A tomography method includes: a step of having a photon counting detector to undergo a relative motion with respect to an X-Ray source, and capturing 2N projected energy spectral data at 2N individual discrete projection angles that divide the relative motion, the N being a positive integer; a step of reforming the 2N projected energy spectral data at the 2N individual discrete projection angles and establishing corresponding projection intensity data; and, a step of basing on the projection intensity data and the 2N projected energy spectral data at the 2N individual discrete projection angles to calculate the material decomposition images. In addition, a tomography system is also provided.

A method for identifying a material contained in a sample. The sample is subjected to irradiation via ionizing electromagnetic radiation, for example X-rays. The sample is inserted between a source emitting the radiation and a spectrometric detector configured to acquire a spectrum of the radiation transmitted by the sample. The spectrum is subject to different treatment operations to enable classification of the material. The steps are, consecutively: reducing dimensionality, followed by projecting along the predefined projection vectors. Projection makes it possible to establish classification parameters, on the basis of which classification is established.

A method of determining at least one x-ray scanning system geometric property includes the steps of positioning a calibration device inside a scanning chamber of the scanning device, the chamber being intersected by at least one fan beam of x-rays during a scanning operation, measuring a distance between the calibration device and at least one inner wall of the chamber, scanning the calibration device to produce an image of the calibration device, identifying pixels representing the a geometric feature of the calibration device in the image, determining a position and orientation of the pixels representing the geometric feature in the image and, determining a scanning system property based on the position and orientation of the pixels representing the geometric feature in the image. The position and orientation of the feature in the scanning chamber and the x-ray scanning system property may be determined simultaneously.

High-contrast, subtraction, x-ray images of an object are produced via scanned illumination by a laser-Compton x-ray source. The spectral-angle correlation of the laser-Compton scattering process and a specially designed aperture and/or detector are utilized to produce/record a narrow beam of x-rays whose spectral content consists of an on-axis region of high-energy x-rays surrounded by a region of slightly lower-energy x-rays. The end point energy of the laser-Compton source is set so that the high-energy x-ray region contains photons that are above the k-shell absorption edge (k-edge) of a specific contrast agent or specific material within the object to be imaged while the outer region consists of photons whose energy is below the k-edge of the same contrast agent or specific material. Scanning the illumination and of the object by this beam will simultaneously record and map the above edge and below k-edge absorption response of the object.

An electron beam accelerated using a first acceleration voltage is applied to respective positions on a sample to obtain spectra A at the respective positions, and an electron beam accelerated using a second acceleration voltage different from the first acceleration voltage is applied to the respective positions on the sample to obtain spectra B at the respective positions. Then, a spectral ratio A/B of the spectra is calculated at each of the positions to generate a waveform representing the spectral ratio A/B. The value of a spectral ratio A/B in an energy region of interest is extracted from each of the waveforms. The extracted values are mapped onto points corresponding to the respective positions on the sample, whereby a spectral map is generated. The spectral map is displayed.

A method of determining at least one x-ray scanning system geometric property includes the steps of positioning a calibration device inside a scanning chamber of the scanning device, the chamber being intersected by at least one fan beam of x-rays during a scanning operation, measuring a distance between the calibration device and at least one inner wall of the chamber, scanning the calibration device to produce an image of the calibration device, identifying pixels representing the a geometric feature of the calibration device in the image, determining a position and orientation of the pixels representing the geometric feature in the image and, determining a scanning system property based on the position and orientation of the pixels representing the geometric feature in the image. The position and orientation of the feature in the scanning chamber and the x-ray scanning system property may be determined simultaneously.

The device includes a first X-ray source, configured to illuminating a measurement cell with a first beam of X photons; a first detector, placed opposite the first X-ray source along a first illumination axis; a second X-ray source, configured to illuminating the measurement cell with a second beam of X photons simultaneously with the first X-ray source; a second detector, placed opposite the second X-ray source along a second illumination axis; and a tray carrying the first X-ray source, the first detector, the second X-ray source, and the second detector, the tray being rotatable around the cell axis.

An ore component analysis device and method are provided, the analysis device comprises: a sample containing device configured to place an ore sample to be detected; an excitation unit configured to output X-rays with continuously adjustable energy; a detector configured to detect the secondary X-rays; a signal processing unit configured to amplify, shape and classify the secondary X-rays to obtain counts and energy of the secondary X-rays; a data processing device comprising a processor configured to execute a storage module, a matching module, a count correction module, a peak seeking module, a calculation module and a content correction module stored in a memory, so as to obtain elements and contents thereof in the ore sample. The present application can be directly applied to production line for qualitative and quantitative analysis of ore components.

An X-ray phase-contrast imaging device capable of easily performing imaging of an object using X-rays of plural energies is provided. The disclosed exemplary configuration includes an X-ray source of a dual energy output type, and an FPD having a high energy X-ray detection surface and a low energy X-ray detection surface so that two types of imaging, imaging by high energy X-ray and imaging by low energy X-ray, can be performed. By imaging so as to scan the object while changing the relative position of the imaging system and the object, two types of imaging can be completed at once.

A multiplexing x-ray fluorescence (MXRF) system and method are provided. The system can include a simple detector that counts x-rays with time resolution. A time-variable applied radiation source is used. The MXRF applied radiation source can produce an excitation spectrum with a peak average energy that grows with time and then recycles. Elemental identification can be achieved by time-correlating x-ray counts detected by the detector, with the time-variable applied radiation field. The system and method provide design flexibility for both commercial and NASA applications.