A system and method for characterizing matter, for example, soil organic content is disclosed. A radiation and electric field sensor measure sample properties before, during and after irradiation. Calibrations are developed relating those measurements to useful properties of matter, for example, soil density and organic content. As an example of an embodiment of the disclosed invention an instrument attachment for portable X-ray fluorescence instrumentation was prototyped enabling concurrent volumetric soil organic matter quantification. This primary prototype outperformed more expensive emerging visible-near infrared multivariate instrumentation using parsimonious soil specific simple linear regression (R2 ranged 0.85-0.97) enabling rapid, parallel, nondestructive, cost-effective acquisition of soil elemental concentrations together with organic content data.

A system and method for characterizing matter, for example, soil organic content is disclosed. A radiation and electric field sensor measure sample properties before, during and after irradiation. Calibrations are developed relating those measurements to useful properties of matter, for example, soil density and organic content. As an example of an embodiment of the disclosed invention an instrument attachment for portable X-ray fluorescence instrumentation was prototyped enabling concurrent volumetric soil organic matter quantification. This primary prototype outperformed more expensive emerging visible-near infrared multivariate instrumentation using parsimonious soil specific simple linear regression (R2 ranged 0.85-0.97) enabling rapid, parallel, nondestructive, cost-effective acquisition of soil elemental concentrations together with organic content data.

Methods and systems for measuring structural and material characteristics of semiconductor structures based on combined x-ray reflectometry (XRR) and x-ray photoelectron spectroscopy (XPS) are presented herein. A combined XRR and XPS system includes an x-ray illumination source and x-ray illumination optics shared by both the XRR and XPS measurement subsystems. This increases throughput and measurement accuracy by simultaneously collecting XRR and XPS measurement data from the same area of the wafer. A combined XRR and XPS system improves measurement accuracy by employing XRR measurement data to improve measurements performed by the XPS subsystem, and vice-versa. In addition, a combined XRR and XPS system enables simultaneous analysis of both XRR and XPS measurement data to more accurately estimate values of one of more parameters of interest. In a further aspect, any of measurement spot size, photon flux, beam shape, beam diameter, and illumination energy are independently controlled.

Methods and systems for measuring structural and material characteristics of semiconductor structures based on combined x-ray reflectometry (XRR) and x-ray photoelectron spectroscopy (XPS) are presented herein. A combined XRR and XPS system includes an x-ray illumination source and x-ray illumination optics shared by both the XRR and XPS measurement subsystems. This increases throughput and measurement accuracy by simultaneously collecting XRR and XPS measurement data from the same area of the wafer. A combined XRR and XPS system improves measurement accuracy by employing XRR measurement data to improve measurements performed by the XPS subsystem, and vice-versa. In addition, a combined XRR and XPS system enables simultaneous analysis of both XRR and XPS measurement data to more accurately estimate values of one of more parameters of interest. In a further aspect, any of measurement spot size, photon flux, beam shape, beam diameter, and illumination energy are independently controlled.

An intelligent lithology identification system and method based on images and spectrum technology. The intelligent lithology identification system includes a rock shape analysis system, an image identification system, a sample processing system, a spectrum analysis system, and a central analysis and control system; wherein the central analysis and control system determines the final lithology of a sample according to the rock identification results from the image identification system and the analysis results from the spectrum analysis system. The technical solution further identifies the content and type of minerals by using spectrum technology, integrates and analyzes the results of spectrum analysis and image identification, and finally gives the lithology of the rock, which greatly improves the accuracy of lithology identification.

An intelligent lithology identification system and method based on images and spectrum technology. The intelligent lithology identification system includes a rock shape analysis system, an image identification system, a sample processing system, a spectrum analysis system, and a central analysis and control system; wherein the central analysis and control system determines the final lithology of a sample according to the rock identification results from the image identification system and the analysis results from the spectrum analysis system. The technical solution further identifies the content and type of minerals by using spectrum technology, integrates and analyzes the results of spectrum analysis and image identification, and finally gives the lithology of the rock, which greatly improves the accuracy of lithology identification.

In an analysis system in which a plurality of analysis apparatuses and a server are communicably connected, the plurality of analysis apparatuses each includes: an apparatus body that measures a sample; and an information processor that analyzes measurement data by the apparatus body. The information processor has a first storage unit for storing the measurement data and an analysis result of the measurement data, generates an analysis result summary based on the analysis result stored in the first storage unit, the analysis result summary indicating an outline of the analysis result, and transmits the analysis result summary to the server. The server has a second storage unit, and constructs a database in which analysis result summaries received from the information processor are accumulated, and stores the database into the second storage unit.

In an analysis system in which a plurality of analysis apparatuses and a server are communicably connected, the plurality of analysis apparatuses each includes: an apparatus body that measures a sample; and an information processor that analyzes measurement data by the apparatus body. The information processor has a first storage unit for storing the measurement data and an analysis result of the measurement data, generates an analysis result summary based on the analysis result stored in the first storage unit, the analysis result summary indicating an outline of the analysis result, and transmits the analysis result summary to the server. The server has a second storage unit, and constructs a database in which analysis result summaries received from the information processor are accumulated, and stores the database into the second storage unit.

In order to provide an X-ray fluorescence analyzer that can accurately obtain a concentration of an element to be measured by generating a fluorescent X-ray only from an element to be measured or generating a very small amount of fluorescent X-ray from an element to be excluded, even in the case where, for example, atomic numbers of a plurality of elements contained in a liquid sample are close to each other such as in phosphorus (P) and silicon (Si), an X-ray fluorescence analyzer is configured to analyze a liquid sample containing a first element to be measured and a second element having the atomic number larger than the atomic number of the first element, the X-ray fluorescence analyzer including: an X-ray source that emits a first X-ray; a secondary target that generates the second X-ray by being excited by the first X-ray; a detector and a concentration calculator.

In order to provide an X-ray fluorescence analyzer that can accurately obtain a concentration of an element to be measured by generating a fluorescent X-ray only from an element to be measured or generating a very small amount of fluorescent X-ray from an element to be excluded, even in the case where, for example, atomic numbers of a plurality of elements contained in a liquid sample are close to each other such as in phosphorus (P) and silicon (Si), an X-ray fluorescence analyzer is configured to analyze a liquid sample containing a first element to be measured and a second element having the atomic number larger than the atomic number of the first element, the X-ray fluorescence analyzer including: an X-ray source that emits a first X-ray; a secondary target that generates the second X-ray by being excited by the first X-ray; a detector and a concentration calculator.