Provided is an identification apparatus wherein each spectral light beam corresponding to a predetermined wavenumber shift is projected to the imaging portion) so that a distance between a projection position of the spectral light beam corresponding to the predetermined wavenumber shift on the imaging portion and a changed projection position as a result of the different excitation wavelength is shorter than a distance at the imaging lens between an optical path of the spectral light beam corresponding to the predetermined wavenumber shift and a changed optical path as a result of the different excitation wavelength.

Provided is a method for the simultaneous determination of parameters, in particular of at least two, three or four parameters, of at least one resin layer applied to at least one carrier material by recording and evaluating at least one NIR spectrum in a wavelength range between 500 nm and 2500 nm, preferably between 700 nm and 2000 nm, more preferably between 900 nm and 1700 nm, and particularly advantageously between 1450 nm and 1550 nm, using at least one NIR measuring head, in particular at least one NIR multimeter head.

A method for inspecting an incision made on a lateral surface of a plastic cap includes the following steps: conveying the plastic cap along an inspection path through an inspection zone in which the cap is inspected; emitting a polarized light collimated along a light orientation towards the inspection zone; capturing image data representing at least one image of the lateral surface of the cap through an optical sensor; receiving the image data in a control unit; processing the image data to derive information about the incision.

Inspection system for visually inspecting objects, such as the surface of objects, during their transport along a transport path, the system including a free space allowing the objects to pass through the system and including an inspection area in which the objects are inspected visually, an illumination device for illuminating at least the peripheral surface of an object in the inspection area, and a plurality of camera/sensor devices, each being configured to take an image of a surface section of said peripheral surface in its respective field of view by receiving light running along a respective light path from the illuminated object to the camera/sensor device, the fields of view of the camera/sensor devices in combination providing for full peripheral coverage of azimuth angle 360° of the inspection area wherein the length of at least one of the light paths is longer than the spatial distance between its ends.

A pistachio sorting device capable of accurately detecting BGY fluorescence emitted from a fluorescent material adhered to a shell of an in-shell pistachio to perform pass/fail determination and sort out defective products at high speed is provided. The pistachio sorting device comprises a lighting device 11 for irradiating in-shell pistachios which are objects to be sorted in an inspection region with ultraviolet light having a maximum peak wavelength within a range of 345 nm to 390 nm, an optical filter 12 for selectively transmitting light within a wavelength range of 500 nm to 600 nm, a sensor 13 for detecting a two-dimensional intensity distribution of the fluorescence transmitted through the optical filter 12 to generate two-dimensional image data indicating a two-dimensional intensity distribution of fluorescence in the inspection region, and a determining device for determining a pass/fail of for each object to be sorted 10 based on the two-dimensional image data.

An object of the present invention is to improve the quality level discrimination accuracy of the grain G by a grain quality level discrimination device. The device includes an optical unit 3 that emits light to the grain G, receives reflected and/or transmitted light from the grain G by a photosensor, and obtains information for discrimination of the quality level of the grain G from the upper and lower surface side of the grain G, and a quality level discrimination unit 7 that discriminates the quality level of the grain G on the basis of the information. The information on the upper and lower surface sides can be acquired by one optical unit at the same time so that the divergence therebetween due to the displacement or variation of the attitude of the grain G can be avoided. The reference plate for the correction of the information is placed outside of the moving path of the grain G to prevent it from soiling or damaging. Thus the deterioration of information can be avoided. Further, a reference plate especially for the information to be obtained from the side surface of the grain G may be provided for enhancing the accuracy of the side surface information. Thus the quality level discrimination accuracy can be improved further.

A physical object processing system is described that includes a process station, a transport facility, an optical imaging system, an image sensor and data process facilities. The transport facility transports objects along the process station that performs processing steps to the object. The image sensor acquires a digital image from an optical image of the physical objects provided by the optical imaging system. The data process facilities in turn process the digital image to control the process station. The optical imaging system maps the optical image of the at least one physical object onto the image sensor at an at least substantially fixed position during a time-interval for acquiring the digital image.

The present disclosure provides an inspection device for continuously inspecting fed containers, in particular bottles, said inspection device comprising a feed device configured to feed containers thereto in succession, at least one inspection unit, configured to inspect the fed containers, a discharge conveying device configured to discharge the inspected containers, and a throughput station for the containers, which is arranged between the feed conveying device and the discharge conveying device, wherein the throughput station comprises a conveyor arrangement with an individual drive and a plurality of conveying units, which are movable by means of the individual drive individually and independently of one another, the conveyor arrangement being configured to convey the containers from the feed conveying device to the discharge conveying device.

Reflective or embossed regions are supposed to be illuminated as uniformly as possible over the greatest possible angle range for optical inspection using in one aspect an apparatus for inspection having a passive lighting body spotlighted by a spotlight light source, which body illuminates a test region, as well as at least one optical sensor directed at the test region. The lighting body is configured to be partially transmissible, and the optical sensor is disposed, with reference to the test region, optically beyond the lighting body, detecting the test region through the lighting body, and/or the spotlight light source is directed at the lighting body and the lighting body extends continuously over at least 120° in a section plane that stands perpendicular to the surface of the flat items to be tested or inspected.

The present invention relates to a device for optical characterisation of a sample and/or of the material(s) of the same having an illumination unit that can be orientated to illuminate with incident light a sample spatial portion into which the sample can be introduced, a detection unit which is orientated or can be orientated to image the sample introduced into the sample spatial portion by receiving light reflected by the sample, and which is configured to detect at least two different, preferably orthogonal, polarization components in the reflected light, and an evaluation unit with which, in the imaging data recorded by the detection unit, those imaged surface elements (reflection elements) of the sample can be identified, and with which the detected different polarization components for these reflection elements can be evaluated for optical characterisation.