Patent classifications
G01M11/04
Optical device, optical test bench and optical test method
This optical system includes: a device (106) for generating a plane light wave, called a collimated light wave (OL.sub.col); and a device (114) for deviating the collimated light wave so as to provide a light wave, called a test light wave (OL.sub.test), the deviating device (114) having an adjustable focal length.
Optical device, optical test bench and optical test method
This optical system includes: a device (106) for generating a plane light wave, called a collimated light wave (OL.sub.col); and a device (114) for deviating the collimated light wave so as to provide a light wave, called a test light wave (OL.sub.test), the deviating device (114) having an adjustable focal length.
TEST DEVICE FOR LENS MODULE
A test device for a lens module in respect of visible light and in respect of infrared light includes a test fixture and a display able to show both types of light in images captured. The test fixture supports the lens module. The display is configured to display pictures of test cards captured by the lens module. The display includes a display panel and a backlight module located on a side of the display panel. The backlight module includes a first light source and a second light source, the first light source emits visible light, and the second light source emits infrared light.
TEST DEVICE FOR LENS MODULE
A test device for a lens module in respect of visible light and in respect of infrared light includes a test fixture and a display able to show both types of light in images captured. The test fixture supports the lens module. The display is configured to display pictures of test cards captured by the lens module. The display includes a display panel and a backlight module located on a side of the display panel. The backlight module includes a first light source and a second light source, the first light source emits visible light, and the second light source emits infrared light.
DETECTION DEVICE FOR DETECTING LENS SURFACE IN STITCHING INTERFEROMETER
A detection device adapted to detect lens surface and a stitching interferometer including the same are disclosed. The detection device includes: a cylindrical detection frame comprising support bosses arranged on an inner wall of the detection frame in a circumferential direction of the detection frame, the lens to be detected being placed on the support bosses; and a plurality of support units mounted at a bottom of the detection frame in the circumferential direction of the detection frame, each of the support units comprising: a support mechanism configured to be movable in an axial direction of the detection frame and cooperate with the support bosses so as to support the lens to be detected together; and a balance mechanism configured to provide a balancing force for balancing with force of the support mechanism for supporting the lens to be detected, so that axial support force of each supporting unit for the lens to be detected is equal to axial support force of each support boss for the lens to be detected in both cases where the axial direction of the detection frame is parallel to a gravity direction of the lens to be detected and inclined with respect to the gravity direction of the lens to be detected.
LEVEL CORRECTION SYSTEM
A level correction system includes a first adjustment device, a chuck device provided on the first adjustment device, a first reflective device provided on the chuck device, a second adjustment device, a carrying table provided on the second adjustment device, a second reflective device provided on the carrying table, a laser emitter configured to emit incident laser light, a laser receiver, and a controller. The first reflective device and the second reflective device are used to reflect the incident laser light to form a reflected laser light. The laser receiver is used to receive the reflected laser light. The controller is used to determine a height of the chuck device or the carrying table and whether a center point of a reflected light spot formed by the reflected laser light is offset from a center point of an incident light spot formed by the incident laser light.
LEVEL CORRECTION SYSTEM
A level correction system includes a first adjustment device, a chuck device provided on the first adjustment device, a first reflective device provided on the chuck device, a second adjustment device, a carrying table provided on the second adjustment device, a second reflective device provided on the carrying table, a laser emitter configured to emit incident laser light, a laser receiver, and a controller. The first reflective device and the second reflective device are used to reflect the incident laser light to form a reflected laser light. The laser receiver is used to receive the reflected laser light. The controller is used to determine a height of the chuck device or the carrying table and whether a center point of a reflected light spot formed by the reflected laser light is offset from a center point of an incident light spot formed by the incident laser light.
MULTI-DISTANCE TESTING DEVICE
A multi-distance testing device includes a testing machine supporting a to-be-tested component, a first guide rail located on one side of the testing machine, a mobile platform connected to the first guide rail and capable to slide back and forth on the first guide rail, a fixing frame fixed on the mobile platform, a display screen fixed on the fixing frame and displaying test charts, a relay lens located between the display screen and the testing machine, and a control system electrically connected or signal connected to the display screen. The relay lens shortens a test distance to construct an infinite test distance in a limited space. The control system drives the mobile platform to move to the first designated position and controls the display screen to switch and display different test charts according to the distance between the display screen and the testing machine.
MULTI-DISTANCE TESTING DEVICE
A multi-distance testing device includes a testing machine supporting a to-be-tested component, a first guide rail located on one side of the testing machine, a mobile platform connected to the first guide rail and capable to slide back and forth on the first guide rail, a fixing frame fixed on the mobile platform, a display screen fixed on the fixing frame and displaying test charts, a relay lens located between the display screen and the testing machine, and a control system electrically connected or signal connected to the display screen. The relay lens shortens a test distance to construct an infinite test distance in a limited space. The control system drives the mobile platform to move to the first designated position and controls the display screen to switch and display different test charts according to the distance between the display screen and the testing machine.
FRAME AND EXTERIOR SHROUDING FOR LASER PROCESSING SYSTEM
A frame for a laser processing module can be characterized as including a platform having an upper surface and a lower surface, an optics bridge spaced apart from, and extending over, the upper surface of the platform and a bridge support interposed between, and coupled to, the platform and the optics bridge. At least one selected from the group consisting of the platform and the optics bridge includes a sandwich panel. The sandwich panel can include a first plate, a second plate and a core interposed between the first plate and the second plate. The first plate and the second plate can be indirectly attached to one another by the core and the core can define at least one channel extending between the first plate and the second plate. The sandwich panel can also include a first port formed at an exterior of the sandwich panel and in fluid communication with the at least one channel, and a second port formed at the exterior of the sandwich panel and in fluid communication with the at least one channel.