The present invention provides a component for use in an optical sensor, said component comprising a substrate, a surface of the substrate being coated with a layer of a composition comprising: (i) carbon nano-tubes; (ii) an optically-active substance and (iii) a matrix material.

An inspection chip according to the present invention is an inspection chip for stirring liquid by a circular movement of a bottom surface end, including a well main body for accommodating the liquid and a side wall member arranged on a side surface of the well main body. The bottom surface end has a bottom surface structure in contact with a rotating member for allowing the bottom surface end to perform the circular movement in a position leaning from a center line of the well main body toward the side wall member.

The invention relates to a measurement apparatus for measuring the concentration of a gaseous substance. The apparatus comprises a light source, a light sensor, and a housing comprising at least one first housing member having a low thermal conductivity. A light path is formed from said light source to said light sensor, wherein the light path passes through a measurement region within said housing. The light source is configured to emit light with a spectral distribution such that said light is absorbed by said gaseous substance. Said light sensor is configured to receive the light emitted by the light source after it has passed through the measurement region. The first housing member comprises a thermal shielding region facing said measurement region on its one side and said light sensor on its other side, and is configured to permit the passage of light.

A plasmon resonance system, instrument, cartridge, and methods for analysis of analytes is disclosed. A PR system is provided that may include a DMF-LSPR cartridge that may support both digital microfluidic (DMF) capability and localized surface plasmon resonance (LSPR) capability for analysis of analytes. In some examples, the DMF portion of the DMF-LSPR cartridge may include an electrode arrangement for performing droplet operations, whereas the LSPR portion of the DMF-LSPR cartridge may include an LSPR sensor. In other examples, the LSPR portion of the DMF-LSPR cartridge may include an in-line reference channel, wherein the in-line reference channel may be a fluid channel including at least one functionalized LSPR sensor (or sample spot) and at least one non-functionalized LSPR sensor (or reference spot). Additionally, methods of using the PR system for analysis of analytes are provided.

A plasma-based detector using optical spectroscopic techniques for analyzing the constituents of gas samples are provided. The detector includes a plasma-generating mechanism and a plasma-localizing mechanism. Electron-injecting electrodes may be provided in the plasma chamber of the detector. A Pressure control mechanism as well as a doping module may optionally be included. In accordance with some implementations, the collection, detection and analysis of light extracted from the plasma may enable one or more of various operation modes, such as an emission mode, an absorption mode, and indirect detection mode or a constant emission mode.

An NDIR gas sensor has high responsiveness and less noise and includes a radiating section arranged to radiate an infrared ray, a detecting section arranged to detect the infrared ray radiated by the radiating section, and a sample cell extending between the radiating section and the detecting section along a route of the infrared ray and covering the entire circumference of the route of the infrared ray. The sample cell includes a plurality of cell elements extending along the route of the infrared ray. Side portions of the cell elements adjacent to each other overlap at an interval from each other.

A method of operating a diagnostic instrument includes illuminating an imaging location of the diagnostic instrument with first light having a first spectrum for a first period and capturing a first image of the imaging location illuminated by the first light. The method further includes illuminating the imaging location of the diagnostic instrument with second light having a second spectrum for a second period, the second spectrum being more destructive to a chemical configured to be received in the diagnostic instrument than the first spectrum; and capturing a second image of the imaging location illuminated by the second light. Other methods and diagnostic instruments are disclosed.

A non-destructive measurement unit of gas concentration in sealed containers and an automatic filling and/or packaging line using such a unit are provided. The flexible containers are at least partially optically transparent, and the measurement unit comprises a light source for emitting a light beam at a wavelength tunable with an absorption wavelength of a gas contained in the sealed flexible container. The light source directs the light beam toward at least one inspection area, and a detector detects at least a portion of the beam after the beam passes through the inspection area and outputs data representative of an absorption spectrum of the gas. Means for generating a head space of predefined width into the sealed flexible container is adapted to advance the sealed flexible container by an advancement path which crosses the inspection zone and to maintain the predefined width of the head space during the advancement.

The invention optically analyzes a component in a sample having a material suspended. An optical analysis system that irradiates a liquid sample with light and analyzes a component of the sample using transmitted light transmitted through the sample includes a container accommodating the sample and an ultrasonic irradiation unit irradiating an ultrasonic wave for exciting the sample. The container includes a pair of light transmission wall portions between which the sample is disposed and which has light transmissivity, and one of the light transmission wall portions and the other of the light transmission wall portions are disposed to be separated from each other at a distance shorter than a wavelength of the ultrasonic wave.

An inspection system and method that use a differential technique to accurately detect interface defects at a resolution on the order of tens of nanometers or less. Specifically, a radiation source (e.g., a THz or sTHz radiation source) is used to illuminate a materials interface within an object under test (e.g., a semiconductor wafer, integrated circuit (IC) chip package, etc.) under selectively varied inspection conditions. Suitable detector(s) are used to capture images of the materials interface when that interface is illuminated under the selectively varied inspection conditions. The captured images can be compared and contrasted to determine an actual differential in a property of the images. Based on this actual differential, a determination can be made as to whether or not the materials interface is defective and, particularly, as to whether or not the materials interface contains defects even defects that are a few nanometers or less in size.