G01N2223/306

RADIOGRAPHIC IMAGING APPARATUS, METHOD OF CONTROLLING THE SAME, RADIOGRAPHIC IMAGING SYSTEM, AND STORAGE MEDIUM
20220096035 · 2022-03-31 ·

A radiographic imaging apparatus includes a state transition mode selection unit configured to select a state transition mode from among a first state transition mode of changing from a stand-by state to a ready-for-imaging state based on irradiation preparation start information about a radiation generation apparatus and a second state transition mode of changing from the stand-by state to the ready-for-imaging state based on other information excluding the irradiation preparation start information.

SYSTEM AND METHOD OF MEASURING GRAIN ORIENTATIONS

A system and a method of measuring grain orientations of a metal component. The method includes defining a series of measurement locations on the metal component at which to take a series of measurements indicative of grain orientations at corresponding measurement locations. The method further includes defining a nominal grain orientation at each measurement location. The method further includes loading the measurement locations into a computer-controllable fixture suitable for positioning the metal component. The method further includes locating the metal component in the computer-controllable fixture. The method further includes taking the series of measurements at the series of measurement locations. The method further includes analysing the measurement at each measurement location relative to the nominal grain orientation at the corresponding measurement location.

X-ray single-pixel camera based on x-ray computational correlated imaging

An X-ray single-pixel camera based on X-ray computational correlated imaging, which belongs to the technical research fields of X-ray computational correlated imaging and X-ray single-pixel imaging. The X-ray single-pixel camera includes: an X-ray modulation system (3), an X-ray modulation control system (4), an X-ray single-pixel detector (5), a main control system unit (6), a time synchronization system (7) and a computational imaging system (8). The main control system unit (6) controls each module through software; the time synchronization system (7) controls synchronization of each module for automatic collection; and the computational imaging system (8) is configured to perform a second-order correlated computation or a compressed sensing computation or a deep learning computation on the signals collected by the X-ray single-pixel detector (5) and a preset modulation matrix, so as to obtain an image of an object under test. The X-ray single-pixel camera based on X-ray computational correlated imaging, provided by the present invention, realizes single-pixel imaging, greatly reduces the sampling number while ensuring the imaging quality, and reduces the X-ray radiation dose in an imaging process.

APPARATUS AND METHOD FOR PROCESSING X-RAY IMAGE

Disclosed is an X-ray image processing apparatus including a data obtaining unit generating first to N-th images indicating an internal structure of an external subject and an image processing unit receiving the first to N-th images from the data obtaining unit, detecting a movement of the object, and generating a final image from the first to N-th images based on the movement of the object. The data obtaining unit actively controls an X-ray pulse irradiated based on the movement of the object.

SYSTEMS AND METHODS FOR K-EDGE-BASED X-RAY IMAGING HAVING IMPROVED CONTRAST-TO-NOISE RATIO
20230400422 · 2023-12-14 ·

A method of X-ray imaging includes determining energies of photons emitted by an X-ray source and attenuated by an object that are detected by an energy-discriminating radiation detector, generating photon count data by counting a number of detected photons in a plurality of energy bins of the energy-discriminating radiation detector that includes a first energy bin and an adjacent second energy bin, and generating an X-ray image of the object using the photon count data. Detected photons determined to have an energy within a gap region between a maximum energy threshold of the first energy bin and a minimum energy threshold of the second energy bin are not included in the photon count data used to generate the X-ray image of the object.

INSPECTION APPARATUS AND NON-TRANSITORY RECORDING MEDIUM STORING INSPECTION PROGRAM

According to an embodiment, an inspection apparatus includes a communication interface and a processor. The communication interface acquires package information regarding a package being conveyed by a sorter that sorts the package and an operation signal generated based on an operation of an operator. The processor outputs reference information, based on past history in which inspection-result information indicating whether or not the package is a regulated-article candidate, generated based on the operation signal, and the package information are associated together, and the package information newly acquired.

Method and apparatus for generating measurement plan for measuring X-ray CT

When generating a measurement plan for measuring X-ray CT that performs X-ray irradiation while rotating a test object, and in doing so acquires projection image data, reconstructs volume data from the projection image data, and measures a targeted measurement location in the volume data, the present invention calculates required measurement accuracy and a measurement field of view range based on tolerance information included in CAD data of the test object and a measurement location on the test object defined by a measurement operator ahead of time, and automatically generates, from this information, an optimized measurement plan that minimizes the number of measurements.

Measurement processing device, measurement processing method, measurement processing program, and method for manufacturing structure

A measurement processing device used for an x-ray inspection apparatus that detects an x-ray passing through a specimen with a detection unit to sequentially inspect a plurality of specimens on the basis of an acquired transmission image, includes a setting unit that sets a region to be inspected on a portion of the specimen; a determination unit that determines the non-defectiveness of the region to be inspected by using a transmission image of the x-ray that passed through the region to be inspected; a correction unit that performs a correction on the region to be inspected on the basis of a determination result by the determination unit; and a display control unit that displays the corrected region to be inspected corrected by the correction unit.

Measurement processing device, measurement processing method, measurement processing program, and method for manufacturing structure

A measurement processing device used for an x-ray inspection apparatus that detects an x-ray passing through a specimen with a detection unit to sequentially inspect a plurality of specimens on the basis of an acquired transmission image, includes a setting unit that sets a region to be inspected on a portion of the specimen; a determination unit that determines the non-defectiveness of the region to be inspected by using a transmission image of the x-ray that passed through the region to be inspected; a correction unit that performs a correction on the region to be inspected on the basis of a determination result by the determination unit; and a display control unit that displays the corrected region to be inspected corrected by the correction unit.

X-RAY FLUORESCENCE ANALYZER AND X-RAY FLUORESCENCE ANALYSIS METHOD
20210161493 · 2021-06-03 ·

A support unit and a collimator are relatively rotated about the axis of rotation by a rotation driving device. The collimator has a blocking region that blocks X-rays and a transmission region that allows X-rays to pass therethrough. The transmission region has a vertex positioned on the axis of rotation, and the circumferential length of the transmission region increases proportionally as it advances outward from the vertex. A sample supported by the support unit is irradiated with X-rays by an X-ray source through the transmission region of the collimator, and the fluorescent X-rays from the sample are detected by the detector. The analysis of a composition of a sample is performed based on the fluorescent X-rays detected by the detector.