A target inspection system includes a portable x-ray scanner configured to output a scanning beam of x-rays, a transmission detector module to detect x-rays of the scanning beam of x-rays that are transmitted through a target when the target is interposed between the portable x-ray scanner and the transmission detector module, and a coupling arm configured to couple the portable x-ray scanner to the transmission detector module mechanically to form a target inspection assembly, via a mechanical coupling between the coupling arm and the portable x-ray scanner at a proximal end of the coupling arm, and via a mechanical coupling between the coupling arm and the transmission detector module at a distal end of the coupling arm. The transmission detector module and the portable x-ray scanner are mechanically coupled together via the coupling arm, defining an opening to receive the target to be interposed therebetween for an x-ray scanning operation.

Method and system are disclosed for determining sample composition from spectral data acquired by a charged particle microscopy system. Chemical elements in a sample are identified by processing the spectral data with a trained neural network (NN). If the identified chemical elements not matching with a known elemental composition of the sample, the trained NN is retrained with the spectral data and the known elemental composition of the sample. The retrained NN can then be used to identify chemical elements within other samples.

Method and system are disclosed for determining sample composition from spectral data acquired by a charged particle microscopy system. Chemical elements in a sample are identified by processing the spectral data with a trained neural network (NN). If the identified chemical elements not matching with a known elemental composition of the sample, the trained NN is retrained with the spectral data and the known elemental composition of the sample. The retrained NN can then be used to identify chemical elements within other samples.

The present specification provides a detector for an X-ray imaging system. The detector includes at least one high resolution layer having high resolution wavelength-shifting optical fibers, each fiber occupying a distinct region of the detector, at least one low resolution layer with low resolution regions, and a single segmented multi-channel photo-multiplier tube for coupling signals obtained from the high resolution fibers and the low resolution regions.

The present specification provides a detector for an X-ray imaging system. The detector includes at least one high resolution layer having high resolution wavelength-shifting optical fibers, each fiber occupying a distinct region of the detector, at least one low resolution layer with low resolution regions, and a single segmented multi-channel photo-multiplier tube for coupling signals obtained from the high resolution fibers and the low resolution regions.

A segmented detector device with backside illumination. The detector is able to collect and differentiate between secondary electrons and backscatter electrons. The detector includes a through-hole for passage of a primary electron beam. After hitting a sample, the reflected secondary and backscatter electrons are collected via a vertical structure having a P+/P−/N+ or an N+/N−/P+ composition for full depletion through the thickness of the device. The active area of the device is segmented using field isolation insulators located on the front side of the device.

A segmented detector device with backside illumination. The detector is able to collect and differentiate between secondary electrons and backscatter electrons. The detector includes a through-hole for passage of a primary electron beam. After hitting a sample, the reflected secondary and backscatter electrons are collected via a vertical structure having a P+/P−/N+ or an N+/N−/P+ composition for full depletion through the thickness of the device. The active area of the device is segmented using field isolation insulators located on the front side of the device.

An x-ray-based borehole fluid evaluation tool for evaluating the characteristics of a fluid located external to said tool in a borehole using x-ray backscatter imaging is disclosed, the tool including at least an x-ray source; a radiation shield to define the output faun of the produced x-rays into the borehole fluid outside of the tool housing; at least one collimated imaging detector to record x-ray backscatter images; sonde-dependent electronics; and a plurality of tool logic electronics and power supply units. A method of using an x-ray-based borehole fluid evaluation tool to evaluate the characteristics of a fluid through x-ray backscatter imaging is also disclosed, the method including at least producing x-rays in a shaped output; measuring the intensity of backscatter x-rays returning from the fluid to each pixel of one or more array imaging detectors; and converting intensity data from said pixels into characteristics of the wellbore fluids.

Embodiments described herein utilize Non-Destructive Inspection (NDI) scan data obtained during a process performed on a surface of a structure to update a location of an NDI scanner on the surface. A subsurface feature within the structure is detected based on the NDI scan data, which are correlated with pre-defined position data for the subsurface feature. A measured location of the NDI scanner on the surface is corrected based on the pre-defined position data for the subsurface feature.

Method and system are disclosed for determining sample composition from spectral data acquired by a charged particle microscopy system. Chemical elements in a sample are identified by processing the spectral data with a trained neural network (NN). If the identified chemical elements not matching with a known elemental composition of the sample, the trained NN is retrained with the spectral data and the known elemental composition of the sample. The retrained NN can then be used to identify chemical elements within other samples.