A method is described in which a reflection is obtained of a laser light pattern reflected from a substrate. A reflection of diffuse light may be obtained from the substrate. A first parameter may be determined, relating to the substrate from the reflected laser light pattern. A second parameter may be determined, relating to the substrate from the reflected diffuse light and a characteristic of the substrate may be determined from the first and second parameters. A print apparatus and a machine-readable medium are also disclosed.

Embodiments of the invention provide systems and methods for monitoring and removing contaminants from a conveyor surface based upon predicted frictional engagement qualities detected on a conveyor surface. In some examples, the methods may include monitoring the conveyor surface with at least one sensor configured to sense a condition on the conveyor surface. The sensor may detect the presence of a contaminant, and communicate the location of the detected contaminant to a processor. A treatment cycle may then be initiated to remove or displace the contaminant from the conveyor surface after the presence of a contaminant has been detected.

Embodiments of the invention provide systems and methods for monitoring and removing contaminants from a conveyor surface based upon predicted frictional engagement qualities detected on a conveyor surface. In some examples, the methods may include monitoring the conveyor surface with at least one sensor configured to sense a condition on the conveyor surface. The sensor may detect the presence of a contaminant, and communicate the location of the detected contaminant to a processor. A treatment cycle may then be initiated to remove or displace the contaminant from the conveyor surface after the presence of a contaminant has been detected.

The quality measurement method for a long sheet material W includes measuring cellulose fibers, % moisture, and % ash of the paper web W by using area cameras 1102 to 1106 having an infrared light receiving element and a light source 1100 having an infrared light emitting LED element. Performance check for the infrared cameras 1102 to 1106 over the entire width and correction of measured values are performed by using consistency between measured values for the same point in an overlap area measured by adjacent cameras and reference samples 1107 at the off-sheet positions provided at both sides.

Disclosed are methods that, by not physically touching a material being measured, can measure the material's differential response quite accurately. A collimated light shines on the material under test, is reflected off it, and is then captured by a device that records the position where the reflected light is captured. This process is done both before and after the material is processed in some way (e.g., by applying a coat of paint). The change in position where the reflected light is captured is used in calculating the deflection of the material as induced b the process. This measured induced deflection is then used to accurately determinate the stress introduced into the material by the process. Other characteristics of the material under test, such as aspects of the material composition of a bi-metallic strip, for example, may also be determined from a deflection measurement.

Disclosed are methods that, by not physically touching a material being measured, can measure the material's differential response quite accurately. A collimated light shines on the material under test, is reflected off it, and is then captured by a device that records the position where the reflected light is captured. This process is done both before and after the material is processed in some way (e.g., by applying a coat of paint). The change in position where the reflected light is captured is used in calculating the deflection of the material as induced b the process. This measured induced deflection is then used to accurately determinate the stress introduced into the material by the process. Other characteristics of the material under test, such as aspects of the material composition of a bi-metallic strip, for example, may also be determined from a deflection measurement.

An optical media sensor includes a guide wall, a light emitter, a light receiver and a blower. The guide wall has an opening. The light emitter emits light to a medium sheet through the opening. The light receiver detects an amount of light travelling from the medium sheet. The blower generates a wind pressure that presses the medium sheet against the guide wall when detecting the amount of light.

An optical media sensor includes a guide wall, a light emitter, a light receiver and a blower. The guide wall has an opening. The light emitter emits light to a medium sheet through the opening. The light receiver detects an amount of light travelling from the medium sheet. The blower generates a wind pressure that presses the medium sheet against the guide wall when detecting the amount of light.

Disclosed are methods that, by not physically touching a material being measured, can measure the material's differential response quite accurately. A collimated light shines on the material under test, is reflected off it, and is then captured by a device that records the position where the reflected light is captured. This process is done both before and after the material is processed in some way (e.g., by applying a coat of paint). The change in position where the reflected light is captured is used in calculating the deflection of the material as induced by the process. This measured induced deflection is then used to accurately determinate the stress introduced into the material by the process. Other characteristics of the material under test, such as aspects of the material composition of a bi-metallic strip, for example, may also be determined from a deflection measurement.

Disclosed are methods that, by not physically touching a material being measured, can measure the material's differential response quite accurately. A collimated light shines on the material under test, is reflected off it, and is then captured by a device that records the position where the reflected light is captured. This process is done both before and after the material is processed in some way (e.g., by applying a coat of paint). The change in position where the reflected light is captured is used in calculating the deflection of the material as induced by the process. This measured induced deflection is then used to accurately determinate the stress introduced into the material by the process. Other characteristics of the material under test, such as aspects of the material composition of a bi-metallic strip, for example, may also be determined from a deflection measurement.