A neutron imaging system that includes a central neutron source configured to produce source neutrons, wherein the central neutron source comprises a beam target, a moderator chamber surrounding at least a portion of the beam target, the moderator chamber housing a moderator, and a re-entrant cone extending into the moderator chamber. The re-entrant cone includes an entrance surface facing the beam target. The entrance surface encloses a cone chamber, isolating the cone chamber from the moderator. Furthermore, the entrance surface is shaped such that source neutrons produced at the beam target impinge the entrance surface with a neutron flux that varies by 10% or less along the entrance surface.

A non-destructive inspection system 1 includes a neutron radiation source 3 capable of emitting neutrons N, and a neutron detector 14 capable of detecting neutrons Nb produced via an inspection object 6a among neutrons N emitted from the neutron radiation source 3. The neutron radiation source 3 includes a linear accelerator 11 capable of emitting charged particles P accelerated; a first magnet section 12 including magnets 12a and 12b facing each other, the magnets 12a and 12b being capable of deflecting the charged particles P in a direction substantially perpendicular to a direction of emission of the charged particles P from the linear accelerator 11; and a target section 13 capable of producing neutrons N by being irradiated with the charged particles P that have passed through the first magnet section 12.

A system includes a stage for supporting a sample having at least first and second atomic elements. The first atomic element has a first characteristic x-ray line with a first energy and the second atomic element has a second characteristic x-ray line with a second energy, the first and second energies lower than 8 keV and separated from one another by less than 1 keV. The system further includes an x-ray source of x-rays having a third energy between the first and second energies and at least one x-ray optic configured to receive and focus at least some of the x-rays as an x-ray beam to illuminate the sample. The system further includes at least one x-ray detector configured to detect fluorescence x-rays produced by the sample in response to being irradiated by the x-ray beam.

A method of non-destructive detection of surface and near surface abnormalities in a metallic product. The method comprises positioning a sample having a surface under a source of an incident radiation. The surface of the sample is then irradiated with the incident radiation from the source. A scattered radiation is detected and a radiation pattern from the detected scattered radiation is produced. Said radiation pattern is then analysed and the output indicative of the scattered radiation from the sample is produced. Said produced output is then compared with a threshold value, the threshold value indicative of a maximum acceptable detected surface abnormality. Finally, the presence of a surface abnormality is identified when the output exceeds the threshold value.

An inspection apparatus for inspecting an inspection target surface arranged on an inspection plane, includes an X-ray generation tube having a target including an X-ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to the inspection plane; and an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X-ray generation portion and totally reflected by the inspection target surface. The X-ray detector has an energy resolution not less than 1 keV or the X-ray detector has no energy analysis function.

An inspection apparatus for inspecting an inspection target object, includes an X-ray generation tube having a target including an X ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to an inspection target surface of the inspection target object, an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X ray generation portion and totally reflected by the inspection target surface, and an adjustment mechanism configured to adjust a relative position between the inspection target surface and the X-ray detector.

A three-dimensional x-ray imaging system includes at least one detector and an x-ray source including an x-ray transmissive vacuum window. The x-ray source is configured to produce diverging x-rays emerging from the vacuum window and propagating along an x-ray propagation axis extending through a region of interest of an object to the at least one detector. The diverging x-rays have propagation paths within an angular divergence angle greater than 1 degree centered on the x-ray propagation axis. The system further includes at least one sample motion stage configured to rotate the object about a rotation axis. The system further includes a sample mount configured to hold the object and comprises a first portion in the propagation paths of at least some of the diverging x-rays and having an x-ray transmission greater than 30% for x-rays having energies greater than 50% of a maximum x-ray energy of an x-ray spectrum of the diverging x-rays.

A method for imaging a sample by means of an X-ray detector is disclosed, including providing an electron beam interacting with a target to generate X-ray radiation emitted from an X-ray spot on the target, moving the sample relative to the target, deflecting the electron beam such that the X-ray spot is moved over the target simultaneously and in accordance with the movement of the sample, and detecting X-ray radiation emitted from the X-ray spot and interacting with the sample.

Described herein is a high-energy x-ray imaging system including a stationary gantry, a conveyor assembly configured to convey an object to be imaged through the gantry, a plurality of linear accelerators, a detector array, and a control system. The linear accelerators are arranged in an array within the gantry and are configured to generate high-energy x-ray fan beams to be transmitted through the object. The detector array is positioned opposite the linear accelerators and is configured to collect the high-energy x-ray fan beams transmitted through the object. The control system is configured to energize the linear accelerators according to a predetermined control sequence to generate the high-energy x-ray fan beams, and construct a 3-D image of the object based on data received from the detector array and representative of the high-energy x-ray fan beams transmitted through the object.

Various examples are provided for portable neutron imaging. In one example, a portable neutron-imaging system is described. A compact neutron source assembly can comprise an ion-beam bombardment source generating an isotropic source of monoenergetic neutrons. The neutron-imaging system does not include a moderator or collimator. Instead, the emission source and image-capture apparatus are placed in close proximity to an object to be imaged. Quality images were obtained with short exposure times of less than 20 seconds.