Examples of the present disclosure relate to an apparatus and method for detecting light reflected from an object. The apparatus includes a light guiding element including a diffracting structure configured to direct incident light to an object; and an optical sensing element configured to detect light reflected from said object.

According to an aspect of the present inventive concept there is provided a device for imaging of a microscopic object, the device comprising: an array of light sensitive areas sensitive to detect light spanning a wavelength range of at least 400-1200 nm; at least one light source comprising at least a first point of operation in which the at least one light source is configured to generate visible light, and a second point of operation in which the at least one light source is configured to generate infrared light, and being arranged to illuminate the microscopic object such that light is scattered by the microscopic object; wherein the array of light sensitive areas is configured to detect an interference pattern formed between the scattered light and non-scattered light; the device being configured to be set in a selected point of operation from the at least first and second points of operation, for detecting the interference pattern for imaging the microscopic object at a wavelength defined by the selected point of operation.

The present disclosure relates to non-invasive nerve identification using snapshot polarimetry. The present disclosure further relates to a system for nerve identification, the system comprising a camera including a sensor, and a filter having a linear polarizer array, an illumination system configured to illuminate a target area with polarized light illumination, the polarized light illumination having at least one predetermined polarization angle, the illumination system including one more light sources, and one or more polarizer filters, and a processor configured to process imaging data obtained from the camera, and output a birefringence map of the target area including indicia of a nerve structure.

The present invention relates to a novel provided gallium arsenide substrates as well as the use thereof. The gallium arsenide substrates provided according to the invention exhibit a so far not obtained surface quality, in particular a homogeneity of surface properties, which is detectable by means of optical surface analyzers, by way of example by means of ellipsometric lateral substrate mapping for optical contact-free quantitative characterization.

A gallium arsenide substrate which exhibits at least one surface having a surface oxide layer comprising gallium and arsenic oxides and which exhibits at least one surface having, according to an ellipsometric lateral substrate mapping with an optical surface analyzer, based on a substrate diameter of 150 mm as reference, a defect number of <6000 and/or a total defect area of less than 2 cm.sup.2, wherein a defect is defined as a continuous area of greater than 1000 μm.sup.2 having a deviation from the average measurement signal in elipsometric lateral substrate mapping with an optical surface analyzer of at least ±0.05%.

The present disclosure provides a material identification method and a device based on laser speckle and modal fusion, an electronic device and a non-transitory computer readable storage medium. The method includes: performing data acquisition on an object by using a structured light camera to obtain a color modal image, a depth modal image and an infrared modal image; preprocessing the color modal image, the depth modal image and the infrared modal image; and inputting the color modal image, the depth modal image and the infrared modal image preprocessed into a preset depth neural network for training, to learn a material characteristic from a speckle structure and a coupling relation between color modal and depth modal, to generate a material classification model for classifying materials, and to generate a material prediction result in testing by the material classification model of the object.

Provided is an antibiotic susceptibility evaluation apparatus including a sample unit including a sample and at least an antibiotic disk arranged on the sample, a light source radiating coherent light to the sample unit, an image sensor detecting transmitted light passing through the sample unit to obtain a sample image, and a controller configured to receive a first sample image, which is an image of the sample at an initial time when the antibiotic disk is arranged on the sample unit, and a second sample image, which is an image of the sample after a preset time, to obtain a spatial correlation of an interference pattern between the first sample image and the second sample image, and to evaluate susceptibility of the sample to antibiotics based on the spatial correlation according a position.

An apparatus (100) for optically characterizing a textile sample (106) comprises a presentation subsystem (102) comprising a viewing window (108). A radiation subsystem (114) comprises a radiation source (120) for directing a first, ultraviolet radiation (122) and a second, visible radiation (123) toward the sample (106), and causing the sample (106) to produce a fluorescent radiation (124) and a reflected radiation (125). A sensing subsystem (126) comprises an imager (130) for capturing the fluorescent radiation (124) and the reflected radiation (125) in an array of pixels (408). A control subsystem (132) comprises a processor (136) for controlling the presentation subsystem (102), the radiation subsystem (114), and the sensing subsystem (126), and for creating a fluorescent and reflected radiation image (400) containing both spectral information and spatial information in regard to the fluorescent radiation (124) and the reflected radiation (125).

A detection system including a plurality of terahertz light sources; and a plurality of terahertz-wave detecting devices which detect terahertz waves, wherein the plurality of terahertz light source includes a first terahertz light source which outputs the terahertz waves in a first on/off pattern with a first cycle, and a second terahertz light source which outputs the terahertz waves in a second on/off pattern with a second cycle which is different from the first cycle.

We describe a method and a system for analysing a sample (12) using spectral polarimetry. The system comprises a light source, a first polarizer (22) having a first polarization angle for polarizing light from the light source, a second polarizer having a second polarization angle which is different to the first polarization angle, a birefringent component (20) which comprises a birefringent material, and a detector for receiving polarized light from the second polarizer (16). The birefringent component is positioned between the first and second polarizers and the sample is placed between the first polarizer and the second polarizer. The method comprises directing polarized light having a first polarization angle through a birefringent component which comprises a birefringent material, illuminating the sample with the light passing through the birefringent component, directing light through a polarizer having a second polarization angle which is different to the first polarization angle, and detecting the light transmitted through the polarizer.