The present invention is intended to provide improved patterned X-ray emitting targets as well as X-ray sources that include patterned X-ray emitting targets as well as X-ray reflectance scatterometry (XRS) systems and also including X-ray photoelectron spectroscopy (XPS) systems and X-ray fluorescence (XRF) systems which employ such X-ray emitting targets.

A method for multi-parametric x-ray fluorescence imaging with maximized detection sensitivity and minimized radiation dose for a biological/living sample (10) containing a first marker substance comprises the steps of irradiation of the sample (10) with x-ray radiation (1), with x-ray fluorescence (2) of the first marker substance being excited, spatially resolved detection of the x-ray fluorescence (2) of the first marker substance, and determination of a distribution of the first marker substance in the sample (10) from the x-ray fluorescence (2) of the first marker substance, wherein the sample (10) contains at least one further marker substance which is excited to x-ray fluorescence (2) by the x-ray radiation (1), wherein fluorescence lines (3) of the first and the at least one further marker substances are different, at least one of the first and the at least one further marker substances is coupled with active ingredient molecules and/or ligand molecules provided for a specific interaction with the sample (10) or contained in cells, in order to be able to trace these, the detection comprises a spectrally resolved detection of the x-ray fluorescence (2) of the first and the at least one further marker substances, and additionally at least one distribution of the at least one further marker substance in the sample (10) is determined from the detected x-ray fluorescence (2) of the first and the at least one further marker substances. An imaging device (100) for multi-parametric x-ray fluorescence imaging and an optimized selection method for a marker substance kit for introducing marker substances into a sample (10) are also described.

The present invention relates to an access control system, an access object and a method for access control. The access control system comprises an access request receiving device being configured and operable for receiving an access object; the access request receiving device comprising an emitter configured and operable for irradiating the access object with a radiation having a wavelength in the range of about 10″12 and 10″9 m and a detector configured and operable for detecting a response signal from the irradiated access object; a control circuit being configured and operable to receive the response signal from the access request receiving device and process the response signal to identify spectral features indicative of an XRF signature of the access object; wherein the control circuit is adapted to generate an unlocking signal for switching a module device between a locked state and an unlocked state upon identification of the XRF signature.

An x-ray microscopy method that obtains a classification of different particles by distinguishing between different material phases through a combination of image processing involving morphological edge enhancement and possibly resolved absorption contrast differences between the phases along with optional wavelet filtering.

A method of measuring element concentration in plant leaves comprises steps of: (a) gathering leaves of plants to be tested; (b) conditioning specimens of said leaves; (c) obtaining raw count-per-second XRF datasets of said specimens; (d) obtaining raw NIR datasets of said specimens; (e) obtaining raw analytical datasets; and (f) assessing concentrations of minerals within said specimens on the basis of said count-per-second XRF, NIR and analytical datasets. The aforesaid method further comprises steps of obtaining white reference radiance datasets and normalizing said raw NIR datasets on the basis thereof and providing NIR reflectance datasets.

This application relates to apparatus and method for x-ray fluorescence analysis. There is provided an X-ray fluorescence analysis apparatus for analysing a sample, The X-ray fluorescence analysis apparatus comprises an X-ray source, a measurement chamber for holding the sample in air, and an X-ray detector. The X-ray source is arranged to irradiate the sample with a primary X-ray beam, to cause the sample to fluoresce. The X-ray detector is arranged to detect characteristic X-rays emitted by the sample and to determine a measured X-ray intensity associated with the characteristic X-rays. An X-ray filter, which transmits the primary X-ray beam, is arranged between the X-ray source and the sample. The X-ray source comprises an anode of material having an atomic number that is less than 25. The X-ray fluorescence analysis apparatus further comprises a sensor arrangement configured to sense air pressure and air temperature. A processor receives the measured X-ray intensity. The processor also receives air pressure data and air temperature data from the sensor arrangement. The processor is configured to carry out a compensation calculation for adjusting the measured X-ray intensity using the air pressure data and the air temperature data.

The present disclosure provides a method for detection of soil heavy metal pollution using an unmanned aerial vehicle (UAV) and an X-ray fluorescence (XRF) technology. Based. Based on hardware equipment such as the UAV, XRF analyzer, and embedded equipment, the present disclosure develops an altitude hold module of the system and a ground-contact monitoring module, and assists the UAV to achieve safe and accurate fixed-point hovering, and develops a driving device for data acquisition to replace manual control and realize the automatic acquisition of XRF data. The data inversion method is realized by using embedded equipment, and after the data is acquired by the portable XRF analyzer near the ground, the algorithm research of inversion processing of contents of heavy metal elements in soil is realized, such that the portable XRF analyzer can automatically and accurately detect the contents of heavy metals in soil at a certain distance.

A method and apparatus for x-ray fluorescence measurement in object (1) are disclosed. The method includes (a) producing x-ray beam (2) using source device (10), wherein beam extends through object parallel to a first projection direction, (b) irradiating object with beam at scan positions in first projection plane, which are set by scanning device (20) such that source device and object are moved relative to one another, (c) detecting x-ray radiation emitted from object using detector array device (30) securely connected to source device and including spectrally selective detector elements (31) arranged to detect radiation, and stop lamellas (32) extending in radial directions relative to beam direction shielding detector elements from radiation scattered in object and arranged such that detector elements are able to detect radiation from all locations, and (d) processing detector signals to capture x-ray fluorescence of target particles in radiation and to localize target particles in object.

An analysis method using an X-ray fluorescence analyzer is provided in which an X-ray spectrum is acquired by detecting a secondary X-ray emitted from a specimen when the specimen is irradiated with a primary X-ray. The analysis method includes: acquiring a first X-ray spectrum obtained, with a take-off angle of the secondary X-ray being set as a first take-off angle; acquiring a second X-ray spectrum obtained, with a take-off angle of the secondary X-ray being set as a second take-off angle that is different from the first take-off angle; and obtaining information on an element in a depth direction of a specimen based on the first X-ray spectrum and the second X-ray spectrum.

An X-ray fluorescence analyzer according to an embodiment includes a sample box configured to accommodate a liquid sample, an X-ray generation unit configured to irradiate an X-ray to one side surface of the inside of the sample box, and a detector disposed along one side surface of the sample box at which a distance of a fluorescent X-ray emitted from the inside of the sample box to the outside of the sample box is shortest in order to minimize absorption of the fluorescent X-ray emitted out of the sample box in the air, when the X-ray irradiated by the X-ray generation unit reacts with the liquid sample inside the sample box to emit the fluorescent X-ray out of the sample box, the detector being configured to detect the fluorescent X-ray.