An X-ray imaging apparatus comprises a digital X-ray detector housed in a radiation shielded enclosure with multiple pinhole apertures in the front panel of the housing. An X-ray source illuminates a target and X-rays are backscattered towards the X-ray imaging apparatus. The multiple pinhole apertures arranged in a pattern so that each pinhole generates a respective pinhole image on the X-ray detector. The size of each image is controlled by the thickness of the front panel and the width of the pinhole aperture (acting as optical stops), and the distance to the X-ray detector, and these values are selected to prevent overlap between any pair of pinhole images on the X-ray detector. An image processor is used to generate a synthetic combined image of the object form the multiple pinhole images.

A radiation diagnostic device according to an aspect of the present invention includes a first detector, a second detector, and processing circuitry. The first detector detects Cherenkov light that is generated when radiation passes. The second detector is disposed to be opposed to the first detector on a side distant from a generation source of the radiation, and detects energy information of the radiation. The processing circuitry specifies Compton scattering events detected by the second detector, and determines an event corresponding to an incident channel among the specified Compton scattering events based on a detection result obtained by the first detector.

A radiation diagnostic device according to an aspect of the present invention includes a first detector, a second detector, and processing circuitry. The first detector detects Cherenkov light that is generated when radiation passes. The second detector is disposed to be opposed to the first detector on a side distant from a generation source of the radiation, and detects energy information of the radiation. The processing circuitry specifies Compton scattering events detected by the second detector, and determines an event corresponding to an incident channel among the specified Compton scattering events based on a detection result obtained by the first detector.

A multi-modality imaging system allows for selectable photoelectric effect and/or Compton effect detection. The camera or detector is a module with a catcher detector. Depending on the use or design, a scatter detector and/or a coded physical aperture are positioned in front of the catcher detector relative to the patient space. For low energies, emissions passing through the scatter detector continue through the coded aperture to be detected by the catcher detector using the photoelectric effect. Alternatively, the scatter detector is not provided. For higher energies, some emissions scatter at the scatter detector, and resulting emissions from the scattering pass by or through the coded aperture to be detected at the catcher detector for detection using the Compton effect. Alternatively, the coded aperture is not provided. The same module may be used to detect using both the photoelectric and Compton effects where both the scatter detector and coded aperture are provided with the catcher detector. Multiple modules may be positioned together to form a larger camera, or a module is used alone. By using modules, any number of modules may be used to fit with a multi-modality imaging system. One or more such modules may be added to another imaging system (e.g., CT or MR) for a multi-modality imaging system.

A multi-modality imaging system allows for selectable photoelectric effect and/or Compton effect detection. The camera or detector is a module with a catcher detector. Depending on the use or design, a scatter detector and/or a coded physical aperture are positioned in front of the catcher detector relative to the patient space. For low energies, emissions passing through the scatter detector continue through the coded aperture to be detected by the catcher detector using the photoelectric effect. Alternatively, the scatter detector is not provided. For higher energies, some emissions scatter at the scatter detector, and resulting emissions from the scattering pass by or through the coded aperture to be detected at the catcher detector for detection using the Compton effect. Alternatively, the coded aperture is not provided. The same module may be used to detect using both the photoelectric and Compton effects where both the scatter detector and coded aperture are provided with the catcher detector. Multiple modules may be positioned together to form a larger camera, or a module is used alone. By using modules, any number of modules may be used to fit with a multi-modality imaging system. One or more such modules may be added to another imaging system (e.g., CT or MR) for a multi-modality imaging system.

Described are system and method embodiments for measuring a thickness of a material layer using electromagnetic radiation. In some embodiments, a system includes a radiation source configured to direct first radiation towards a first surface of a layer of material having a thickness between the first surface and a second surface opposite the first surface. The first radiation causes the material layer to emit secondary radiation. A filter is positioned between the material layer and a radiation detector and in the beam path of the second radiation in order to attenuate a portion of the second radiation associated with fluorescence of the material to emit third radiation. Then, the radiation detector is configured to detect the third radiation and a controller is configured to provide a measurement corresponding to the thickness of the material layer based on the detected third radiation.

Described are system and method embodiments for measuring a thickness of a material layer using electromagnetic radiation. In some embodiments, a system includes a radiation source configured to direct first radiation towards a first surface of a layer of material having a thickness between the first surface and a second surface opposite the first surface. The first radiation causes the material layer to emit secondary radiation. A filter is positioned between the material layer and a radiation detector and in the beam path of the second radiation in order to attenuate a portion of the second radiation associated with fluorescence of the material to emit third radiation. Then, the radiation detector is configured to detect the third radiation and a controller is configured to provide a measurement corresponding to the thickness of the material layer based on the detected third radiation.

A system and method for imaging by gamma radiation detection having at least one processing unit analyzing at least one signal provided by at least one set of detection modules mounted on a frame and including, on the one hand, at least one module of Compton camera type having a field of view directed towards a volume delimited by the frame and, on the other hand, at least one pair of coincidence detection PET modules, diametrically opposite to each other on the frame and defining an imaging axis, the processing unit analyzing the signal derived from the Compton-type module to determine the intersection of the imaging axis with the field of view and to determine the optimal orientations and/or locations of the various detection modules on the frame so that the imaging axis passes through the source of the gamma radiation in the object to be imaged.

A system and method for imaging by gamma radiation detection having at least one processing unit analyzing at least one signal provided by at least one set of detection modules mounted on a frame and including, on the one hand, at least one module of Compton camera type having a field of view directed towards a volume delimited by the frame and, on the other hand, at least one pair of coincidence detection PET modules, diametrically opposite to each other on the frame and defining an imaging axis, the processing unit analyzing the signal derived from the Compton-type module to determine the intersection of the imaging axis with the field of view and to determine the optimal orientations and/or locations of the various detection modules on the frame so that the imaging axis passes through the source of the gamma radiation in the object to be imaged.

A data processing apparatus according to an embodiment includes acquisition circuitry and specification circuitry. The acquisition circuitry is configured to acquire a detector signal containing a first component that is based on Cherenkov light and a second component that is based on scintillation light. The specification circuitry is configured to specify timing information about generation of the detector signal by curve fitting to the first component.