Disclosed are a successive optical analysis system for optically analyzing a flow cell, including: at least one stage on which the flow cell is loaded; at least two optical analyzing units configured to optically analyze the flow cell loaded on the stage; and a conveying unit configured to convey at least one of the stage and the optical analyzing unit and align positions of the stage and the optical analyzing unit, and a successive optical analysis method using the same.

An embodiment of a system is described that comprises a light source configured to produce a light beam; a collimating lens disposed on a movable mount, wherein the collimating lens is configured to capture the light beam and produce a substantially collimated beam; and an aspheric diffuse ring optic configured to receive the collimated beam and produce a spot on a surface that comprises a non-uniform radial intensity distribution.

Light-sheet fluorescence microscopy (LSFM) affords highly parallelized 3D imaging with optical sectioning capability and minimal light exposure. However, using Gaussian beams for light-sheet generation results in a trade-off between beam waist thickness and the area over which the beam can approximate a light-sheet. Novel techniques for LSFM are disclosed that uses extended focusing and/or laser line focuses to produce divergence free light-sheets with near diffraction-limited resolution and uniform intensity distribution.

An ellipsometer includes: a gantry; a polarization generator and a polarization analyzer mounted in the gantry; and a focusing lens disposed on a sample on a stage, wherein the sample is an object to be measured, wherein a vertical section of the focusing lens is a semi-circle.

An optical sensor system may include a light source. The optical sensor system may include a concentrator component proximate to the light source and configured to concentrate light from the light source with respect to a measurement target. The optical sensor system may include a collection component that includes an array of at least two components configured to receive light reflected or transmitted from the measurement target. The optical sensor system may include may a sensor. The optical sensor system may include a filter provided between the collection component and the sensor.

A method of determining the transmittance of a transparent article (250) includes the steps of obtaining a measurement of a first intensity of electromagnetic radiation reflected or emitted by reference surface (80) with an intensity measuring device (400), positioning the transparent article (250) over the reference surface (80), obtaining a measurement of a second intensity of electromagnetic radiation transmitted through the transparent article (250) that is reflected or emitted by a region (110) of the reference surface (80) that is covered by the transparent article (250) with the intensity measuring device (400); and calculating the transmittance using the measurements of the first intensity and the second intensity.

The present application discloses a spectroscopy probe for a Raman spectroscopy system, and methods for preparing filters for the probe. A method for forming an SERS substrate which can optionally be used with the probe is also described. The spectroscopy probe is formed using a double-clad optical fibre probe tip, the double-clad optical fibre (DCF) having a single mode core, multimode inner cladding, and outer cladding, and a micro-filter fixed to the distal end of the optical fibre probe tip. The micro-filter has a short pass or band pass filter configured to align with the DCF core to filter silica Raman background generated by laser excitation in the single mode core, and a long pass filter configured to suppress Rayleigh scattering from the sample while allowing Raman scattered wavelengths to be transmitted through the inner cladding.

A data acquisition apparatus includes a light source, a first beam splitter, a predetermined beam splitter, a first light deflector, a second light deflector, a first measuring unit, a second measuring unit, a second beam splitter, and a photodetector. A second measurement optical path is positioned in a first direction and a reference optical path is positioned in a second direction. The predetermined beam splitter is disposed in the second measurement optical path or the reference optical path. A first measurement optical path is positioned between the predetermined beam splitter and the photodetector. The first light deflector and the first measuring unit are disposed in the first measurement optical path, and the second light deflector and the second measuring unit are disposed in the second measurement optical path. The first measurement optical path and the second measurement optical path intersect.

An apparatus comprises: a photonic cavity; a substrate comprising a waveguide layer, wherein the waveguide layer comprises waveguides configured to direct light towards the photonic cavity; and a wafer comprising: a top side, and a nanowire array affixed to the top side. A method of performing a surface-enhanced Raman scattering (SERS) analysis, the method comprises: directing, using a waveguide layer of a SERS device, an incident light towards a photonic cavity of the SERS device; permitting, using the photonic cavity, a fluid to flow freely into and out of the SERS device; causing, within the photonic cavity, an interaction among the incident light, the fluid, and a nanowire array of the SERS device to create scattered light; converting the scattered light into an electrical signal; and analyzing the electrical signal to determine whether a contaminant exists in the fluid.

An optical inspection system, including (a) an illumination optics that is configured to generate an illumination light beam and to illuminate a sample with the illumination light beam; (b) at least one collection optics configured to collect light from the sample as a result of an impingement of the illumination light beam on the sample; (c) at least one detector configured to detect at least one detected light beam outputted from the at least one collection optics; (d) multiple polarizers that comprise at least one inhomogeneous polarizer and at least one half-wave plate; and (e) at least one movement unit that is configured to move, under a control of a control unit of the optical inspection system, the at least one inhomogeneous polarizer thereby impacting a polarization of one or more light beams out of the illumination light beam, and the at least one detected light beam.