The present disclosure provides a method for testing frost susceptibility of soils and an associated apparatus, and relates to the field of testing technology. The method includes: taking a part of a soil sample to be tested as test soil sample and freezing the test soil sample; taking a soil sample of outer layer from the test soil sample after the completion of freezing and measuring the moisture ratio of the soil sample of outer layer; and determining the frost susceptibility of the soil sample to be tested based on an initial moisture ratio and the moisture ratio of the soil sample of outer layer or based on the moisture ratio of the soil sample of outer layer and the moisture ratio of a soil sample of inner layer from the test soil sample after the completion of freezing, frost susceptibility.

The present invention relates to an apparatus for measuring moisture of a solid sample, a method for measuring a moisture content of the solid sample, and a method for analyzing an imidization rate, and more particularly, to an apparatus for measuring moisture of a solid sample, a method for measuring a moisture content of the solid sample, and a method for analyzing an imidization rate, which detect the moisture content of the solid sample at a specific temperature by using a Karl-Fischer device capable of selectively detecting only the moisture content of the solid sample in the method for analyzing an imidization rate of the solid sample and calculate the imidization rate of the solid sample by using the detected moisture content.

The present invention relates to an apparatus for measuring moisture of a solid sample, a method for measuring a moisture content of the solid sample, and a method for analyzing an imidization rate, and more particularly, to an apparatus for measuring moisture of a solid sample, a method for measuring a moisture content of the solid sample, and a method for analyzing an imidization rate, which detect the moisture content of the solid sample at a specific temperature by using a Karl-Fischer device capable of selectively detecting only the moisture content of the solid sample in the method for analyzing an imidization rate of the solid sample and calculate the imidization rate of the solid sample by using the detected moisture content.

The purpose of the present invention is to provide a gas sensor device with which highly accurate measurement performance can be achieved even if there are changes in the environmental temperature. The present invention is provided with: a detection heater (3) formed in a thin film part; a temperature compensation heater (4) formed so as to surround the detection heater; a detection heater heating control circuit for controlling the heating temperature of the detection heater (3); and a temperature compensation heater heating control circuit for controlling the heating temperature of the temperature compensation heater to a heating temperature lower than the heating temperature of the detection heater. The detection heater heating control circuit and the temperature compensation heater heating control circuit adjust the respective heating currents in response to an increase in the temperature of a substrate, so as to reduce the temperature difference between the heating temperature of the detection heater (3) and the heating temperature of the temperature compensation heater (4).

The purpose of the present invention is to provide a gas sensor device with which highly accurate measurement performance can be achieved even if there are changes in the environmental temperature. The present invention is provided with: a detection heater (3) formed in a thin film part; a temperature compensation heater (4) formed so as to surround the detection heater; a detection heater heating control circuit for controlling the heating temperature of the detection heater (3); and a temperature compensation heater heating control circuit for controlling the heating temperature of the temperature compensation heater to a heating temperature lower than the heating temperature of the detection heater. The detection heater heating control circuit and the temperature compensation heater heating control circuit adjust the respective heating currents in response to an increase in the temperature of a substrate, so as to reduce the temperature difference between the heating temperature of the detection heater (3) and the heating temperature of the temperature compensation heater (4).

This application relates to a method and a system for determining aging of a liquid. The method includes steps for measuring a relative water content (rS.sub.1) of the liquid in a first measurement step at a first temperature (T.sub.1), measuring the relative water content (rS.sub.2) at a second temperature (T.sub.2) in a second measurement step, the first and second measurement step are performed such that absolute water content (w) stays essentially unchanged between these two measurements, and based on these at least two measurement values (rS.sub.1, T.sub.1, rS.sub.2, T.sub.2), determining a first water in oil solubility coefficient (B) for the liquid. In accordance with the invention the first water in oil solubility coefficient (B) is monitored essentially continuously in order to determine the liquid quality.

This application relates to a method and a system for determining aging of a liquid. The method includes steps for measuring a relative water content (rS.sub.1) of the liquid in a first measurement step at a first temperature (T.sub.1), measuring the relative water content (rS.sub.2) at a second temperature (T.sub.2) in a second measurement step, the first and second measurement step are performed such that absolute water content (w) stays essentially unchanged between these two measurements, and based on these at least two measurement values (rS.sub.1, T.sub.1, rS.sub.2, T.sub.2), determining a first water in oil solubility coefficient (B) for the liquid. In accordance with the invention the first water in oil solubility coefficient (B) is monitored essentially continuously in order to determine the liquid quality.

In some embodiments, a piezoelectric device is provided. The piezoelectric device includes a semiconductor substrate. A first electrode is disposed over the semiconductor substrate. A piezoelectric structure is disposed on the first electrode. A second electrode is disposed on the piezoelectric structure. A heating element is disposed over the semiconductor substrate. The heating element is configured to heat the piezoelectric structure to a recovery temperature for a period of time, where heating the piezoelectric structure to the recovery temperature for the period of time improves a degraded electrical property of the piezoelectric device.

In some embodiments, a piezoelectric device is provided. The piezoelectric device includes a semiconductor substrate. A first electrode is disposed over the semiconductor substrate. A piezoelectric structure is disposed on the first electrode. A second electrode is disposed on the piezoelectric structure. A heating element is disposed over the semiconductor substrate. The heating element is configured to heat the piezoelectric structure to a recovery temperature for a period of time, where heating the piezoelectric structure to the recovery temperature for the period of time improves a degraded electrical property of the piezoelectric device.

A method of measuring physical properties includes: a preparation step of preparing a moisened member containing an organic material and having a known water absorption rate and a known mass; a heating and cooling step of performing cooling after heating the member; and a measurement step of measuring a mass of the member after cooling the member in the heating and cooling step, in which in the heating and cooling step, a deformation rate of the member is measured using a digital image correlation method.