Patent classifications
G01N2223/304
DARK CURRENT CORRECTION IN SCINTILLATOR DETECTORS FOR DOWNHOLE NUCLEAR APPLICATIONS
A radiation logging tool is provided that includes a scintillator detector for use on a wellbore tool string to characterize earth formations. The scintillator detector has a shutter to allow for the collection of data differentiating between incident radiation, such as backscatter signal, and system noise, such as dark current, vibration noise, electronics thermal noise, and electrostatic noise. The radiation logging tool provides for a method of calibrating and measuring incident radiation by the removal of system noise. The shutter is positioned between the photosensor and scintillation member of the scintillator detector, and is able to switch between open and closed states while the scintillation detector is deployed. Measurements of signal noise can be used to calibrate the sampling signal of incident radiation on the scintillator detector.
Quantum Mechanical/X-Ray Crystallography Diagnostic for Proteins
The invention is a diagnostic which overlays quantum mechanical analysis to x-ray crystallography data from one or more proteins to assess and identify the real world conformation, protonation and solvent effects of one or more moieties in said protein. This “overlay” occurs by scoring and identifying the protomer/tautomer states of the moieties using quantum mechanical analysis. The diagnostic results of the present invention accurately identify protein-ligand binding, rendered as an output to a user of a computer in which the x-ray crystallography data is analysed with semi-empirical Hamiltonian quantum mechanics and
A METHOD FOR MEASURING THE MASS THICKNESS OF A TARGET SAMPLE FOR ELECTRON MICROSCOPY
A method is provided of measuring the mass thickness of a target sample for use in electron microscopy. Reference data are obtained which is representative of the X-rays (28) generated within a reference sample (12) when a particle beam (7) is caused to impinge upon a region (14) of the reference sample (12). The region (14) is of a predetermined thickness of less than 300 nm and has a predetermined composition. The particle beam (7) is caused to impinge upon a region (18) of the target sample (16). The resulting X-rays (29) generated within the target sample (16) are monitored (27) so as to produce monitored data. Output data are then calculated based upon the monitored data and the reference data, the output data including the mass thickness of the region (18) of the target sample (16).
DATA TRANSFER ACROSS A ROTATING BOUNDARY
Among other things, a data communication system wirelessly transmits data between a stator and a movable unit (e.g., a rotor) as part of a computed tomography (CT) imaging modality. The data communication system includes a first magnetic portion including a first magnetic material. The first magnetic portion extends along a first axis. The data communication system includes a first conductive portion including an electrically conductive material. The first conductive portion is at least partially surrounded by the first magnetic portion. The first conductive portion extends along a second axis that is substantially parallel to the first axis. The first conductive portion will at least one of generate an electromagnetic field corresponding to data to be transmitted, or have induced therein a current based upon a received electromagnetic field, where the current is a function of the data to be transmitted.
Method for operating a signal filter and radiation detection system
In an embodiment a method for operating a radiation detection system having at least one radiation detector and at least one signal filter includes supplying an input signal to the at least one signal filter by the at least one radiation detector, the input signal having step-shaped signal rises, each step-shaped signal rise having a rise time, determining the rise time of a respective step-shaped signal rise, specifying a waiting time for the respective step-shaped signal rise in each case such that the waiting time is greater than or equal to the rise time of the respective step-shaped signal rise and producing an output signal of the at least one signal filter, data point pairs of the input signal being processed in which a time interval of data points from each other is equal to the waiting time for the respective step-shaped signal rise, wherein at least 80% of rise times of the step-shaped signal rises lie between 10 ns and 800 ns inclusive, and wherein the at least one radiation detector includes a silicon drift detector having a radiation entry window of at least 5 mm.sup.2.
QUANTUM MECHANICAL X-RAY CRYSTALLOGRAPHY AND CRYO-EM DIAGNOSTIC FOR MOLECULES
The invention is a diagnostic which overlays quantum mechanical analysis to x-ray crystallography or Cryo-EM data from one or more molecules, to assess and identify the real world conformation, protonation and solvent effects of one or more moieties in said molecule. This “overlay” occurs by scoring and identifying the protomer/tautomer or conformational states of the moieties using quantum mechanical analysis. The diagnostic results of the present invention accurately identify protein-ligand binding, rendered as an output to a user of a computer in which the x-ray crystallography or Cryo-EM data is analysed with semi-empirical Hamiltonian quantum mechanics.
RADIATION IMAGING SYSTEM AND RADIATION IMAGING APPARATUS
A radiation imaging system is provided. The system comprises a radiation imaging apparatus including a plurality of pixels for acquiring radiation image data and a detection unit for performing exposure control during radiation irradiation, and a radiation control apparatus configured to control a radiation source that irradiates radiation to the radiation imaging apparatus. The radiation imaging apparatus and the radiation control apparatus transmit signals that relate to exposure control by wireless communication. The radiation imaging apparatus, in a case where an irradiation stop signal indicating that radiation irradiation has been stopped is not received from the radiation control apparatus after a signal instructing to stop radiation irradiation has been transmitted to the radiation control apparatus and until a first time interval has elapsed, transmits a signal instructing to stop radiation irradiation to the radiation control apparatus again.
APPARATUSES AND METHODS FOR COMBINED SIMULTANEOUS ANALYSES OF MATERIALS
An analysis apparatus comprises: a moveable stage assembly; a sample holder on a top surface of the stage assembly; a first photon source and a first photon detector or detector array, the first photon source being configured to emit a first beam of photons that intercepts the surface of a sample at a first location on the sample and the first photon detector or detector array being configured to detect photons that are emitted from the first location; and a second photon source and a second photon detector or detector array, the second photon source being configured to emit a second beam of photons that intercepts the surface of the sample at a second location on the sample, the second location being spaced apart from the first location, and the second photon detector or detector array being configured to detect photons that are emitted from the second location.
A SYSTEM AND METHOD FOR DIFFRACTION-BASED STRUCTURE DETERMINATION WITH SIMULTANEOUS PROCESSING MODULES
A diffraction system for determining a crystalline structure of a sample collects a series of diffraction frames from a crystal sample illuminated by a beam of photonic or particulate radiation, such as X-rays. A plurality of software modules for processing the detected diffraction frames perform different tasks in refining the collected diffraction data, such as harvesting, indexing, scaling, integration, and structure determination. Output parameters from certain modules are used as input parameters in others, and are exchanged between the modules as they become available. The modules operate simultaneously, and generate successive versions of output parameters as corresponding input parameters are changed until a final result is achieved. This provides a system of structure determination that is fast and efficient.
IMPROVEMENTS IN GAMMA-ACTIVATION ANALYSIS MEASUREMENTS
A method and system are disclosed to determine a concentration of one or more target elements in a sample, using gamma activation analysis comprising: simultaneously irradiating the sample and a reference material containing at least two reference elements X-rays, detecting deactivation gamma-rays from the irradiated sample and the irradiated reference material; determining the concentration of the or each target element in the sample by correcting the number of detected deactivation gamma-rays from any of the or each target element present in the irradiated sample based on the number of detected deactivation gamma-rays from the at least two reference elements, wherein the at least two reference elements have a variation in activation rate over a pre-defined X-ray end-point energy range which differs from one another.