A method for measuring average thickness of a metal or alloy coating on a metal or alloy substrate using an X-ray fluorescence (XRF) spectrometer is used when the coating has an uneven surface at different distances from a measurement window of the XRF spectrometer. The method includes measuring elemental composition of the coating or substrate using the XRF spectrometer and obtaining the average thickness of the coating using a calibration relationship between coating thickness and elemental composition of the coating or substrate. The metal or alloy coating may be a metal or alloy coating of a plurality of outer armor wires wrapped around a cable. The method may be used to analyze coating thickness changes over time or along the length of the cable, or to analyze a corrosive environment in order to choose optimal material for a metal or alloy coating.

A system and methods for petro-steering methodologies are provided. An exemplary method obtains rock fabric data, and integrate rock fabric data with dynamic productivity data to identify patterns between the rock fabric data and dynamic productivity data. Gas rates and steering values are predicted across UBCT wells based on the patterns.

Provided is a portable XRF data screening method for heavy metal contaminated soil, relating to the technical field of heavy metal contamination test. The method includes the following steps: (1) laboratory test; (2) XRF test; and (3) calculation of a recheck interval: dividing test data into four areas by a contaminant screening value X.sub.c as a horizontal line and a correlation-derived site screening value as a vertical line to calculate the recheck interval. The method is simple and efficient, and is beneficial to saving investigation costs and shortening a project cycle.

An X-ray fluorescence measurement apparatus has a sample tank, and a measurement unit that has an X-ray generator and an X-ray fluorescence detector. A film mechanism takes out a used film from a partitioning position between the sample tank and the measurement unit in a slide direction which intersects a direction of arrangement of the sample tank and the measurement unit, and feeds an unused film portion to the partitioning position in the slide direction. The film portions may alternatively be exchanged using cassettes.

The invention belongs to the technical field of trace detection, and discloses a heavy metal trace detection method and application thereof. The detection method; comprising the following steps: preparing a quality sample; mixing the quality sample with the sample to be tested according to a specific proportion; using X-ray fluorescence spectrometer to detect trace heavy metals; and using standard curve to realize quantitative analysis of heavy metals. For the purpose of detecting heavy metal elements in tea, the application of this invention can shorten the detection time, avoid the use of a large amount of acid liquor, improve the environmental protection performance, and lower the detection cost, moreover, the obtained standard curve by this invention has high correlation and accurate detection results.

A method may include: analyzing each of a group of inorganic particles to generate data about physicochemical properties of each of the inorganic particles; and generating a correlation between a reactivity index of each of the inorganic particles and the data.

A system and method for characterizing matter, for example, soil organic content is disclosed. A radiation and electric field sensor measure sample properties before, during and after irradiation. Calibrations are developed relating those measurements to useful properties of matter, for example, soil density and organic content. As an example of an embodiment of the disclosed invention an instrument attachment for portable X-ray fluorescence instrumentation was prototyped enabling concurrent volumetric soil organic matter quantification. This primary prototype outperformed more expensive emerging visible-near infrared multivariate instrumentation using parsimonious soil specific simple linear regression (R2 ranged 0.85-0.97) enabling rapid, parallel, nondestructive, cost-effective acquisition of soil elemental concentrations together with organic content data.

An intelligent lithology identification system and method based on images and spectrum technology. The intelligent lithology identification system includes a rock shape analysis system, an image identification system, a sample processing system, a spectrum analysis system, and a central analysis and control system; wherein the central analysis and control system determines the final lithology of a sample according to the rock identification results from the image identification system and the analysis results from the spectrum analysis system. The technical solution further identifies the content and type of minerals by using spectrum technology, integrates and analyzes the results of spectrum analysis and image identification, and finally gives the lithology of the rock, which greatly improves the accuracy of lithology identification.

In an analysis system in which a plurality of analysis apparatuses and a server are communicably connected, the plurality of analysis apparatuses each includes: an apparatus body that measures a sample; and an information processor that analyzes measurement data by the apparatus body. The information processor has a first storage unit for storing the measurement data and an analysis result of the measurement data, generates an analysis result summary based on the analysis result stored in the first storage unit, the analysis result summary indicating an outline of the analysis result, and transmits the analysis result summary to the server. The server has a second storage unit, and constructs a database in which analysis result summaries received from the information processor are accumulated, and stores the database into the second storage unit.

In order to provide an X-ray fluorescence analyzer that can accurately obtain a concentration of an element to be measured by generating a fluorescent X-ray only from an element to be measured or generating a very small amount of fluorescent X-ray from an element to be excluded, even in the case where, for example, atomic numbers of a plurality of elements contained in a liquid sample are close to each other such as in phosphorus (P) and silicon (Si), an X-ray fluorescence analyzer is configured to analyze a liquid sample containing a first element to be measured and a second element having the atomic number larger than the atomic number of the first element, the X-ray fluorescence analyzer including: an X-ray source that emits a first X-ray; a secondary target that generates the second X-ray by being excited by the first X-ray; a detector and a concentration calculator.