An apparatus for selecting products on the basis of their composition via X-ray fluorescence spectroscopy comprises an X-ray source that emits an X-ray beam towards a product sample, and a particle detector for receiving an X-ray beam diffused by said product sample and generating a signal received that can be analysed to determine a chemical composition of said product sample and select a type of product corresponding to said chemical composition of the product sample.

According to the invention, the aforesaid apparatus comprises a first vacuum chamber located between an output of the apparatus facing the product sample and said X-ray source, and a second vacuum chamber located between said output of the apparatus facing the product sample and said detector,

said apparatus further comprising an optical module with polycapillary lens located downstream of said X-ray source, which is configured for focusing said X-ray beam and is moreover associated in a vacuum-tight way to said first vacuum chamber.

A system and method for non-destructive, in situ, positive material identification of a pipe selects a plurality of test areas that are separated axially and circumferentially from one another and then polishes a portion of each test area. Within each polished area, a non-destructive test device is used to collect mechanical property data and another non-destructive test device is used to collect chemical property data. An overall mean for the mechanical property data, and for the chemical property data, is calculated using at least two data collection runs. The means are compared to a known material standard to determine, at a high level of confidence, ultimate yield strength and ultimate tensile strength within +/10%, a carbon percentage within +/25%, and a manganese percentage within +/20% of a known material standard.

A system and method for non-destructive, in situ, positive material identification of a pipe selects a plurality of test areas that are separated axially and circumferentially from one another and then polishes a portion of each test area. Within each polished area, a non-destructive test device is used to collect mechanical property data and another non-destructive test device is used to collect chemical property data. An overall mean for the mechanical property data, and for the chemical property data, is calculated using at least two data collection runs. The means are compared to a known material standard to determine, at a high level of confidence, ultimate yield strength and ultimate tensile strength within +/10%, a carbon percentage within +/25%, and a manganese percentage within +/20% of a known material standard.

A spectroscopic analysis apparatus includes: a light projecting device; a light receiving device; and an output device, wherein the light receiving device includes: a separator configured to separate reflected light into s-polarized light and p-polarized light; a detector for s-polarized light configured to output an electric signal indicating an intensity of the s-polarized light; and a detector for p-polarized light configured to output an electric signal indicating an intensity of the p-polarized light; and the output device is configured to: calculate an absorbance based on a ratio between the intensities of the s-polarized light and the p-polarized light using the electric signals output from the detector for s-polarized light and the detector for p-polarized light; and calculate either or both of the composition and the composition ratio of the surface of the measurement target object using an intensity of the absorbance at any desired wavenumber.

A spectroscopic analysis apparatus includes: a light projecting device; a light receiving device; and an output device, wherein the light receiving device includes: a separator configured to separate reflected light into s-polarized light and p-polarized light; a detector for s-polarized light configured to output an electric signal indicating an intensity of the s-polarized light; and a detector for p-polarized light configured to output an electric signal indicating an intensity of the p-polarized light; and the output device is configured to: calculate an absorbance based on a ratio between the intensities of the s-polarized light and the p-polarized light using the electric signals output from the detector for s-polarized light and the detector for p-polarized light; and calculate either or both of the composition and the composition ratio of the surface of the measurement target object using an intensity of the absorbance at any desired wavenumber.

The invention is direct to a method and an apparatus for the bulk determination of scrap metal content, said method comprising the steps of providing a scrap metal input; preparing said input for submission to a bulk scanning apparatus; scanning at least part of the scrap metal with a bulk scanning apparatus to determine the composition of the scrap metal; and securing said scrap metal from the step of providing the scrap metal input to the step of scanning at least part of the scrap metal. Said apparatus comprises a scanning container together with a low-intensity neutron scattering device, a laser cutting device and/or magnetic sensing device.

The invention is direct to a method and an apparatus for the bulk determination of scrap metal content, said method comprising the steps of providing a scrap metal input; preparing said input for submission to a bulk scanning apparatus; scanning at least part of the scrap metal with a bulk scanning apparatus to determine the composition of the scrap metal; and securing said scrap metal from the step of providing the scrap metal input to the step of scanning at least part of the scrap metal. Said apparatus comprises a scanning container together with a low-intensity neutron scattering device, a laser cutting device and/or magnetic sensing device.

Systems and methods include a predictor module configured to receive an input, e.g., composition parameters and processing parameters. A processor processes the input to predict a material property, e.g., fatigue strength, of an alloy based on the input. The processor outputs the predicted fatigue strength of the alloy for display.

Systems and methods include a predictor module configured to receive an input, e.g., composition parameters and processing parameters. A processor processes the input to predict a material property, e.g., fatigue strength, of an alloy based on the input. The processor outputs the predicted fatigue strength of the alloy for display.

The present invention relates to a method for detecting steel sample components by using a multi-pulse laser induced plasma spectral analysis device, and in particular, to a method for detecting steel sample components by using a multi-pulse laser induced plasma spectral analysis device that includes picosecond and nanosecond laser pulse widths. A laser induced light source is a laser light source that includes nanosecond and picosecond ultrashort pulses, and one pulse laser device can be used to generate two pulse lasers, namely, a nanosecond and a picosecond laser; the two pulse lasers pass through a same output and focusing light path, so as to ensure that the two pulse lasers are focused on a same position of a sample to be detected; a surface of the sample is irradiated by using a first beam of nanosecond laser pulse to generate plasmas; subsequently, the plasmas are irradiated by using a second beam of picosecond laser pulse to enhance spectral line emission.