An optical testing device having a light source to emit a light beam and a beam shaper with a diffractive optical element to shape the light beam and direct it onto a coupling-in area of an optical workpiece to coupling the shaped light into the optical workpiece to be inspected. The optical testing device also has a workpiece holder to hold the optical workpiece and has a detector to evaluate light emerging from the coupling-out area of the optical workpiece in order to inspect an optical property of the workpiece.

A mode control system and method for controlling an output mode of a broadband radiation source including a photonic crystal fiber (PCF). The mode control system includes at least one detection unit configured to measure one or more parameters of radiation emitted from the broadband radiation source to generate measurement data, and a processing unit configured to evaluate mode purity of the radiation emitted from the broadband radiation source, from the measurement data. Based on the evaluation, the mode control system is configured to generate a control signal for optimization of one or more pump coupling conditions of the broadband radiation source. The one or more pump coupling conditions relate to the coupling of a pump laser beam with respect to a fiber core of the photonic crystal fiber.

A structure and method for the wafer level testing of interposer-based photonic integrated circuits is described that includes the formation of an upturned mirror structure and the method of utilizing the interposer-based mirror structure for electrical and optical testing of optoelectrical circuits that include emitting components such as lasers, detecting components such as photodetectors, and both emitting and detecting components. Electrical activation of the optoelectrical emitting or sending devices and the subsequent detection and measurement of the optical signals in detecting or receiving devices provides information on the operability or functionality of the PIC on the die at the wafer level, prior to die separation or singulation, using the electrical and optical components of the PIC circuit.

Disclosed in the present invention is a polarity, insertion loss and return loss tester for a multi-core optical fiber, the tester comprising an integrating sphere, wherein the integrating sphere has an incident light channel, the incident light channel comprising an incidence end, an integrating sphere cavity and a receiving end, which are sequentially in communication with each other; the integrating sphere is further provided with a reflected light channel in communication with the incident light channel, a lens assembly and an imaging device being provided in the reflected light channel; a semi-transparent and semi-reflective reflector is fixedly arranged in the incident light channel, or a movable reflective mirror is provided in the incident light channel; and incident light is reflected by the reflective mirror or the semi-transparent and semi-reflective reflector, and is then converged by the lens assembly onto the imaging device for imaging. In the present invention, return loss testing, insertion loss testing, and polarity testing of a winding-free multi-core optical fiber patch cord are carried out on one apparatus, such that the cost is reduced, and the efficiency is improved. Moreover, the reliability and accuracy of the measurement of an insertion loss value and a return loss value are also ensured on the premise of improving efficiency.

An object of the present disclosure is to enable simultaneous measurement of light intensities of a plurality of optical fibers arranged in a tape-like form.

The present disclosure is an optical monitor device including: a bend applying portion that provides a bent portion on a tape core wire in which the plurality of optical fibers is arranged in a row in a tape-like form, and a light receiving portion that receives a part of leaked light leaked from a bent portion of the tape core wire, in which in the light receiving portion, light receiving elements larger in number than the optical fibers are two-dimensionally arranged on a light receiving surface.