A method for assessing a structure arranged in an electrolyte may include connecting an electric source between the structure and an earth, and imposing, on the structure, a primary current with at least three frequencies including a first frequency of a duration and an amplitude, a second frequency of a duration and an amplitude, and a third frequency of a duration and an amplitude, a series of currents with the first and second frequency being separated by a time gap. Fields of electric fields may be measured with an instrument having first, second, and third sensors and a positioning system. Each sensor May be configured to measure a field of an electromagnetic field along the structure for each of the frequencies. A primary field resulting from an electric current within the structure based on the measured field may be computed.

A method for examining wear of a connector contact using atom transfer radical polymerization. Metals in the connector contact are involved in atom transfer radical polymerization. In the method, polymers are formed via atom transfer radical polymerization. An average molecular weight and a polydispersity index of the polymers are determined. The exposure of underlying metal layers of the connector contact is determined based on the average molecular weight and atom transfer radical polymerization.

[Object] To integratively index a surface property of a measured object by utilizing a measurement result at a plurality of illumination wavelengths and measurement angles.

[Solution] A surface property indexing apparatus according to the present invention includes a measurement device that generates a plurality of captured images by capturing images of reflected light of illumination light on a surface of the measured object while selecting its wavelength, and an arithmetic processing apparatus that indexes a surface property of the measured object on the basis of the obtained captured images. The captured images generated by the measurement device are of the same wavelength of the reflected light that forms images in an image capturing device, and is of different reflection angles of the reflected light that forms images in the image capturing device in the direction corresponding to the longitudinal direction of the measured object in the captured image. The arithmetic processing apparatus reconstructs the generated captured images to generate a plurality of processing target images having a common wavelength of the reflected light and a common reflection angle of the reflected light and composed of pixels corresponding to the different view field positions of the measured object, and indexes the surface property of the measured object on the basis of the generated processing target images.

To enable lightweight, compact, and sufficient analytical precision.

An optical device for laser emission spectroscopic analysis of the present invention includes: a casing unit that has a laser oscillator oscillating laser light, a condenser lens condensing the laser light and on which the laser light emitted from the laser oscillator is directly incident, and an optical fiber light receiver receiving light emitted from plasma generated by irradiating the laser light onto molten metal at a light-receiving end surface and guiding the light to an exit-side end surface; and a cylindrical probe that is connected to the casing unit so that a center axis is parallel to an oscillation axis of the laser light in the laser oscillator, supplies inert gas to an opening end located downstream of the laser light traveling direction, and guides the laser light toward the opening end to irradiate on the molten metal, wherein a surface normal direction at the light-receiving end surface of the optical fiber light receiver is parallel to the oscillation axis of the laser light.

To enable lightweight, compact, and sufficient analytical precision.

An optical device for laser emission spectroscopic analysis of the present invention includes: a casing unit that has a laser oscillator oscillating laser light, a condenser lens condensing the laser light and on which the laser light emitted from the laser oscillator is directly incident, and an optical fiber light receiver receiving light emitted from plasma generated by irradiating the laser light onto molten metal at a light-receiving end surface and guiding the light to an exit-side end surface; and a cylindrical probe that is connected to the casing unit so that a center axis is parallel to an oscillation axis of the laser light in the laser oscillator, supplies inert gas to an opening end located downstream of the laser light traveling direction, and guides the laser light toward the opening end to irradiate on the molten metal, wherein a surface normal direction at the light-receiving end surface of the optical fiber light receiver is parallel to the oscillation axis of the laser light.

A method for inspecting a component made of press-hardening steel prior to resistance spot welding of the component includes performing non-destructive testing of the component made of press-hardening steel after hot stamping to determine a plurality of characteristics for the component. The non-destructive testing comprises at least one of image processing, electromagnetic analysis, and elemental analysis of the component. The method includes using a model correlating values of the characteristics to acceptable weld quality or rejected weld quality and predicting acceptable weld quality or rejected weld quality of the component prior to resistance spot welding of the component; resistance spot welding the component if the model predicts acceptable weld quality; and not resistance spot welding the component if the model predicts rejected weld quality.

A method for inspecting a component made of press-hardening steel prior to resistance spot welding of the component includes performing non-destructive testing of the component made of press-hardening steel after hot stamping to determine a plurality of characteristics for the component. The non-destructive testing comprises at least one of image processing, electromagnetic analysis, and elemental analysis of the component. The method includes using a model correlating values of the characteristics to acceptable weld quality or rejected weld quality and predicting acceptable weld quality or rejected weld quality of the component prior to resistance spot welding of the component; resistance spot welding the component if the model predicts acceptable weld quality; and not resistance spot welding the component if the model predicts rejected weld quality.

A method for assessing a structure arranged in an electrolyte includes connecting an electric source between the structure and a low resistive connection to the electrolyte via an earth, providing a direct and/or alternating current via the source, measuring a direct and an alternating voltage between a first and second electrode, the electrodes being in contact with the electrolyte at a measurement location and being arranged at a distance to each other. The first and second electrodes are connected to a voltage measurement device. A direct potential and an alternating potential is determined between the structure and the electrolyte at the measurement location, which may include measuring the DC potential and the AC potential between the structure and at least one additional electrode in contact with the electrolyte. A property of the structure may be assessed based on the measured DC and AC voltages, and the DC and AC potentials.

The present disclosure provides a sensor system including one or more sensors having a first container fluidly coupled to a second container, the second container being configured to receive a conductive media from the first container. A first movable element is slidingly engaged with the first container to cause the second container to receive the conductive media from the first container. A first electrode is positioned in the first cavity and electrically coupled to the conductive media. In some examples, a second electrode is electrically coupled to the first electrode and the conductive media. The sensor deposits the conductive media on a working electrode to form an electrochemical cell and obtain one or more material properties of the working electrode. In some examples, the sensor system includes an array of sensors which deposit the conducive media in multiple locations on a working electrode to generate a material property map.

The present disclosure provides a sensor system including one or more sensors having a first container fluidly coupled to a second container, the second container being configured to receive a conductive media from the first container. A first movable element is slidingly engaged with the first container to cause the second container to receive the conductive media from the first container. A first electrode is positioned in the first cavity and electrically coupled to the conductive media. In some examples, a second electrode is electrically coupled to the first electrode and the conductive media. The sensor deposits the conductive media on a working electrode to form an electrochemical cell and obtain one or more material properties of the working electrode. In some examples, the sensor system includes an array of sensors which deposit the conducive media in multiple locations on a working electrode to generate a material property map.