G01N2223/313

WIEN FILTER AND MULTIPLE ELECTRON BEAM INSPECTION APPARATUS
20230136198 · 2023-05-04 · ·

A Wien filter includes a cylindrical yoke, a plurality of magnetic poles arranged at intervals along an inner periphery of the yoke, the magnetic poles each joined at one end thereof to the yoke, a coil wound on each of the plurality of magnetic poles, and an electrode disposed at the other end of each of the plurality of magnetic poles, with an insulator between the electrode and the magnetic pole. The magnetic poles each has a recess at the other end thereof, and the insulator and the electrode may be disposed in the recess.

SYSTEMS, DEVICES, AND METHODS FOR MULTISOURCE VOLUMETRIC SPECTRAL COMPUTED TOMOGRAPHY
20230375484 · 2023-11-23 ·

A multisource volumetric spectral computed tomography imaging device includes an x-ray source array with multiple spatially distributed x-ray focal spots, an x-ray beam collimator with an array of apertures, each confining the radiation from a corresponding x-ray focal spot to illuminate a corresponding segment of an object, a digital area x-ray detector, and a gantry to rotate the x-ray source array and the detector around the object. An electronic control unit activates the radiations from the x-ray focal spots to scan the object multiple times as the gantry rotates around the object. The images are used to reconstruct a volumetric CT image of the object with reduced scattered radiation. For dual energy and multi energy imaging, radiation from each focal spot is filtered by a corresponding spectral filter to optimize its energy spectrum.

X-RAY INSPECTION APPARATUS AND METHOD OF INSPECTION WITH X-RAYS

Proposed are an X-ray inspection apparatus and a method of inspection with X-rays in which even in a sample having coated portion and uncoated portion of the cathode material, the inspection of foreign objects in the both portions can be simultaneously performed under the same conditions. The X-ray inspection apparatus includes an X-ray source (2) that irradiates the sample (S) with X-rays (X1), an X-ray detection unit (3) which is installed at a side opposite to the X-ray source with respect to the sample and detects the X-rays that passed through the sample, and a filter (4) installed between the X-ray source and the X-ray detection unit, wherein the sample has a region with a large amount of X-ray absorption and a region with a small amount of X-ray absorption.

DETECTION SCHEME FOR X-RAY SMALL ANGLE SCATTERING

A detection scheme for x-ray small angle scattering is described. An x-ray small angle scattering apparatus may include a first grating and a complementary second grating. The first grating includes a plurality of first grating cells. The complementary second grating includes a plurality of second grating cells. The second grating is positioned relative to the first grating. A configuration of the first grating, a configuration of the second grating and the relative positioning of the gratings are configured to pass one or more small angle scattered photons and to block one or more Compton scattered photons and one or more main x-ray photons.

System and method for high-resolution high contrast x-ray ghost diffraction
11402342 · 2022-08-02 · ·

A system for high-resolution high-contrast x-ray ghost diffraction comprises: A) a laboratory x-ray source configured to provide an input beam; B) a diffuser configured to induce intensity fluctuations in the input beam; C) a beam splitter configured to split the input beam into: i) a test arm comprising an object and a single-pixel detector; and ii) a reference arm comprising one of: (a) a multi-pixel detector and (b) a single-pixel detector and an aperture or a scanning slit configured to simulate a one or two dimensional multi-pixel detector; and D) a processor configured to receive output intensity measurements of the detectors in the test arm and the reference arm, to record the output intensity measurements at different rotational positions of the rotating diffuser, to correlate the output intensity measurements, and to use the correlated output measurements to reconstruct a diffraction pattern of the object; wherein the object is placed as close as possible to the beam splitter and the detectors in the test arm and the reference arm are equidistant from the beam splitter.

X-ray imaging system and method

A system for imaging includes an X-ray source for transmitting X-rays through a subject and a measurement sensor to acquire measurement data related to the subject. A detector is provided in the system to receive the X-ray energy of the X-rays after having passed through the subject. The system further includes a controller that receives the measurement data from the measurement sensor and processes the measurement data using an image processing algorithm to determine varying thickness of the subject at a plurality of locations within an area of interest. The controller further positions a filter between the X-ray source and the subject based on varying thickness of the subject and generates the image of the subject based on the detected X-ray energy at the X-ray detector.

Filter system for the local attenuation of X-radiation, X-ray apparatus and method for locally changing the intensity of X-radiation

A filter system is for the local attenuation of X-radiation. In an embodiment, the filter system includes a filter device, arranged in a beam path of an X-ray apparatus and including a channel arrangement, the channel arrangement including a multiplicity of channel sections extending in parallel on a plane; a supply device to provide a 2-phase fluid flow containing drops of an absorber liquid, to absorb X-radiation and a carrier liquid transparent to X-radiation; and a sorting section, including an input connected to the supply device, a first output connected to the channel arrangement, a second output, and a deflection device to direct individual drops of the absorber liquid to the first output or the second output.

APPARATUS FOR THE MEASUREMENT OF MINERAL SLURRIES
20210310969 · 2021-10-07 ·

Disclosed is a measurement probe for measurement of elements in a mineral slurry. The probe includes a housing having an X-ray window. The housing encloses: an X-ray source positioned to emit source X-rays at the X-ray window; an X-ray detector positioned to detect X-rays from the X-ray window; and a control module. The control module is configured to: control operation of the X-ray source and the X-ray detector; process X-rays detected by the X-ray detector to generate X-ray spectra data; and process the X-ray spectra data to determine the quantity of one or more elements of interest in the mineral slurry. The measurement probe includes a probe mount adapted to couple the measurement probe to a pipe mount on a pipe carrying the mineral slurry; when the probe mount is coupled to the pipe mount, the X-ray window provides a transmission window for X-rays into a lumen of the pipe.

SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF PARTS
20210310967 · 2021-10-07 ·

Disclosed herein is an x-ray backscatter apparatus for non-destructive inspection of a part. The apparatus comprises an emission shaping mechanism that is configured to receive an electron emission from a cathode and to adjust a shape of the electron emission from a circular cross-sectional shape into a first elliptical cross-sectional shape. The x-ray source further comprises an anode that is configured to convert the electron emission into an unfiltered x-ray emission having a second elliptical cross-sectional shape. The apparatus also comprises an x-ray filter that comprises an emission aperture having a cross-sectional area smaller than an area of the second elliptical cross-sectional shape of the unfiltered x-ray emission. The x-ray filter is located relative to the unfiltered x-ray emission to allow only a portion of the unfiltered x-ray emission to pass through the emission aperture and form a filtered x-ray emission.

DUAL-ENERGY CT THROUGH PRIMARY BEAM MODULATION
20210247331 · 2021-08-12 ·

Disclosed herein is a system and method, which utilize primary beam modulation to enable single-scan dual-energy CT (DECT) on a conventional CT scanner. An attenuation sheet with a spatially-varying pattern is placed between the x-ray source and the imaged object. During the CT scan, the modulator selectively hardens the x-ray beam at specific detector locations. Thus, this method simultaneously acquires high and low energy data at each projection angle. High and low energy CT images can then reconstructed from the projections via an iterative CT reconstruction algorithm, which accounts for the spatial modulation of the projected x-rays.