Systems and methods are provided for determining a depth map and a reflectivity map from a structured light image. The depth map can be determined by capturing the structured light image and then using a triangulation method to determine a depth map based on the dots in the captured structured light image. The reflectivity map can be determined based on the depth map and based on performing additional analysis of the dots in the captured structured light image.

Systems and methods are provided for determining a depth map and a reflectivity map from a structured light image. The depth map can be determined by capturing the structured light image and then using a triangulation method to determine a depth map based on the dots in the captured structured light image. The reflectivity map can be determined based on the depth map and based on performing additional analysis of the dots in the captured structured light image.

A method for measuring, from a thermal device, temperature, molecular number density, and/or pressure of a gaseous compound as function of distance, the gaseous compound absorbing at least some light. The method comprises generating, for a first wavelength band and a second wavelength band, a pulse sequence comprising a light pulse or light pulses, guiding the pulse sequence into the thermal device, and measuring, as function of time, the intensity of the scattered light at the first wavelength band and at the second wavelength band. The method further comprises determining information indicative of the differential absorption between the two wavelengths bands using measured intensities and determining the temperature, the molecular number density, and/or the pressure of the gaseous compound using the information indicative of the differential absorption between the two wavelengths bands. A thermal system arranged to carry out the method.

A particle analyzing apparatus including a particle measuring section that measures a number or concentration of particles in a sample gas; a component analyzing section that measures an amount of each component of the particles in the sample gas; a flow path that branches into a first flow path that introduces the sample gas to the particle measuring section and a second flow path that introduces the sample gas to the component analyzing section; a first adjusting section that is provided in the first flow path and dilutes the sample gas with a dilution gas and introduces the diluted sample gas to the particle measuring section to adjust a measurement range of the particle measuring section; and a second adjusting section that is provided in the second flow path and adjusts an introduction time during which the sample gas is introduced to the component analyzing section.

A particle analyzing apparatus including a particle measuring section that measures a number or concentration of particles in a sample gas; a component analyzing section that measures an amount of each component of the particles in the sample gas; a flow path that branches into a first flow path that introduces the sample gas to the particle measuring section and a second flow path that introduces the sample gas to the component analyzing section; a first adjusting section that is provided in the first flow path and dilutes the sample gas with a dilution gas and introduces the diluted sample gas to the particle measuring section to adjust a measurement range of the particle measuring section; and a second adjusting section that is provided in the second flow path and adjusts an introduction time during which the sample gas is introduced to the component analyzing section.

A device includes a sample chamber (1) configured to receive the object, a polarization degree measuring member (2) configured to measure the polarization degree of the object received in the sample chamber (1), and a refractive index measuring member (3) configured to measure information corresponding to the refractive index of the object received in the sample chamber (1). The polarization degree measuring member (2) includes a polarization modulation member (11) configured to perform polarization modulation on a light beam (9) for analyzing the object and allow the modulated light beam to enter the sample chamber (1), an intensity detection member (12) configured to detect an intensity of the light beam (5) exiting from the sample chamber, and a polarization degree calculation member (13). The refractive index measuring member (3) includes a position detection member (26) and a refractive index (concentration) calculation member (13).

Systems and methods for analyzing an unknown geological sample are disclosed. The system may include at least two analytical subsystems, and each of the at least two analytical subsystems provides different information about the geological sample. The data sets from various analytic subsystems are combined for further analysis, and the system includes a chemometric calibration model that relates geological attributes from analytical data previously obtained from at least two analytical techniques. A prediction engine applies the chemometric calibration model to the combined analytical information from the geological sample to predict specific geological attributes in the unknown geological sample.

A testing device for testing an optical sample that comprises a radiation source for emitting a plurality of optical beams along an optical axis. In addition, the testing device comprises an optical element designed as a filter element for imprinting a specific polarization-direction onto the plurality of optical beams or filtering light reflected or transmitted by the optical sample. The testing device also comprises a rotation unit designed for rotating the optical sample lying on the optical axis by a rotation angle relatively to the filter element. The testing device also comprises a detection unit for determining a polarization axis of the optical sample from the rotation angle and a reflected light beam, from the plurality of optical beams, reflected by the optical sample or transmitted through the optical sample, as well as a measure for the decentration value of the optical sample.

Systems and methods for analyzing an unknown geological sample are disclosed. The system may include at least two analytical subsystems, and each of the at least two analytical subsystems provides different information about the geological sample. The data sets from various analytic subsystems are combined for further analysis, and the system includes a chemometric calibration model that relates geological attributes from analytical data previously obtained from at least two analytical techniques. A prediction engine applies the chemometric calibration model to the combined analytical information from the geological sample to predict specific geological attributes in the unknown geological sample.

A device includes a sample chamber (1) configured to receive the object, a polarization degree measuring member (2) configured to measure the polarization degree of the object received in the sample chamber (1), and a refractive index measuring member (3) configured to measure information corresponding to the refractive index of the object received in the sample chamber (1). The polarization degree measuring member (2) includes a polarization modulation member (11) configured to perform polarization modulation on a light beam (9) for analyzing the object and allow the modulated light beam to enter the sample chamber (1), an intensity detection member (12) configured to detect an intensity of the light beam (5) exiting from the sample chamber, and a polarization degree calculation member (13). The refractive index measuring member (3) includes a position detection member (26) and a refractive index (concentration) calculation member (13).