The application discloses an X-ray fluorescence system comprising an X-ray source to emit X-ray radiation incident on the sample and a controller to vary an energy of the X-ray radiation incident on the sample between at least a first incident radiation energy and a second incident radiation energy. The system further comprises an X-ray fluorescence detector to detect X-ray radiation fluoresced by the sample in response to the incident X-ray radiation and determine at least: a first fluorescence radiation intensity of X-ray radiation fluoresced by the sample in response to the X-ray radiation incident on the sample at the first incident energy and a second fluorescence radiation intensity of X-ray fluorescence radiation fluoresced by the sample in response to the X-ray radiation incident on the sample at the second incident energy. A method of X-ray fluorescence is also disclosed.

The present disclosure relates to an integrated FESEM and LDI-TOF-MS analysis system, and provides an integrated FESEM and LDI-TOF-MS analysis system that can perform FESEM analysis and LDI-TOF-MS analysis on a single sample to be analyzed without exposing the sample to the atmosphere.

An inspection apparatus for inspecting an inspection target surface arranged on an inspection plane, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection plane, and an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface. The X-ray detector includes a long X-ray receiver.

An apparatus (20) for carrying out a quality control on industrial production lines (10), comprising one or more apparatuses (30, 40, 50) for the measurement of properties of a product sample (C) of the aforesaid industrial production lines (10), which supply respective one or more measurement signals, the apparatus (20) comprising a processing module configured for processing the one or more measurement signals and obtaining properties of the product sample (C), the quality control being carried out as a function of said properties of the product sample (C), said one or more apparatuses (30, 40, 50) for the measurement of properties of a product sample (C) comprising: an x-ray fluorescence apparatus (30) that comprises an x-ray source (331), which emits a first x-ray beam (XB, XBC) towards the product sample (C) in a measurement environment, and a particle detector (335), which is configured for receiving a second x-ray beam (XBR) scattered by the product sample (C) and generating a first received signal supplied within the set of said respective one or more measurement signals. The apparatus (20) further comprises an optical-spectroscopy apparatus, preferably operating in the near infrared (40), which comprises a radiation source operating in the near infrared (NIR), which emits a first optleal-radiation beam towards a product sample (C), and an optical sensor for receiving a second optleal-radiation beam scattered by the product sample (C) and generating a second received signal supplied within the set of said respective one or more measurement signals.

Systems and Methods for an air slide analyzer for measuring the elemental content of aerated material traveling by air slide. The air slide analyzer has an analyzer having an entrance opening and an exit opening, and an interior tunnel adapted for aerated material conveyed by an air slide; a radiation detector proximal to the analyzer; a neutron source emitting neutrons into material within the analyzer; and a processor to analyze detected information from the radiation detector, wherein emissions from the material being irradiated with neutrons are detected by the radiation detector and analyzed by the processor to provide elemental information of the material in the analyzer.

The present invention determines one or more properties of a soil sample by scanning a soil sample using a visible near infrared diffuse reflectance diffuse reflectance (VisNIR) spectroradiometer, scanning the soil sample using a x-ray fluorescence (PXRF) spectrometer, receiving a diffuse reflectance spectra from the VisNIR spectroradiometer and an elemental data from the PXRF spectrometer, determining one or more properties of the soil sample using one or more processors and a predictive model that relates the diffuse reflectance spectra and the elemental data to the one or more properties, and providing the one or more properties of the soil sample to one or more input/output interface.

A method and system for calibrating a PET scanner are described. The PET scanner may have a field of view (FOV) and multiple detector rings. A detector ring may have multiple detector units. A line of response (LOR) connecting a first detector unit and a second detector unit of the PET scanner may be determined. The LOR may correlate to coincidence events resulting from annihilation of positrons emitted by a radiation source. A first time of flight (TOF) of the LOR may be calculated based on the coincidence events. The position of the radiation source may be determined. A second TOF of the LOR may be calculated based on the position of the radiation source. A time offset may be calculated based on the first TOF and the second TOF. The first detector unit and the second detector unit may be calibrated based on the time offset.

An inspection apparatus for inspecting an inspection target surface arranged on an inspection plane, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection plane, and an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface. The X-ray detector includes a long X-ray receiver.

Systems and Methods for an air slide analyzer for measuring the elemental content of aerated material traveling by air slide. The air slide analyzer has an analyzer having an entrance opening and an exit opening, and an interior tunnel adapted for aerated material conveyed by an air slide; a radiation detector proximal to the analyzer; a neutron source emitting neutrons into material within the analyzer; and a processor to analyze detected information from the radiation detector, wherein emissions from the material being irradiated with neutrons are detected by the radiation detector and analyzed by the processor to provide elemental information of the material in the analyzer.

An X-ray analysis system is provided with multi-source design and an X-ray analysis method is provided with multi-source design. According to the embodiments, the X-ray analysis system includes a ray source including a plurality of ray generating devices that generate a ray; a detector that detects a signal generated due to an analyzed object being irradiated by the ray from the ray source; and a controller that controls the ray source, so that two or more ray generating devices in the ray source simultaneously generate corresponding rays to irradiate the analyzed object.