A particle size distribution measuring apparatus includes a light source that emits measurement light to a sample accommodated in a cell including a pair of light transmission plates separated from each other, one or a plurality of detectors that detects the measurement light scattered in the sample, and a particle size distribution calculator that calculates a particle size distribution of a particle group included in the sample based on output signals of the detectors. The particle size distribution measuring apparatus further includes a force applying mechanism that moves at least one of the light transmission plates to apply pressure or a shearing force to the sample in the cell, in which the particle size distribution calculator is configured to calculate the particle size distribution at the time when the pressure or the shearing force applied to the sample has changed from a first state to a second state.

In a bubble measurement device for measuring bubbles moving in a liquid, the bubble measurement device includes a measurement chamber in which the bubbles in the liquid containing solid materials are introduced into the measurement chamber from below the measurement chamber, and providing a transparent slope facing diagonally downward at a position where the introduced bubbles rise, an image capturing device to capture an image of the bubbles passing the transparent slope, an introduction pipe provided below the measurement chamber to introduce the bubbles into the measurement chamber, and a bubble introduction valve that is immersed in the liquid to be measured and performs the introduction and blocking of the bubbles into the introduction pipe.

A system comprises a particle sensor assembly, which includes a light source that transmits a light beam into an external interrogation air region; a set of receive optics that provides a receive channel, the receive optics configured to collect a scattered portion of the light beam from a particle in the interrogation air region; and an optical detector that receives the collected scattered portion. The optical detector measures a signal intensity as a function of time from the scattered portion, with the signal intensity indicating a particle size and a signal duration indicating motion of the particle through the interrogation air region. A processor is in communication with the optical detector and is operative to determine a transit time of the particle through the interrogation air region based on the signal duration, and compute an airspeed based on parameters comprising the transit time and a size of the light beam.

A system structured to monitor particle contamination of different equipment or machinery categories including power pressure systems having a monitoring module. The monitoring module includes an intake structure and an exhaust structure, wherein the intake structure is connected in fluid communication with an air intake or air supply the power pressure systems being monitored. The monitoring module further includes alarm capabilities structured to communicate alarm signals to local and remote operating personnel. In addition, a particle sensor module is structured to determine predetermined particle characteristics of an air sample received from the power pressure systems. An electronic control module (ECM) is connected in on-off activating relation to the intake and exhaust structures and the particle sensor. As such, the ECM is operative to capture and analyze an air sample from the power pressure systems within said particle sensor and categorize the particle characteristics within the captured air sample as normal or abnormal dependent on levels of contamination.

A liquid droplet and solid particle sensing device is provided that can measure the average droplet size in a spray. The present device uses a swirling flow to draw a particulate or a spry into the device for sizing and counting. The swirling flow is configured to keep all the particles away from the walls of the device and to concentrate them at the center of a flow channel to pass through the center of a light beam for high sensitivity and repeatability of the measurement.

Provided is a particle measurement device in which irradiation light emitted by a light source is expanded by an expander in a shape satisfying the requirements of a diffractive optical element, converted into parallel light, and made to enter the diffractive optical element. The diffractive optical element shapes the irradiation light entering therein into a flat top beam in which the cross section in the focal position thereof has an elongate rectangle shape. The intensity distribution of light can be made substantially uniform in a detection area formed by the shaped irradiation light.

Particle analyzers having scintillation counters are provided. Particle analyzers of interest include a flow cell for transporting particles in a flow stream, a light source for irradiating a particle in the flow stream at an interrogation point, a particle-modulated light detector for detecting light from the interrogation point, and a scintillation counter for assessing particle radioactivity. In embodiments, the scintillation counter is positioned within the flow cell and configured generate particle radioactivity data that may be associated with a given particle in a plurality of particles. Methods and non-transitory computer readable storage media for practicing the invention are also provided.

Aspects of the present disclosure include systems for detecting light from a particle in a flow stream by spectral discrimination. Systems according to certain embodiments include a light source configured to irradiate a particle propagating along a flow stream through an interrogation region, a light detection system that includes a wavelength separator component configured to pass light having a predetermined spectral range across the wavelength separator, a light adjustment component configured to continuously convey light from the irradiated particle across the wavelength separator as the particle is propagated along the flow stream through the interrogation region and a photodetector configured to detect light conveyed across the wavelength separator. Systems also include a processor for generating a photodetector signal pulse in response to light detected from the wavelength separator. Methods for detecting light with the subject systems are also described. Kits having one or more components for detecting light according to the subject methods are also provided.

A particle detecting module is provided and includes a base, a piezoelectric actuator, a driving circuit board, a laser component, a particulate sensor and an outer cover. A gas-guiding-component loading region and a laser loading region are separated by the base. By the design of the gas flowing path, the driving circuit board covering the bottom surface of the base, and the outer cover covering the surfaces of the base, an inlet path is defined by the gas inlet groove of the base, and an outlet path is defined by a gas outlet groove of the base. Consequently, the thickness of the particle detecting module is drastically reduced.

A particle detection device includes a detection tube, a light emitter, a light receiver, and a processing unit. The detection tube is for a detection solution to pass through. The light emitter generates a detection light and emits the detection light to the detection solution. The light receiver receives the detection light scattered from the detection solution. The processing unit generates a received light intensity value according to the detection signal generated by the light receiver, and determines whether the received light intensity value is greater than a first threshold value: if greater, generating a detection result of particles; otherwise, generating a detection result of no particles. Then it provides a basis for semiconductor manufacturing companies to evaluate whether the detection solution can be used in a high-precision manufacturing processes, thereby optimizing the manufacturing process and improving the yield rate of the high-precision manufacturing process.