Patent classifications
G01N2223/316
Re-Entrant Cones for Moderator Chamber of a Neutron Imaging System
A neutron imaging system that includes a central neutron source configured to produce source neutrons, wherein the central neutron source comprises a beam target, a moderator chamber surrounding at least a portion of the beam target, the moderator chamber housing a moderator, and a re-entrant cone extending into the moderator chamber. The re-entrant cone includes an entrance surface having a concave curvature facing the beam target. The entrance surface encloses a cone chamber, isolating the cone chamber from the moderator.
Reducing scatter for computed tomography
A method of computed tomography includes illuminating an object with a cone of illumination, wherein the object is between a source of the cone of illumination and a two-dimensional photo-detector array. The method includes shielding the photodetector array from the collimator shield that includes a slit defined therethrough and moving the slit of the collimator shield across the photodetector array in a direction perpendicular to the slit to expose the photodetector array to the cone of illumination through the slit as the slit scans across the photodetector array to acquire a two-dimensional image of the object. The method includes rotating the object to a new rotational position and repeating movement of the slit to expose the photodetector and rotating the object along the axis until the object has been imaged from multiple rotational positions to form a three-dimensional model of the object.
FOCUSED TOMOGRAPHY
An exemplary focused tomography system comprises an x-ray transmitter that is configured to emit a radiation beam and an x-ray detector that is configured to detect incident radiation from the radiation beam. The system further includes an adaptive collimator device arranged between the x-ray transmitter and the x-ray detector and a controller device connected to the x-ray transmitter that is configured to cause the x-ray transmitter to emit the radiation beam at a first radiation dosage level when a path of the radiation beam intersects a region of interest of the subject and cause the x-ray transmitter to emit the radiation beam at a second radiation dosage level when the path of the radiation beam does not intersect the region of interest of the subject, such that the second radiation dosage level is less than the first radiation dosage level. Data within the region of interest can be reconstructed with image quality equivalent to traditional computed tomography scans.
X-ray collimator and related X-ray inspection apparatus
An X-ray collimator (30) that comprises: a collimator body (31) comprising: a collimation conduit (32) provided with an inlet (320), configured to be connected to an X-ray source (20) for the inlet of a beam (B) of X-rays, and an outlet (321), configured to emit a collimated portion (B1) of the X-ray beam (B); and a derivation conduit (33) inclined with respect to the collimation conduit (32), wherein the derivation conduit (33) is provided with an inlet (330), configured to be connected to the X-ray source (20) for the inlet of a peripheral portion (B2) of the same X-ray beam (B) emitted by the source (20), and an outlet (331); a reference detector (40) fixed to the collimator body (31) and provided with an inlet window (41) facing the outlet (331) of the derivation conduit (33).
X-ray fluorescence spectrometer
The present invention relates to an X-ray fluorescence, XRF, spectrometer, for measuring X-ray fluorescence emitted by a target, wherein the XRF spectrometer comprises an X-ray tube with an anode to emit a divergent X-ray beam, a capillary lens that is configured to focus the divergent X-ray beam on the target, an aperture system that is positioned between the anode of the X-ray tube and the capillary lens and comprises at least one pinhole, and a detector that is configured for detecting X-ray fluorescence radiation emitted by the target, wherein the at least one pinhole is configured for being inserted into the divergent X-ray beam and for reducing a beam cross section of the divergent X-ray beam between the anode and the capillary lens. The present invention further relates to an aperture system for a spectrometer, to the use of an aperture system for adjusting the focal depth of a spectrometer and to a method for adjusting the focal depth of as spectrometer.
DEFINING PARAMETERS FOR SCAN OF SINGLE CRYSTAL STRUCTURE
A method of defining at least one scan parameter for an x-ray scan of a single crystal structure, the method comprising: determining a target orientation of the structure for the scan; and defining different non-zero levels of x-ray exposure for different parts of a scan area based on either or both of the target orientation and characteristics of the structure; and, defining the scan area so that substantially all x-rays of the scan are directed to the structure in the target orientation.
X-ray analysis apparatus
The X-ray analysis apparatus of the present invention comprises a sample stage for supporting a sample, a goniometer having an axis of rotation, and an X-ray detector arranged to be rotatable about the axis of rotation of the goniometer, wherein the X-ray detector is arranged to receive X-rays from the sample directed along an X-ray beam path. The X-ray analysis apparatus further comprises a first collimator, a second collimator and a third collimator each having a first configuration and a second configuration. In its first configuration, the collimator is arranged in the X-ray beam path. In its second configuration the collimator is arranged outside of the X-ray beam path. A first actuator arrangement is configured to move the first collimator and the second collimator between the first configuration and the second configuration by moving the first collimator and the second collimator in a lateral direction that intersects the X-ray beam path. A second actuator arrangement is configured to move the third collimator between its first configuration and its second configuration. A controller is configured to control the first actuator arrangement to move the first collimator between the first configuration and the second configuration.
Methods and Means for the Measurement of Tubing, Casing, Perforation and Sand-Screen Imaging Using Backscattered X-ray Radiation in a Wellbore Environment
An x-ray-based cased wellbore tubing and casing imaging tool is disclosed, the tool including at least a shield to define the output form of the produced x-rays; a two-dimensional per-pixel collimated imaging detector array; a parallel hole collimator format in one direction that is formed as a pinhole in another direction; Sonde-dependent electronics; and a plurality of tool logic electronics and PSUs. A method of using an x-ray-based cased wellbore tubing and casing imaging tool is also disclosed, the method including at least: producing x-rays in a shaped output; measuring the intensity of backscatter x-rays returning from materials surrounding a wellbore; determining an inner and an outer diameter of tubing or casing from the backscatter x-rays; and converting image data from said detectors into consolidated images of the tubing or casing.
Non-Destructive Inspection Methods, Systems and Apparatuses Using Focusable X-Ray Backscatter Detectors
Methods, apparatuses, and systems are disclosed for generating X-ray backscatter images of a target by employing a flexible, deformable and flexible X-ray backscatter detector comprising a scintillating material layer comprising a scintillating jet print ink.
Set-up and method for spatially resolved measurement with a wavelength-dispersive X-ray spectrometer
X-ray spectrometer comprising an X-ray source emitting X-ray radiation onto a sample, a collimator arrangement for collimating X-ray radiation that has passed through a diaphragm arrangement, the collimator arrangement comprising a modified Soller slit with mutually parallel lamellae forming a plurality of slit-shaped passages, at least a portion of the slit-shaped passages having partition walls aligned substantially perpendicularly to the slit-shaped passages, the partition walls being non-transmissive to X-ray radiation and restricting the transverse divergence of the X-ray radiation passing through the collimator arrangement in a direction transversely with respect to the diffraction plane of the X-ray radiation coming from the sample. Significantly faster spatially resolved measurements can thus be carried out.