A fine ratio measuring device that measures the fine ratio of fines adhering to the surface of the material in the form of lumps includes: an illumination unit that illuminates the material in the form of lumps; an imaging unit that captures an image of the material in the form of lumps and produces image data; and an arithmetic unit including a computation unit that computes a characteristic quantity of the image data produced by the imaging unit and a conversion unit that converts the characteristic quantity computed by the computation unit to the fine ratio.

An imaging device includes: a light source including an emission surface from which a sub-terahertz wave is emitted to a measurement target; and a detector including an image sensor that detects the intensity of a reflected wave generated by the measurement target reflecting the sub-terahertz wave emitted from the emission surface.

A vision inspection system includes a platform supporting parts for inspection at an inspection zone, an inspection station positioned adjacent the platform at the inspection zone including an imaging device to image the parts in a field of view above the upper surface, and a vision inspection controller receiving images from the imaging device. The vision inspection controller includes an auto focus module for orienting the imaging device relative to the inspection zone. The auto focus module determines a working distance for the imaging device from the inspection zone. The auto focus module calculates an image contrast score of pixel values of the images at various working distances from the inspection zone. The vision inspection controller causes the inspection station to operate the imaging device at an imaging working distance corresponding to the working distance associated with the highest image contrast score.

The present invention discloses method and apparatus for collecting signals, tracking cells, and imaging control using a photosensitive chip, wherein the method for acquiring signals by a photosensitive chip comprises: closely attaching a luminous surface of a membrane carrying a light signal to be acquired to a photosensitive chip, placing the photosensitive chip attached with the membrane carrying the light signal to be acquired in a darkroom, acquiring the light signal on the photosensitive chip in the darkroom, and performing signal processing on the acquired light signal and outputting the light signal. In the method and the apparatus for acquiring signals by a photosensitive chip provided by the present invention, human participation is not needed in the whole process, the convenience and timeliness of the imaging control process are improved, and the imaging precision and efficiency are effectively improved.

A method for localizing a test region of interest on an assay membrane to determine the contours of the test region and enable calibration of the location of the test region such that the same region can be localized to image an analyte of interest after an assay run. Pre-localization of the test region limits the contours of the detection area to only the test region with a reasonable margin such that background noise received by the detector can be minimized. By limiting the region of detection to a pre-localized test region improved accuracy can be achieved in flow assay membrane tests, in particular in automated analyzer systems.

An apparatus for the production of solid dosage forms is presented, wherein the apparatus comprises a material processing chamber which is operable for manufacturing a product according to a pre-set product formation process path. The apparatus has at least one sensor for continuously monitoring formation of the product in the material processing chamber during the product formation process non-invasively in real time by sensing at least one product functional attribute value and a means for comparing each sensed product functional attribute value with a desirable product functional attribute value for that point on the product formation process path. A controller controls operation of the material processing chamber in response to the sensed product functional attribute value for maintaining the product on the product formation process path.

The present invention relates to a device, use of the device and a method for high contrast imaging, particularly suitable for imaging of moving object of interest such as gas expanding from a gas jet or physical or chemical or biological processes in material. The device for high-contrast imaging comprises a beam splitter for splitting a beam into a probe beam and a reference-beam, wherein the probe beam is directed to an object; a self-imaging system for receiving the probe beam from the object and imaging the object on itself while in a preferred embodiment, the system preserves a reflected probe beam divergence. The beam interacts with the object at least twice; and the reflected probe beam is further directed to the splitter after the last interaction; and detection means receiving the probe beam from the splitter.

Techniques, devices and methods for discriminating a target from a background material without optimizing directly on the target are provided. The devices and methods can generate pass bands of single or multiple wavelengths of variable shape and intensity, and can also select and control the shape of the pass band profiles to improve the detection of targets of interest.

An optical inspection apparatus includes: a first filter having a plurality of passbands; a first beam splitter to reflect a first light that exits from the first filter to transfer the first light to an inspection target; a second beam splitter to split a second light, which is provided by reflecting the first light by the inspection target, into a first split light and a second split light; a second filter to receive the first split light, and having a passband different from the passbands of the first filter; a fluorescence microscope to generate a fluorescence image from a third light that exits from the second filter; and a first imaging module to generate a first image from the second split light.

Provided is a method of correcting an error of an optical sensor including a light source and an image sensor, the method including emitting light to a material by driving the light source, acquiring an image of the material by the image sensor, and correcting an error of a distance between the light source and the image sensor of the optical sensor based on a gradation of the acquired image of the material.