An imaging control unit in a radiation imaging apparatus causes imaging in a plurality of modes varying in a setting value, and causes standby driving to reduce signals stored in a plurality of pixels during a period in which the plurality of pixels is not irradiated with radiation. The plurality of modes includes a first mode for first imaging using a first setting value and a second mode for second imaging using a second setting value different from the first setting value after the first imaging. The imaging control unit causes the standby driving using a setting value closer to the second setting value than to the first setting value in response to end of the first imaging in causing the second imaging.

A beam shaping apparatus (10) for use in an X-ray analysis device (40). The beam shaping apparatus processes an input N beam (32) from an X-ray beam source (20), and generates an output beam (34) with an output beam shape for irradiating a sample (112) held by a sample holder (22) of the X-ray analysis device. Movement of the output beam shape is controlled in dependence upon a varying tilt angle (χ) of the sample (112), this defined by a tilt position of the sample holder (22).

A method for determining a mineralogical composition of a geological formation sample includes measuring a mineralogical composition of the sample and measuring an elemental composition of the sample. The mineralogical composition is processed to compute a predicted elemental composition of the sample based on known elemental compositions of predetermined minerals. The measured mineralogical composition is corrected to obtain a corrected mineralogical composition which is in turn processed to compute a corresponding corrected predicted elemental composition of the sample. The measured elemental composition is compared with the predicted elemental compositions to obtain error indicators. The error indicators are compared and evaluated to selected and output one of the measured or corrected measured mineralogical compositions.

The present disclosure relates to systems and methods for determining rotation angles. The systems may perform the methods to: obtain a rotation speed of a radioactive scanning source in a CT scanner; obtain a plurality of original projection acquisition times corresponding to a plurality of projection samples, the plurality of projection samples being associated with rotation of the radioactive scanning source; determine a plurality of original rotation angles corresponding to the plurality of projection samples based on the plurality of original projection acquisition times and the rotation speed of the radioactive scanning source; and determine a plurality of modified rotation angles corresponding to the plurality of projection samples by modifying the plurality of original rotation angles.

There are described herein methods and system for generating an inspection image of an object from radiographic imaging. The method comprises obtaining a plurality of digital images of the object positioned between a radiation source and a photon beam detector, the digital images taken at different object-detector distances or source-detector distances to create unique grain diffraction patterns in each one of the digital images, and forming the inspection image from image features common to the digital images at a common scale and removing the unique grain diffraction patterns.

There are described herein methods and system for generating an inspection image of an object from radiographic imaging. The method comprises obtaining a plurality of digital images of the object positioned between a radiation source and a photon beam detector, the digital images taken at different object-detector distances or source-detector distances to create unique grain diffraction patterns in each one of the digital images, and forming the inspection image from image features common to the digital images at a common scale and removing the unique grain diffraction patterns.

A measurement system and method are presented for measuring one or more parameters of a sample. The measurement system comprises an excitation system and a detection system. The excitation system is configured to generate combined exciting radiation comprising one- or multi-parameter modulation of multiple exciting signals of different types to be applied to at least a portion of a sample under measurements to thereby induce electron emission response of said at least portion of the sample to said combined exciting radiation. The detection system is configured for detecting the electron emission response of the at least portion of the sample and generating measured data indicative of a modulated change of an electrical state of the at least portion of the sample, thereby enabling determination of one or more parameters of the sample from the measured data.

A diffraction analysis device and a method for a full-field X-ray fluorescence imaging analysis are disclosed. The device includes a switching assembly, collimation assemblies, an X-ray source, an X-ray detector, a laser indicator, and a computer control system. The switching assembly combines with the collimation assemblies to achieve a functional effect that is previously achieved by two different types of devices through only one device by changing the positioning layout of the X-ray source and the X-ray detector. The full-field X-ray fluorescence imaging analysis can be realized, and the crystal phase composition information and the element distribution imaging information of the sample can be quickly obtained through the same device without scanning, which not only greatly improves the utilization rate of each assembly in the device, reduces the assemblies cost of the device, makes the device structure more compact, but also greatly improves the analysis efficiency and detection accuracy.

A system for non-destructive evaluation of an object uses a spherical coordinate system to control two robotic arms. In some examples, the system includes a radiation source coupled to one robotic arm, a radiation detector coupled to the other robotic arm; and a control unit configured to determine, based on input, a first position located on a first surface of a first sphere within the spherical coordinate system; determine, based on the input, a second position located on a second surface of a second sphere within the spherical coordinate system, wherein the second position is located opposite a midpoint of the spherical coordinate system from the first position; and control a motion of the source robotic arm and the detector robotic arm such that the radiation source and the radiation detector move to different ones of the first position and the second position.

A method includes acquiring a first dataset of projection measurements at a first energy spectrum and a second dataset of projection measurements at a second energy spectrum different from the first energy spectrum by switching between acquiring the first dataset for a set number of consecutive views at different projection angles at the first energy spectrum and acquiring the second dataset for the set number of consecutive views at different projection angles at the second energy spectrum. The set number of consecutive views is greater than one. The method includes supplementing both the first dataset with estimated projection measurements at the first energy spectrum and the second dataset with estimated projection measurements at the second energy spectrum to provide missing projection measurements at different projection angles not acquired during the imaging scan for the first dataset and the second dataset.