A sequential X-ray fluorescence spectrometer according to the present invention includes a total analysis time display unit configured to measure, for each kind of analytical sample, a standard sample which contains a component at a known content as a standard value to determine a measured intensity of each measurement line corresponding to the component. The total analysis time display unit is further configured to calculate, for each component, a counting time which gives a specified analytical precision by using the standard value and the measured intensity and to calculate a total counting time as a sum of the counting times of respective components. The total analysis time display unit is configured to calculate a total analysis time as a sum of the total counting time and a total non-counting time and to output the calculated total analysis time and the calculated counting times of the respective components.

The disclosure relates to a source productivity assay integrating pyrolysis data and X-ray diffraction data.

A crystalline phase contained in a sample is identified, from X-ray diffraction data of the sample which contain data of a plurality of ring-shaped diffraction patterns, using a database in which are registered data related to peak positions and peak intensity ratios of X-ray diffraction patterns for a plurality of crystalline phases. Peak positions and peak intensities for a plurality of the diffraction patterns are detected from the X-ray diffraction data (step 102), and the circumferential angle versus intensity data of the diffraction patterns is created (step 103). The diffraction patterns are grouped into a plurality of clusters on the basis of the circumferential angle versus intensity data (step 105). Crystalline phase candidates contained in the sample are searched from the database on the basis of sets of ratios of peak positions and peak intensities of the diffraction patterns grouped into the same cluster (step 106).

Provided is a sample-analyzing system used for identifying a target sample from its measurement data obtained using a plurality of analyzing devices including at least one device selected from a fluorescent X-ray analyzer, atomic absorption photometer and inductively coupled plasma emission analyzer as well as at least one device selected from an infrared spectrophotometer and Raman spectrophotometer. The system includes: a storage section for holding measurement data obtained for each of the reference objects using the analyzing devices; a measurement data comparator for comparing, for each analyzing device, the measurement data of the target sample with those of the reference objects and for determining the degree of matching of the target sample with each reference object; an integrated degree-of-matching calculator for calculating an integrated degree of matching from the degrees of matching determined for the analyzing devices; and a comparison result output section for outputting information concerning a predetermined number of reference objects in descending order of the integrated degree of matching.

An X-ray thin film inspection device according to the present invention has an X-ray irradiation unit 40 mounted in a first rotation arm 32, an X-ray detector 50 mounted in a second rotation arm 33, a fluorescence x-ray detector 60 for detecting fluorescent X-ray occurring from an inspection target due to irradiation of X-ray, a temperature measuring unit 110 for measuring the temperature corresponding to the temperature of the X-ray thin film inspection device, and a temperature correcting system (central processing unit 100) for correcting an inspection position on the basis of the temperature measured by the temperature measuring unit 110.

A detector slice circuit for a CT imaging system may include a plurality of sensors for detecting photons passing through an object and a first electronic component configured to determine an energy of photons detected by the plurality of sensors and generate photon count data, which may be a count of detected photons in one or more energy bins. The detector slice circuit may further include a second electronic component configured to receive the photon count data from the first electronic component and is clocked at a first clock rate; a local memory storage configured to receive the photon count data from the second electronic component at the first clock rate and to output the photon count data at a second clock rate.

A fluorescent X-ray analyzer includes a sample stage, an X-ray source that irradiates a sample with primary X-rays, a detector that detects secondary X-rays generated from the sample, a position adjustment mechanism that adjusts relative positions of the sample stage and the primary X-rays, an observation mechanism that obtains an observation image of the sample, and a computer having a display unit and an input unit. The computer has a function of, in response to a pointer being moved from a central region of the observation screen to a certain position by dragging the input unit while maintaining a state in which an input element of the input unit is held, moving the sample stage in a movement direction and at a movement speed corresponding to a direction and a distance of the certain position relative to the central region.

For each X-ray path through a tissue, numerous trials are conducted. In each trial, X-ray photons are emitted along the path until a Geiger-mode avalanche photodiode “clicks”. A temporal average—i.e., the average amount of time elapsed before a “click” occurs—is calculated. This temporal average is, in turn, used to estimate a causal intensity of X-ray light that passes through the tissue along the path and reaches the diode. Based on the causal intensities for multiple paths, a computer generates computed tomography (CT) images or 2D digital radiographic images. The causal intensities used to create the images are estimated from temporal statistics, and not from conventional measurements of intensity at a pixel. X-ray dosage needed for imaging is dramatically reduced as follows: a “click” of the photodiode triggers negative feedback that causes the system to halt irradiation of the tissue along a path, until the next trial begins.

A measurement processing device used for an x-ray inspection apparatus that detects an x-ray passing through a specimen with a detection unit to sequentially inspect a plurality of specimens on the basis of an acquired transmission image, includes a setting unit that sets a region to be inspected on a portion of the specimen; a determination unit that determines the non-defectiveness of the region to be inspected by using a transmission image of the x-ray that passed through the region to be inspected; a correction unit that performs a correction on the region to be inspected on the basis of a determination result by the determination unit; and a display control unit that displays the corrected region to be inspected corrected by the correction unit.

Three ROIs, ROI-c, ROI-d, and ROI-e, are set for an Lα peak and an Lβ peak reflecting an electron state of a valance band. Accumulated values in the ROI-c, ROI-d, and ROI-e are respectively normalized with reference to an accumulated value in an ROI-a, to determine a sample vector. The sample vector is compared to a plurality of compound vectors corresponding to a plurality of compounds, and a compound forming the sample is estimated based on a compound vector having the highest similarity.