Systems and methods of observing a sample using an electron beam apparatus are disclosed. The electron beam apparatus comprises an electron source configured to generate a primary electron beam along a primary optical axis, and a first electron detector having a first detection layer substantially parallel to the primary optical axis and configured to detect a first portion of a plurality of signal electrons generated from a probe spot on a sample. The method may comprise generating a plurality of signal electrons and detecting the signal electrons using the first electron detector substantially parallel to the primary optical axis of the primary electron beam. A method of configuring an electrostatic element or a magnetic element to detect backscattered electrons may include disposing an electron detector on an inner surface of the electrostatic or magnetic element and depositing a conducting layer on the inner surface of the electron detector.

Disclosed herein is a system comprising: a radiation source configured to cause emission of characteristic X-rays of a chemical element in human breast tissues by generating and directing radiation to the human breast tissues; a first image sensor configured to capture a first set of images of the human breast tissues using the characteristic X-rays; a second image sensor configured to capture a second set of images of the human breast tissues using the radiation that has transmitted through the human breast tissues; and a clamp configured to compress the human breast tissues against the second image sensor; wherein the first image sensor is between the clamp and the second image sensor.

An apparatus or method determines a content of the one or more elements of a solid matrix by scanning the solid matrix using a PXRF spectrometer and a color sensor, receiving a PXRF spectra from the PXRF spectrometer and a numerical color data from the color sensor, extracting a value for each of the one or more elements the PXRF spectra, determining the content of the one or more elements of the solid matrix using one or more processors and a predictive model that relates the value of each of the one or more elements and the numerical color data to the content of the one or more elements of the solid matrix, and providing the content of the one or more elements of the solid matrix to one or more input/output interfaces.

Drilling process methods and systems for drilling are described. The methods include performing a drilling operation through a downhole formation, the drilling operation generating drilling cuttings. A single drilling cuttings sample is obtained at a surface-based location. X-ray diffraction (XRD) and/or x-ray fluorescence (XRF) analysis are performed on the single drilling cuttings sample. Element information and mineral information of the single drilling cuttings sample is obtained from the XRF analysis regarding the downhole formation. From the obtained information, a determination of at least one rock petrophysics property of the downhole formation is made.

Drilling process methods and systems for drilling are described. The methods include performing a drilling operation through a downhole formation, the drilling operation generating drilling cuttings. A single drilling cuttings sample is obtained at a surface-based location. X-ray diffraction (XRD) and/or x-ray fluorescence (XRF) analysis are performed on the single drilling cuttings sample. Element information and mineral information of the single drilling cuttings sample is obtained from the XRF analysis regarding the downhole formation. From the obtained information, a determination of at least one rock petrophysics property of the downhole formation is made.

Methods for determining a weathering index using x-ray diffraction (XRD) data are provided. An exemplary method includes obtaining XRD data of a weathered rock sample, and calculating the weathering index using a formula developed to use the XRD data.

The present invention enables an overlay error between processors to be measured from a pattern image, the SN ratio of which is low. To this end, the present invention forms a secondary electron image 200 from a detection signal of a secondary electron detector 107, forms a reflected electron image 210 from a detection signal of a reflected electron detector 109, creates a SUMLINE profile 701 that is obtained by adding luminance information in the reflected electron image along the longitudinal direction of a line pattern, and calculates an overlay error of a sample by using position information about an upper layer pattern detected from the secondary electron image and position information about a lower layer pattern that is detected by using an estimation line pattern 801 estimated on the basis of the SUMLINE profile from the reflected electron image.

The invention relates to method and system configured for material analysis and mineralogy. At least one image based on first emission from a sample is provided. First spectra of the sample based on second emissions from the second scan locations of the image are provided. A confidence score is calculated for every first spectrum, and second scan location(s) with confidence score(s) below a threshold value are selected. Second emissions from the selected second scan location(s) are acquired to provide new image and determine new second scan locations within the respective new image.

The invention relates to method and system configured for material analysis and mineralogy. At least one image based on first emission from a sample is provided. First spectra of the sample based on second emissions from the second scan locations of the image are provided. A confidence score is calculated for every first spectrum, and second scan location(s) with confidence score(s) below a threshold value are selected. Second emissions from the selected second scan location(s) are acquired to provide new image and determine new second scan locations within the respective new image.

A method and system for calibrating a PET scanner are described. The PET scanner may have a field of view (FOV) and multiple detector rings. A detector ring may have multiple detector units. A line of response (LOR) connecting a first detector unit and a second detector unit of the PET scanner may be determined. The LOR may correlate to coincidence events resulting from annihilation of positrons emitted by a radiation source. A first time of flight (TOF) of the LOR may be calculated based on the coincidence events. The position of the radiation source may be determined. A second TOF of the LOR may be calculated based on the position of the radiation source. A time offset may be calculated based on the first TOF and the second TOF. The first detector unit and the second detector unit may be calibrated based on the time offset.