and the processor identifies the lens of the target device existing in the existing region based on a feature amount of the existing region by an identification model constructed by machine learning using a plurality of learning images showing a cross section of the lens.

Techniques are disclosed for systems and methods to provide improved ocular aberrometry recovery. An ocular aberrometry system includes a wavefront sensor configured to provide wavefront sensor data associated with an optical target monitored by the ocular aberrometry system and a logic device configured to communicate with the wavefront sensor. The logic device is configured to receive ocular aberrometry output data including at least the wavefront sensor data provided by the wavefront sensor, identify imaging artifact induced singularities in the received ocular aberrometry output data, determine corrected aberrometry output data based, at least in part, on the identified singularities and the received ocular aberrometry output data, and generate user feedback corresponding to the received ocular aberrometry output data based, at least in part, on the corrected aberrometry output data.

An object of the present invention is to provide an optical fiber test method, an optical fiber test apparatus, and a program, capable of detecting a boundary of an optical fiber line facility regardless of a change in a noise amount. A change amount (a differential value) of an OTDR waveform increases toward a distal end due to noise effects, making it difficult to determine a boundary of the optical fiber using the change amount. Therefore, in the present invention, a dispersion of the OTDR waveform, which increases toward a distal end due to noise effects, is also used to determine the boundary of the optical fiber. In other words, in the present invention, the noise amount is expressed by the dispersion, and the dispersion is compared with the change amount such as a differential value as a threshold, to determine the boundary of the optical fiber. For this reason, when noise increases, the threshold increases together with an increase in the change amount, and therefore, the boundary of the optical fiber can be determined regardless of noise.

An optical path test system includes a return light test unit for emitting laser light to an optical path monitoring unit to simulate return light received by the optical path monitoring unit in a normal operation; a light path monitoring unit arranged on a light path of the return light testing unit for receiving the return light and normally emitting laser light; and a power detector for receiving the laser light emitted by the light path monitoring unit so as to monitor stability of output power of the chip when the light path monitoring unit receives the return light emitted by the return light testing unit. The technical solution in the present invention emits laser light to a tested laser chip to simulate return light received by the tested laser chip in a normal operation, and a return light resistance threshold of the laser chip can be accurately evaluated.

A spectacle lens with has permanent markings is mounted on a mounting, in particular a suction mounting. The apparent location of the permanent markings is detected on the spectacle lens with a detection device. Additionally, the spectacle lens is illuminated eccentrically with respect to an optical axis of the detection device using eccentric light sources. Reflections from the lights sources on the spectacle lens are likewise detected. On the basis of the detected reflections and the apparent location of the permanent markings, the position and/or orientation of the mounted spectacle lens are determined.

A system for detecting refractive power of a dry ophthalmic lens under inspection, comprising: a) a top camera 10 arranged to view the ophthalmic lens 40 through an optical module 25; b) an optically transparent surface 30 to position the ophthalmic lens 40 for inspection; c) a precisely calibrated glass target 50 suitably positioned on a transparent plate 60, arranged to achieve an image of the ophthalmic lens 40 overlaid with the image of the pattern on the target 50; d) at least one light source having multiple wavelength LEDs to capture different images under multiple lighting conditions.

The present invention discloses an aspheric lens eccentricity detecting device based on wavefront technology and a detecting method thereof. The device comprises: an upper optical fiber light source, an upper collimating objective lens, an upper light source spectroscope, an upper beam-contracting front lens, an upper beam-contracting rear lens, an upper imaging detector, an upper imaging spectroscope, an upper wavefront sensor, a lens-under-detection clamping mechanism, a lower light source spectroscope, a lower beam-contracting front lens, a lower beam-contracting rear lens, a lower imaging spectroscope, a lower wavefront sensor, a lower imaging detector, a lower collimating objective lens and a lower optical fiber light source. The present invention achieves non-contact detection, with no risk of damaging the lens, and there is no moving part in the device, so the system reliability and stability are high; and in the present invention, various eccentricity errors in the effective aperture of the aspheric lens can be detected at a time, thereby avoiding errors caused by splicing detection, and also greatly reducing the detection time, thus being applicable to online detection on an assembly line.