An optical module (100) for reading a test region of an assay. The optical module comprises: a first light source (101) for illuminating the test region of the assay; an optical detector (103), comprising an optical input for receiving light emitted from the test region and an electrical output; a substrate (104) for mounting the first light source (101) and the optical detector (103); and a housing (105) comprising: a first opening (106) for providing a first optical path from the first light source (101) to the test region (103); wherein the housing (105) and the substrate (104) enclose and positionally align the first source (101) and the optical detector (103) relative to the first opening (106). The housing (105) may comprise one or more legs (108), such as a flexible hook portion which secures the housing (105) to the substrate (104) with a snap-fit engagement, extending from a first and/or second outer surface of the housing (105) in a vertical direction. Beneficially, the snap-fit engagement provided by the flexible hook portion allows the housing to be aligned and secured without the need to use glue or for example a screw and thread that can be difficult to control and/or risks misalignment of the housing.

A system, comprising a processor and a memory. The memory stores instructions executable by the processor to determine, from an image including a portion of a surface of a human body, a reflected light intensity from the body surface portion, determine, a skin reflectance of the body surface portion based on a location of the body surface, a light source, and an image sensor location, and to determine, for the body surface portion, an incoming radiance, based on the skin reflectance and the reflected light intensity.

In an optical-based sample analysis, for example fluorescence-based or absorbance-based measurement, a selection is made between a first excitation light path and a second excitation light path. The first excitation light path directs excitation light from a light source, through an excitation monochromator, through an excitation filter, and to a sample. The second excitation light path directs excitation light from the light source, through the excitation filter, and to the sample while bypassing the excitation monochromator. Excitation light generated by the light source is transmitted along either the first excitation light path or the second excitation light path in accordance with the selection made, thereby irradiating the sample. In response the sample produces emission light (transmitted light in the case of absorbance measurements), which is transmitted to and measured by a light detector.

An inspection system that may include an illumination module that may be configured to scan a sample during multiple scan iterations; wherein during each scan iteration the illumination module scans each beam of a plurality of spaced apart beams along a scan line; a mechanical stage that may be configured to move the sample during the multiple scan iterations; a detection module; and a processor; wherein when the inspection system operates in an interlaced mode, the mechanical stage may be configured to move at a first speed thereby preventing a substantial overlap between scan lines obtained during the multiple scan iterations; wherein when the inspection system operates in a non-interlaced mode: the mechanical stage may be configured to move at a second speed that differs from the first speed thereby introducing an overlap between scan lines of different beams that may be obtained during different scan iterations; the detection module may be configured to generate detection signals in response to a detection of radiation emitted from the sample as a result of each scan line; and wherein the processor may be configured to independently process detection signals relating to different scan lines.

A spectroscopic analysis apparatus includes: a light projecting device; a light receiving device; and an output device, wherein the light receiving device includes: a separator configured to separate reflected light into s-polarized light and p-polarized light; a detector for s-polarized light configured to output an electric signal indicating an intensity of the s-polarized light; and a detector for p-polarized light configured to output an electric signal indicating an intensity of the p-polarized light; and the output device is configured to: calculate an absorbance based on a ratio between the intensities of the s-polarized light and the p-polarized light using the electric signals output from the detector for s-polarized light and the detector for p-polarized light; and calculate either or both of the composition and the composition ratio of the surface of the measurement target object using an intensity of the absorbance at any desired wavenumber.

A scatterometer performs diffraction based measurements of one or more parameters of a target structure. To make two-color measurements in parallel, the structure is illuminated simultaneously with first radiation (302) having a first wavelength and a first angular distribution and with second radiation (304) having a second wavelength and a second angular distribution. The collection path (CP) includes a segmented wavelength-selective filter (21, 310) arranged to transmit wanted higher order portions of the diffracted first radiation (302X, 302Y) and of the diffracted second radiation (304X, 304Y), while simultaneously blocking zero order portions (302″, 304″) of both the first radiation and second radiation. The illumination path (IP) in one embodiment includes a matching segmented wavelength-selective filter (13, 300), oriented such that a zero order ray passing through the illumination optical system and the collection optical system will be blocked by one of said filters or the other, depending on its wavelength.

A confocal chromatic device for inspecting the surface of an object such as a wafer, including a plurality of optical measurement channels with collection apertures arranged for collecting the light reflected by the object through a chromatic lens at a plurality of measurement points, the plurality of optical measurement channels including optical measurement channels with an intensity detector for measuring a total intensity of the collected light. A method is also provided for inspecting the surface of an object such as a wafer including tridimensional structures.

A light sheet microscope includes an illuminator having a beam source which is designed to direct an illumination beam propagating along an illumination axis onto a sample. A light-sheet generator is designed to generate a light-sheet-like illumination light distribution illuminating the sample in a partial area from the illumination beam. A detection unit has a detector which is designed to capture detection light originating from the partial area of the sample illuminated with the illumination light distribution. The illuminator comprises a beam modulator adapted to modulate the illumination beam along the illumination axis in such a way that light exposure of the partial area of the sample illuminated by the illumination light distribution varies along the illumination axis.

Microfluidic devices for analyzing droplets are disclosed. A described microfluidic device includes a substrate and a microfluidic channel formed on the substrate. The microfluidic channel includes passages where each passage has a mask pattern configured to modulate a signal of a droplet passing through that passage, such that droplets passing through the passages produce signals. The microfluidic device also includes a detector configured to detect the signals. Methods of analyzing droplets with a microfluidic device having a microfluidic channel formed on a substrate are disclosed. A described method includes passing droplets through the passages, modulating signals from the droplets using mask patterns, formed on the passages; and detecting the signals.

An adhering detection apparatus includes a light source to emit probe light to a light translucent object during an emission period, and to stop an emission of the probe light to the light translucent object during a non-emission period, a light receiver to receive light coming from the light translucent object during the emission period and the non-emission period of the light source, and an adhering detection processor to perform an adhering detection processing for detecting a substance adhering to the light translucent object based on light quantity of the light coming from the light translucent object and received by the light receiver, and to output a detection result of the adhering detection processing. The adhering detection processor selectively performs one or more processes depending on the light quantity of the light received by the light receiver during the non-emission period of the light source.