Generation of feedback for a part production process based on vibrational testing of parts produced by the part production process. A response characteristic may be identified from vibrational data regarding the parts that is correlated to a process variable of the part production process. The response characteristic may relate to a state of the process variable such that identification of the response characteristic may allow for generation of feedback regarding adjustment of a process control. Such response characteristic may relate to a vibrational metric regarding vibrational data and may comprise identifying a trend in data between a plurality of parts. Also presented are approaches to evaluation of parts, including batch evaluation of parts in which collective vibrational data regarding a plurality of parts belonging to a batch are analyzed. The process control aspects may be performed independently or in combination with part evaluation.

Generation of feedback for a part production process based on vibrational testing of parts produced by the part production process. A response characteristic may be identified from vibrational data regarding the parts that is correlated to a process variable of the part production process. The response characteristic may relate to a state of the process variable such that identification of the response characteristic may allow for generation of feedback regarding adjustment of a process control. Such response characteristic may relate to a vibrational metric regarding vibrational data and may comprise identifying a trend in data between a plurality of parts. Also presented are approaches to evaluation of parts, including batch evaluation of parts in which collective vibrational data regarding a plurality of parts belonging to a batch are analyzed. The process control aspects may be performed independently or in combination with part evaluation.

A detector that detects an internal state of a plate-shaped object including a fiber-reinforced resin. The detector includes an exciter that applies, to a surface of the object, ultrasonic vibrations of Lamb waves, in a selected frequency range where only a zero-order fundamental wave symmetric mode and a zero-order fundamental wave asymmetric mode of the Lamb waves appear, a vibration detector that detects the applied ultrasonic vibrations propagating in the object, and an internal state estimation calculator that estimates the internal state of the object, by obtaining a propagation time of the ultrasonic vibrations propagating in the object corresponding to each frequency of the Lamb waves, based on the detection result of the vibration detector, estimating the internal state based on a delay time of the propagation time relative to a reference propagation time of the object for each frequency in the selected frequency range, and outputting the estimated internal state.

A method for determining a quality of a friction stir welded seam is described. The method involves applying an impact to a welded plate and comparing its damping capacity with the damping capacity of a geometrically equivalent defect-free plate. Damping capacities that differ by a small percent difference indicate that the welded plate is also defect-free. This method is particularly advantageous when dealing with small defects, which produce miniscule changes in natural frequency which may not be measureable.

The present disclosure relates to an infrared band pass filter, which comprises a first multilayer film. The first multilayer film including a plurality of Si:NH layers and a low refraction index layer. The plurality of low refraction index layers are stacked with Si:NH layers alternatively; wherein the difference between the refraction index of Si:NH layer and the refraction index of the low refraction index layer is greater than 0.5. The infrared band pass filter has a pass band in a wavelength range of 800 nm and 1100 nm, and when the incident angle is changed from 0 degrees to 30 degrees, the center wavelength of the pass band is shifted less than 12 nm, and the infrared band pass filter of the present disclosure can be used to enhance the 3D image resolution when applied to a 3D imaging system.

The present disclosure relates to an infrared band pass filter, which comprises a first multilayer film. The first multilayer film including a plurality of Si:NH layers and a low refraction index layer. The plurality of low refraction index layers are stacked with Si:NH layers alternatively; wherein the difference between the refraction index of Si:NH layer and the refraction index of the low refraction index layer is greater than 0.5. The infrared band pass filter has a pass band in a wavelength range of 800 nm and 1100 nm, and when the incident angle is changed from 0 degrees to 30 degrees, the center wavelength of the pass band is shifted less than 12 nm, and the infrared band pass filter of the present disclosure can be used to enhance the 3D image resolution when applied to a 3D imaging system.

A structure including a substrate and a coating over the substrate is acoustically excited to measure acoustic response in the structure. The measured acoustic response in the structure is filtered to remove acoustic response of the substrate and determine acoustic response of the coating. The acoustic response of the coating is used to inspect the coating for failure.

Disclosed is a system for monitoring a boss of a composite structure for a boss cracking event. The system includes a first sensor located on an outer surface of a neck of the boss and configured to detect first deformation data associated with the boss. The system also includes a second sensor located on the outer surface of the neck of the boss at a location diametrically opposite of the first sensor and configured to detect second deformation data associated with the boss. The system also includes a controller communicatively coupled to the first sensor and the second sensor and configured to determine, based on the first deformation data and the second deformation data, whether a boss cracking event has occurred.

A device for particle sensing is disclosed. The device includes a sensor including a bulk acoustic wave resonator having a resonant frequency, an acoustic mirror arranged to support the resonator, and a heater in thermal communication with the resonator such that a resonator temperature is based on a heater temperature. The device also includes circuitry connected to the sensor. The circuitry comprises a driver configured to drive the heater with a driver signal having a constant periodic cycle, and an oscillator configured to generate an output signal indicative of the resonant frequency. The resonant frequency is modulated by the resonator temperature.

A device for particle sensing is disclosed. The device includes a sensor including a bulk acoustic wave resonator having a resonant frequency, an acoustic mirror arranged to support the resonator, and a heater in thermal communication with the resonator such that a resonator temperature is based on a heater temperature. The device also includes circuitry connected to the sensor. The circuitry comprises a driver configured to drive the heater with a driver signal having a constant periodic cycle, and an oscillator configured to generate an output signal indicative of the resonant frequency. The resonant frequency is modulated by the resonator temperature.