An x-ray phase contrast imaging apparatus and method of operating the same. The apparatus passes x-rays generated by an x-ray source through, in succession, a source grating, an object of interest, a phase grating, and an analyzer grating. The x-ray source, the source grating, the phase grating, and the analyzer grating move as a single entity relative to an object of interest. The phase grating and the analyzer grating remain in fixed relative location and fixed relative orientation with respect to one another. The detected x-rays are converted to a time sequence of electrical signals. In some cases, the apparatus is controlled, and the electrical signals are analyzed by, by a general purpose programmable computer provided with instructions recorded on a machine readable medium. One or more x-ray phase contrast images of the object of interest are generated, and can be recorded or displayed.

A system for imaging includes an X-ray source for transmitting X-rays through a subject and a measurement sensor to acquire measurement data related to the subject. A detector is provided in the system to receive the X-ray energy of the X-rays after having passed through the subject. The system further includes a controller that receives the measurement data from the measurement sensor and processes the measurement data using an image processing algorithm to determine varying thickness of the subject at a plurality of locations within an area of interest. The controller further positions a filter between the X-ray source and the subject based on varying thickness of the subject and generates the image of the subject based on the detected X-ray energy at the X-ray detector.

A detection scheme for x-ray small angle scattering is described. An x-ray small angle scattering apparatus may include a first grating and a complementary second grating. The first grating includes a plurality of first grating cells. The complementary second grating includes a plurality of second grating cells. The second grating is positioned relative to the first grating. A configuration of the first grating, a configuration of the second grating and the relative positioning of the grating are configured to pass one or more small angle scattered photons and to block one or more Compton scattered photons and one or more main x-ray photons.

An x-ray inspection system comprising an x-ray source, an x-ray detector, a sample support comprising a pliable material and a sample support positioning assembly configured to position the sample support between the x-ray source and the x-ray detector. The sample support is configured to removably clamp a sample for inspection in a fixed position with respect to the sample support and configured so that, in use, at least one surface of the sample is in contact with the pliable material. The sample support positioning assembly comprises a rotational drive configured to rotate the sample support about a rotational axis. This allows the sample to be rotated about a rotational axis such that a series of two-dimensional images can be captured by the x-ray detector that can be used to create a three-dimensional reconstruction of the sample.

Devices and methods are disclosed for identifying compounds using spectra generated by X-rays at two different voltage levels.

Device for automatically analyzing micro organisms in an aqueous sample using filter cytometry comprising at least one filter holder and processing modules, wherein the filter holder is arranged to contain a filter for receiving the sample, wherein the processing modules comprise sample application means for applying the sample to the filter in the holder and imaging means for imaging the micro organisms on the filter, wherein the device furthermore comprises displacement means for automatically moving the filter holder between the processing modules and wherein each of the modules and the filter holder are arranged to removable connect for interaction.

Disclosed herein is a system and method, which utilize primary beam modulation to enable single-scan dual-energy CT (DECT) on a conventional CT scanner. An attenuation sheet with a spatially-varying pattern is placed between the x-ray source and the imaged object. During the CT scan, the modulator selectively hardens the x-ray beam at specific detector locations. Thus, this method simultaneously acquires high and low energy data at each projection angle. High and low energy CT images can then reconstructed from the projections via an iterative CT reconstruction algorithm, which accounts for the spatial modulation of the projected x-rays.

An embodiment of a shutter assembly is described that comprises a support structure with a number of stations and operatively coupled to a motor configured to translate each of the stations to a position in front of a detector, wherein a first station comprises a first aperture, a first charged particle filter, and a first window; and a second station comprises a second aperture larger than the first aperture, a second charged particle filter, and a second window thinner than the first window.

A method and system is disclosed for acquiring image data of a subject. The image data can be collected with an imaging system in a selected manner and/or motion. More than one projection may be combined to generate and create a selected view of the subject.

Disclosed herein is an x-ray backscatter apparatus for non-destructive inspection of a part. The apparatus comprises an emission shaping mechanism that is configured to receive an electron emission from a cathode and to adjust a shape of the electron emission from a circular cross-sectional shape into a first elliptical cross-sectional shape. The x-ray source further comprises an anode that is configured to convert the electron emission into an unfiltered x-ray emission having a second elliptical cross-sectional shape. The apparatus also comprises an x-ray filter that comprises an emission aperture having a cross-sectional area smaller than an area of the second elliptical cross-sectional shape of the unfiltered x-ray emission. The x-ray filter is located relative to the unfiltered x-ray emission to allow only a portion of the unfiltered x-ray emission to pass through the emission aperture and form a filtered x-ray emission.