The invention relates to a microplate reader and a respective method, wherein the microplate reader comprises at least one measuring device and a holding device for accommodating at least one microplate and for positioning the samples-containing wells of this(these) microplate(s) in relation to the at least one measuring device. The at least one measuring device is used for detecting light which is emitted by samples in wells of a microplate inserted in this microplate reader and/or which is influenced by samples transilluminated by light in wells of a microplate inserted in this microplate reader. The microplate reader comprises a control unit for controlling the temperature of a gas atmosphere surrounding the wells containing the samples of microplates used in this microplate reader.

A sensor arrangement for arrangement on a measurement chamber, wherein the sensor arrangement comprises: a sensor; an intake opening; an outlet; and a fluid connection between the intake opening and the outlet.

Embodiments of the present disclosure demonstrate cavitating measuring devices. A liquid sample is cavitated to generate bubbles of gas. A frequency-specific radiation is emitted and passes through at least one bubble of gas. The frequency-specific radiation emerges from the bubble of gas as an absorption signal comprising the frequency-specific radiation. The absorption signal is detected and communicated to a system processor. The system processor analyzes the absorption signal data and determines the chemical components present in the liquid sample. Embodiments of the present disclosure describe both static and dynamic liquid samples. The liquid samples can be measured at the sample site.

A plasmon resonance system, instrument, cartridge, and methods for analysis of analytes is disclosed. A PR system is provided that may include a DMF-LSPR cartridge that may support both digital microfluidic (DMF) capability and localized surface plasmon resonance (LSPR) capability for analysis of analytes. In some examples, the DMF portion of the DMF-LSPR cartridge may include an electrode arrangement for performing droplet operations, whereas the LSPR portion of the DMF-LSPR cartridge may include an LSPR sensor. In other examples, the LSPR portion of the DMF-LSPR cartridge may include an in-line reference channel, wherein the in-line reference channel may be a fluid channel including at least one functionalized LSPR sensor (or sample spot) and at least one non-functionalized LSPR sensor (or reference spot). Additionally, methods of using the PR system for analysis of analytes are provided.

An NDIR gas sensor has high responsiveness and less noise and includes a radiating section arranged to radiate an infrared ray, a detecting section arranged to detect the infrared ray radiated by the radiating section, and a sample cell extending between the radiating section and the detecting section along a route of the infrared ray and covering the entire circumference of the route of the infrared ray. The sample cell includes a plurality of cell elements extending along the route of the infrared ray. Side portions of the cell elements adjacent to each other overlap at an interval from each other.

The invention optically analyzes a component in a sample having a material suspended. An optical analysis system that irradiates a liquid sample with light and analyzes a component of the sample using transmitted light transmitted through the sample includes a container accommodating the sample and an ultrasonic irradiation unit irradiating an ultrasonic wave for exciting the sample. The container includes a pair of light transmission wall portions between which the sample is disposed and which has light transmissivity, and one of the light transmission wall portions and the other of the light transmission wall portions are disposed to be separated from each other at a distance shorter than a wavelength of the ultrasonic wave.

Chamber elements defining an internal chamber to be utilized during a substrate related stage selected from the group consisting of substrate manufacturing stage and substrate inspection stage, the chamber elements comprising: a first element having a first surface; a second element having a second surface about the periphery of the internal chamber; a third element connected to the second element; and a clamping mechanism that is connected to the second and third elements and is arranged to press the second element towards the first element; wherein a first area of the first surface and a second area of the second surface come into proximity with each other at a first interface; wherein the first surface is positioned above the second surface; wherein a gas groove and a vacuum groove are formed in the second area; wherein the second element comprises a gas conduit that is arranged to provide gas to the gas groove and a vacuum conduit that is arranged to provide vacuum to the vacuum groove; wherein a provision of the gas and the vacuum assists in a formation of a gas cushion between the first and second areas; wherein the chamber elements are operable to partially surround a first portion of a movement system and a substrate during the substrate related stage, the movement system is arranged to introduce a movement of the first element in relation to the second element and the third element, wherein the gas cushion maintains predefined conditions in the internal chamber during the movement.

An ellipsometer system with polarization state generator and polarization state analyzer components inside at least one internal environment supporting encasement, said at least one encasement being present inside said environmental chamber.

A plasma-based detector using optical spectroscopic techniques for analysing the constituents of gas samples are provided. The detector includes a plasma-generating mechanism and a plasma-localizing mechanism. Electron-injecting electrodes may be provided in the plasma chamber of the detector. A Pressure control mechanism as well as a doping module may optionally be included. In accordance with some implementations, the collection, detection and analysis of light extracted from the plasma may enable one or more of various operation modes, such as an emission mode, an absorption mode, and indirect detection mode or a constant emission mode.

Analytic sensors and methods utilize an attenuated total reflection (ATR) crystal to detect volatile compounds in an arrangement that reduces interference from compounds other than the one of interest. In particular, the components in the measurement stream are limited to those having volatilities close to that of the analyte of interest, which may be identified based on, for example, the temperature of the ATR crystal and the dwell timei.e., an interval of substantially constant temperature as the ATR crystal is heated.