A segmented detector device with backside illumination. The detector is able to collect and differentiate between secondary electrons and backscatter electrons. The detector includes a through-hole for passage of a primary electron beam. After hitting a sample, the reflected secondary and backscatter electrons are collected via a vertical structure having a P+/P−/N+ or an N+/N−/P+ composition for full depletion through the thickness of the device. The active area of the device is segmented using field isolation insulators located on the front side of the device.

The invention relates to a method for processing images obtained by a diffraction detector, of a crystalline or polycrystalline material, in which a first image of the material is acquired in a state of reference as well as a second image of the material in a deformed state. The invention is characterised in that, in a calculator, during a first step (E6, E12), a current elastic deformation gradient tensor F.sup.e is given a value determined by calculation, during a second step (E7), the current displacement field induced by the tensor F.sup.e is calculated, during a third step (E8), third digital values of a deformed image {hacek over (g)}(x)=g(x+u(x)) corrected by the current displacement field are calculated, and during an iterative algorithm, iterations of the second and third steps (E12, E7, E8) are carried out on modified values of the tensor r F.sup.e until a convergence criterion is met in relation to the correction to the current value of F.sup.e.

The invention relates to a method for processing images obtained by a diffraction detector, of a crystalline or polycrystalline material, in which a first image of the material is acquired in a state of reference as well as a second image of the material in a deformed state. The invention is characterised in that, in a calculator, during a first step (E6, E12), a current elastic deformation gradient tensor F.sup.e is given a value determined by calculation, during a second step (E7), the current displacement field induced by the tensor F.sup.e is calculated, during a third step (E8), third digital values of a deformed image {hacek over (g)}(x)=g(x+u(x)) corrected by the current displacement field are calculated, and during an iterative algorithm, iterations of the second and third steps (E12, E7, E8) are carried out on modified values of the tensor r F.sup.e until a convergence criterion is met in relation to the correction to the current value of F.sup.e.

A system for inspecting a moving person comprises an x-ray source, disposed in a fixed position with respect to the moving person, to generate one or more scanning x-ray beams. Each of the one or more x-ray beams being obliquely incident on either a front of the moving person, a rear of the moving person, or both. The system further comprises one or more backscatter detectors arranged to detect radiation scattered from the moving person, and to produce a detection signal therefrom. The system further comprises a processor and a memory with computer code instructions stored thereon. The memory is operatively coupled to the processor such that, when executed by the processor, the computer code instructions cause the system to produce a backscatter image based on the detection signal. When two or more x-ray beams are implemented, the two or more x-ray beams are temporarily interleaved to prevent crosstalk.

A system for inspecting a moving person comprises an x-ray source, disposed in a fixed position with respect to the moving person, to generate one or more scanning x-ray beams. Each of the one or more x-ray beams being obliquely incident on either a front of the moving person, a rear of the moving person, or both. The system further comprises one or more backscatter detectors arranged to detect radiation scattered from the moving person, and to produce a detection signal therefrom. The system further comprises a processor and a memory with computer code instructions stored thereon. The memory is operatively coupled to the processor such that, when executed by the processor, the computer code instructions cause the system to produce a backscatter image based on the detection signal. When two or more x-ray beams are implemented, the two or more x-ray beams are temporarily interleaved to prevent crosstalk.

This application relates to the field of communication technologies, and discloses a communication method and apparatus. On example method includes: a backscatter device receives an excitation signal from an exciter. The backscatter device determines a backscatter signal pattern in a backscatter signal pattern set, where the backscatter signal pattern set includes a plurality of backscatter signal patterns, and backscatter reference signals in the plurality of backscatter signal patterns do not overlap in time domain. The backscatter device modulates a backscatter reference signal and a backscatter data signal on the excitation signal based on the determined backscatter signal pattern, to obtain a backscatter signal. The backscatter device sends the backscatter signal to a receiver.

This application relates to the field of communication technologies, and discloses a communication method and apparatus. On example method includes: a backscatter device receives an excitation signal from an exciter. The backscatter device determines a backscatter signal pattern in a backscatter signal pattern set, where the backscatter signal pattern set includes a plurality of backscatter signal patterns, and backscatter reference signals in the plurality of backscatter signal patterns do not overlap in time domain. The backscatter device modulates a backscatter reference signal and a backscatter data signal on the excitation signal based on the determined backscatter signal pattern, to obtain a backscatter signal. The backscatter device sends the backscatter signal to a receiver.

The invention relates to a method of examining a sample using a charged particle microscope, comprising the steps of providing a charged particle beam, as well as a sample, and scanning said charged particle beam over said sample. A first detector is used for detecting emissions of a first type from the sample in response to the beam scanned over the sample. Using spectral information of detected emissions of the first type, a plurality of mutually different phases are assigned to said sample. An image representation of said sample is provided, wherein said image representation contains different color hues. The color hues are selected from a pre-selected range of consecutive color hues in such a way that the selected color hues comprise mutually corresponding intervals within said pre-selected range of consecutive color hues.

The invention relates to a method of examining a sample using a charged particle microscope, comprising the steps of providing a charged particle beam, as well as a sample, and scanning said charged particle beam over said sample. A first detector is used for detecting emissions of a first type from the sample in response to the beam scanned over the sample. Using spectral information of detected emissions of the first type, a plurality of mutually different phases are assigned to said sample. An image representation of said sample is provided, wherein said image representation contains different color hues. The color hues are selected from a pre-selected range of consecutive color hues in such a way that the selected color hues comprise mutually corresponding intervals within said pre-selected range of consecutive color hues.

A double capsule assembly includes an outer capsule and an inner capsule configured to be positioned within the outer capsule. The inner capsule is configured to have a sample positioned therein. The double capsule assembly is configured to be placed in a solid media assembly to analyze or synthesize the sample.