Patent classifications
G01N27/04
METHOD AND SYSTEM FOR MEASUREMENT OF IMPEDANCE OF ELECTROCHEMICAL DEVICES
The present disclosure provides methods for determining impedance of an electrochemical device by electrically connecting a variable impedance in parallel with the electrochemical device; electrically connecting a power supply to the electrochemical device, the power supply generating a power supply current; modulating a current through the variable impedance; measuring a stack current flowing through the electrochemical device; measuring, at the electrochemical device, a voltage across at least a portion of the electrochemical device; and calculating, based on the measured stack current and the measured voltage, the impedance of the electrochemical device. Systems for performing such methods are also provided.
Sensor board and sensor device
A sensor board includes an insulating substrate having an upper surface and a lower surface, first detection electrodes located on the upper surface of the insulating substrate, second detection electrodes located on the lower surface of the insulating substrate, and a heat generator located between the first detection electrodes and the second detection electrodes inside the insulating substrate and including at least one conductor layer. A portion of the insulating substrate between the heat generator and the first detection electrodes has the same thickness as a portion of the insulating substrate between the heat generator and the second detection electrodes.
Sensor board and sensor device
A sensor board includes an insulating substrate having an upper surface and a lower surface, first detection electrodes located on the upper surface of the insulating substrate, second detection electrodes located on the lower surface of the insulating substrate, and a heat generator located between the first detection electrodes and the second detection electrodes inside the insulating substrate and including at least one conductor layer. A portion of the insulating substrate between the heat generator and the first detection electrodes has the same thickness as a portion of the insulating substrate between the heat generator and the second detection electrodes.
Apparatus and method for evaluating the quality of at least one solder joint between a printed circuit board and a current sensor
The present disclosure relates to a concept for checking at least one solder joint between a printed circuit board and a current sensor, including: measuring, by means of the current sensor, an electric current through the solder joint; measuring at least one temperature of the current sensor as a function of the electric current; and ascertaining a quality of the solder joint based on the temperature and the electric current.
SYSTEM AND METHOD FOR FLUID SENSING
A system and method for moisture sensing and methods for making and using same. The present disclosure describes a fluid sensing array that comprises a first and second set of conducting lines with a fluid layer disposed between the first and second set of conducting lines. Proximate intersections of the sets of conducting lines define a plurality of sensing regions. Reading the plurality of sensing regions may provide for calculating a value for fluid volume present, a value for surface area where fluid is present, or a determination of the identity, class or a characteristic of a fluid present.
WELDING QUALITY INSPECTION DEVICE
The present invention provides an apparatus for inspecting a welding state in a welded portion for an electronic or mechanical coupling in a lithium secondary battery, the apparatus including: a measuring unit configured to obtain data for deriving a resistance value of the welded portion by allowing a resistance measuring probe to contact the welded portion; and a controller configured to communicate with the measuring unit, determine the resistance value of the welded portion by receiving the data obtained from the measuring unit, and determine whether a weak welding was performed by comparing the determined resistance value with a threshold resistance value, in which the measuring unit is configured to allow the resistance measuring probe to contact one end and the other end of the welded portion.
MEASUREMENT DEVICE AND IMAGE FORMING APPARATUS
A measurement device includes: a resistance measurement unit that measures an electrical resistance of a measurement target; a first measurement unit, including a detector that detects information indicating a first physical property other than the electrical resistance of the measurement target, that measures the first physical property from a detection result from the detector; a second measurement unit, including a detector that detects information indicating a second physical property other than the electrical resistance and the first physical property of the measurement target, that measures the second physical property from a detection result from the detector, in which a length of time from a start of driving the detector until a start of actual measurement is longer in the second measurement unit than in the first measurement unit; and a control unit that performs first control causing the first measurement unit to execute a measurement operation of measuring the first physical property in parallel with a measurement operation by the resistance measurement unit, and performs second control causing the second measurement unit to execute a measurement operation of measuring the second physical property in parallel with the measurement operation by the resistance measurement unit and also causing the second measurement unit to start the driving of the detector in the second measurement unit before the start of the driving of the detector in the first measurement unit.
MEASUREMENT DEVICE AND IMAGE FORMING APPARATUS
A measurement device includes: a first measurement unit, disposed at a first opposing position facing a portion of a sheet-like measurement target, that measures a first physical property of the measurement target by causing the measurement target to vibrate with an ultrasonic wave; a second measurement unit, disposed at a second opposing position facing another portion of the measurement target in a state in which the first measurement unit is facing the first portion, that pinches and restrains the other portion in a thickness direction and measures a second physical property other than the first physical property of the measurement target; and a disposed unit disposed between the first measurement unit and the second measurement unit in an intersecting direction with respect to the thickness direction of the measurement target.
METHOD FOR MEASURING HIGH RESISTIVITY TEST SAMPLES
To measure the resistance area product of a high resistivity layer using a microscopic multi point probe, the high resistivity layer is sandwiched between two conducting layers. A plurality of electrode configurations/positions is used to perform three voltage or resistance measurements. An equivalent electric circuit model/three layer model is used to determine the resistance area product as a function of the three measurements.
MEASURING SYSTEM FOR FOODSTUFFS
A measuring system for automatically determining and/or monitoring the quality of a liquid or viscous foodstuff, including a housing with an interior space for a product container for the foodstuff, the product container has a product space for the foodstuff and a lid provided with a probe with a thermometer, a heating and cooling device for the interior space, a sensor device for determining a non-temperature quality-related parameter value of the foodstuff, and a control unit designed to control the measuring system, measure, store, process and/or export the measured parameter values, and to control the heating and/or the cooling system according to a desired time-temperature program. The cooling system includes a cold buffer, a cooler for the cold buffer, and a separate refrigerant circuit. The cold buffer includes a buffer holder with a phase-transition material, wherein the refrigerant circuit includes a cooling circuit with a pump.