Patent classifications
G01N1/42
SAMPLE HOLDER FOR HOLDING A SAMPLE CARRIER CARRYING A SAMPLE
A sample holder for holding a sample carrier carrying a sample includes a sample carrier fixing element. The sample carrier fixing element includes a first section configured, when in a first position, to fix the sample carrier to the sample holder, and, when in a second position, to release the sample carrier or to provide access to an area where the sample carrier is to be located. The sample carrier fixing element also includes a second section different from the first section, the second section being operable such that upon operation of the second section the first section switches from the first position into the second position or from the second position into the first position.
SAMPLE HOLDER FOR HOLDING A SAMPLE CARRIER CARRYING A SAMPLE
A sample holder for holding a sample carrier carrying a sample includes a sample carrier fixing element. The sample carrier fixing element includes a first section configured, when in a first position, to fix the sample carrier to the sample holder, and, when in a second position, to release the sample carrier or to provide access to an area where the sample carrier is to be located. The sample carrier fixing element also includes a second section different from the first section, the second section being operable such that upon operation of the second section the first section switches from the first position into the second position or from the second position into the first position.
SAMPLE HOLDER TRANSFER DEVICE
A sample holder transfer device is for use in cryo-microscopy and for transferring a sample holder to an analysing or processing unit. The sample holder is configured for holding a sample carrier carrying a sample. The sample holder transfer device is configured to receive the sample holder, the sample holder including a sample carrier fixing element. At least one section of the sample carrier fixing element is configured, when in a first position, to fix the sample carrier to the sample holder, and, when in a second position, to release the sample carrier or provide access to an area where the sample carrier is to be placed. The sample holder transfer device includes a switching mechanism operable to switch the at least one section of the sample carrier fixing element of the sample holder from the first to the second position or from the second to the first position.
Purification System for Nitrogen Gas and Xenon Gas in Water and Isotope Static Analysis Method Thereof
A purification system for nitrogen gas and xenon gas in water and a static isotopic analysis method thereof are provided. The system includes a sample container, a carbon dioxide ice cold trap, a gas delivery main pipe and a mass spectrometer for noble gas communicated sequentially. The gas delivery main pipe is provided with branch pipelines communicated with a cryo pump and a vacuum pump set respectively, the mass spectrometer for noble gas is communicated with the vacuum pump set, and the cryo pump adsorbs or releases nitrogen gas and/or xenon gas by setting different temperatures of the cryo pump. Inlet and outlet sides of the carbon dioxide ice cold trap are respectively provided with a first valve and a second valve. Fourth and fifth valves are respectively disposed between the gas delivery main pipe and the vacuum pump set, and between the gas delivery main pipe and the cryo pump.
Purification System for Nitrogen Gas and Xenon Gas in Water and Isotope Static Analysis Method Thereof
A purification system for nitrogen gas and xenon gas in water and a static isotopic analysis method thereof are provided. The system includes a sample container, a carbon dioxide ice cold trap, a gas delivery main pipe and a mass spectrometer for noble gas communicated sequentially. The gas delivery main pipe is provided with branch pipelines communicated with a cryo pump and a vacuum pump set respectively, the mass spectrometer for noble gas is communicated with the vacuum pump set, and the cryo pump adsorbs or releases nitrogen gas and/or xenon gas by setting different temperatures of the cryo pump. Inlet and outlet sides of the carbon dioxide ice cold trap are respectively provided with a first valve and a second valve. Fourth and fifth valves are respectively disposed between the gas delivery main pipe and the vacuum pump set, and between the gas delivery main pipe and the cryo pump.
System for sample storage and shipping for cryoelectron microscopy
A system for storing and shipping samples for cryo-electron microscopy. The system comprising a cassette puck and support platform that accepts commercial cryo-EM sample cassettes and is compatible to a substantial extent with tools used in cryocrystallography. The system can also work with existing Cryo-EM storage and transport puck and cane systems. The cassette puck comprising a receptacle for holding one or more cassettes and a plurality of holes and grooves. The holes and grooves being configured for use with other tools such as tongs, support platforms, and canes.
System for sample storage and shipping for cryoelectron microscopy
A system for storing and shipping samples for cryo-electron microscopy. The system comprising a cassette puck and support platform that accepts commercial cryo-EM sample cassettes and is compatible to a substantial extent with tools used in cryocrystallography. The system can also work with existing Cryo-EM storage and transport puck and cane systems. The cassette puck comprising a receptacle for holding one or more cassettes and a plurality of holes and grooves. The holes and grooves being configured for use with other tools such as tongs, support platforms, and canes.
WORKSTATION, PREPARATION STATION AND METHOD FOR MANIPULATING AN ELECTRON MICROSCOPY GRID ASSEMBLY
The invention relates to a workstation (1), a preparation station (2) and a method for manipulating an electron microscopy grid assembly (3). The workstation (1) comprises a first compartment (101), a first gas inlet (102) for generating an overpressure in the first compartment (101), a first glove (104) and a second glove (105), each being fixed in a respective opening (106, 107) of the workstation (1), wherein the first glove (104) and the second glove (105) are movable in the first compartment (101) to manipulate objects in the first compartment (101), wherein the workstation (1) comprises a port (109) for providing a transfer device (4) for an electron microscopy grid assembly (3) in the first compartment (101). The preparation station (2) comprises a coolant reservoir (201, 202), a first part (210) configured to hold a shuttle (6) for holding an electron microscopy grid assembly (3) in a fixed orientation, wherein the preparation station (2) is configured such that the first part (210) is submergable in the cryogenic coolant when the coolant reservoir (201, 202) contains the cryogenic coolant.
WORKSTATION, PREPARATION STATION AND METHOD FOR MANIPULATING AN ELECTRON MICROSCOPY GRID ASSEMBLY
The invention relates to a workstation (1), a preparation station (2) and a method for manipulating an electron microscopy grid assembly (3). The workstation (1) comprises a first compartment (101), a first gas inlet (102) for generating an overpressure in the first compartment (101), a first glove (104) and a second glove (105), each being fixed in a respective opening (106, 107) of the workstation (1), wherein the first glove (104) and the second glove (105) are movable in the first compartment (101) to manipulate objects in the first compartment (101), wherein the workstation (1) comprises a port (109) for providing a transfer device (4) for an electron microscopy grid assembly (3) in the first compartment (101). The preparation station (2) comprises a coolant reservoir (201, 202), a first part (210) configured to hold a shuttle (6) for holding an electron microscopy grid assembly (3) in a fixed orientation, wherein the preparation station (2) is configured such that the first part (210) is submergable in the cryogenic coolant when the coolant reservoir (201, 202) contains the cryogenic coolant.
METHODS FOR FORMING A MATRIX FOR RECEIVING TISSUE SAMPLES
A custom-made matrix suitable for receiving a tissue sample is described, as well as the use thereof to obtain a multiplex histological preparation. The disclosure also relates to a multiplex biopsy array comprising tissue and/or cell samples arranged in a matrix material and to a method for the preparation of a multiplex biopsy array. Methods for preparing blocks of matrix material to be used in multiplex biopsy arrays are also described, as well as methods for loading biopsy samples in the blocks, and methods for treating and processing the blocks to form biopsy arrays. The biopsy arrays made using the block of matrix material can be used to prepare sections and slides for histological procedures, including quantitative analyses and parallel processing.