Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. At least one sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, often using a sample administration device configured to present a plurality of samples. The sample is exposed to brief bursts of coherent X-ray illumination, often further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from the samples is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same samples can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the samples.

A quantitative radiographic method uses X-ray imaging. The method uses a ratio of the absorption signal and the (small-angle) scattering signal (or vice-versa) of the object as a signature for the materials. The ratio image (dubbed R image) is independent from the thickness of the object in a wide sense, and therefore can be used to discriminate materials in a radiographic approach. This can be applied to imaging systems, which can record these two signals from the underlying object (for instance, an X-ray grating interferometer). Possible applications could be in material science, non-destructive testing and medical imaging. Specifically, the method can be used to estimate a volumetric breast density. The use of the R image and the corresponding algorithm are also presented hereafter.

The present disclosure relates to detection systems and methods. One illustrative detection system may include a distributed radiation source having a plurality of radiation source focus points, which irradiate an object under detection, wherein the plurality of radiation source focus points are divided into a certain number of groups, and a primary collimator that limits rays of each of the radiation source focus points such that the rays emit into an XRD detection device. An XRD detection device may include a plurality of XRD detectors that are divided into the same number of groups as the radiation source focus points, wherein XRD detectors in a same group are arranged to be separated by XRD detectors in other groups, and rays of each of the radiation source focus points are received by XRD detectors having the same group number as the group number of the radiation source focus point.

The present disclosure relates to multi-modality detection systems and methods. One illustrative multi-modality detection system may include a distributed radiation source configured to irradiate an object under detection, a primary collimator configured to separate rays of the distributed radiation source into two parts, wherein one part is for CT detection and the other part is for XRD detection, a CT detection device configured to perform a CT detection to acquire a CT image of the object under detection, and an XRD detection device configured to perform an XRD detection to acquire an XRD image of the object under detection, wherein the CT detection and the XRD detection are performed simultaneously.

Systems and methods for liquid detection are disclosed. An illustrative method for liquid detection herein may include implementing CT imaging and XRD imaging on one or more liquid planes of liquid contained in a container at once by rotating the container so that X-rays from a same radiation source scan a whole area of each of the one or more liquid planes, and generating a substance identification result for the liquid contained in the container based on a CT image and a XRD image, wherein the CT imaging and the XRD imaging are implemented on a same liquid plane or different liquid planes. Consistent with various aspects and features, implementations may identify substances contained in the liquid more quickly and accurately.

Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. At least one sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, often using a sample administration device configured to present a plurality of samples. The sample is exposed to brief bursts of coherent X-ray illumination, often further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from the samples is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same samples can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the samples.

A method for analyzing an object includes irradiating the object with incident photon radiation and acquiring an energy spectrum scattered by the material using a spectrometric detector in scatter mode. An energy spectrum transmitted by the material is acquired using a spectrometric detector in transmission mode. A signature (f) is reconstructed representing the object, both from the scatter spectrum measured and from the transmission spectrum measured, and the reconstructed signature thereof is compared with signatures of standard materials.

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.

A method for analyzing an object, includes irradiating the object with incident photon radiation, acquiring a spectrum transmitted by the object using a spectrometric transmission detector, determining at least one first property of the object from the transmission spectrum, verifying that at least one doubt criterion relating to the first property of the object is met, and translating the fact that the object contains a material that is potentially dubious for the application under consideration. A second part, carried out only when the doubt criterion is met, includes acquiring an energy spectrum scattered by the object using a spectrometric scattering detector at an angle of 1 to 15, and determining a second property of the object from at least the scatter spectrum and comparing at least the second property of the object with properties of standard materials stored in a database to identify the objects composition material.

Aspects of the disclosure are directed to an analysis of a material of a component. A radiation source is activated to transmit radiation to the component. A beam pattern is obtained based on the component interfering with the radiation. The beam pattern is compared to a reference beam pattern. An anomaly is detected to exist in the material when the comparison indicates a deviation between the beam pattern and the reference beam pattern.