G01N2223/317

Structure for pressurization analysis, X-ray diffraction apparatus and pressurization analysis system
11913891 · 2024-02-27 · ·

A structure for pressurization analysis includes a sample accommodating unit (10) for accommodating an all-solid-state battery (S) therein, and a pressurizing unit (30) having a pressurizing mechanism for causing pressure to act on the all-solid-state battery (S). The all-solid-state battery (S) is pressurized inside the sample accommodating unit (10) while being sandwiched between a pressure receiving member (21) and a pressing member (22). Further, an X-ray window (14) is provided in an outer radial direction orthogonal to an acting direction of the pressure from the pressurizing unit (30), and reflection type X-ray diffraction measurement can be performed through the X-ray window (14).

RADIATION DETECTION DEVICE
20190317032 · 2019-10-17 ·

The radiation detection device is equipped with a sample holding unit; an irradiation unit for irradiating a sample held on the sample holding unit with radiations; a detection unit for detecting the radiations generated from the sample; an illumination unit for irradiating the sample with light; an observation unit for observing the sample; and a light transmitting plate for allowing the light from the illumination unit, with which the sample held on the sample holding unit is irradiated, to be transmitted therethrough. The light transmitting plate is disposed at a position between the sample holding unit and the irradiation unit, and has an opening portion for allowing the radiations from the irradiation unit, with which the sample is irradiated, to pass therethrough and a scattering portion for scattering light.

XRF analyzer for light element detection

The invention includes an XRF analyzer with reduced x-ray attenuation between sample and target and between sample and detector. Attenuation can be reduced by removing atmospheric-air paths through which the x-rays must travel. Reduced x-ray attenuation can allow for easier detection of low-atomic-number elements. Cost saving can be achieved by reducing the number of x-ray windows.

High Resolution X-Ray Imaging System
20180277275 · 2018-09-27 ·

A masking apparatus surrounds a specimen and eliminates the presence of voids and gaps between a specimen and a radiation sensitive imaging surface. Voids and gaps allow radiation to become trapped or diffracted therein and lead to noise in the resulting image. A system of radiological imaging associates both a filter and a masking assembly to a specimen for an optimal radiation exposure that permeates the specimen to an imaging array there under.

XRF instrument with removably attached window protecting film assembly

Herein disclosed is an x-ray florescence (XRF) test system which comprises an XRF test instrument used for testing a test target's responses to X-rays, the instrument including a test window allowing the X-ray and its responsive energy to pass through, and a window protecting film assembly allowing X-rays to pass through and providing protection to the window, the film assembly being configured to be coupled with the window in a fashion to be removed from or applied or reapplied over the window. The corresponding calibration mode can be manually or automatically applied according to the specific film assembly presently in use. An embodiment of the film assembly comprises a thin film fixed with an adhesive layer to a supporting frame having a closely spaced array of apertures.

Secondary image removal using high resolution x-ray transmission sources
12181423 · 2024-12-31 · ·

An apparatus includes a transmission x-ray source having a window including a target layer of at least one x-ray generating material and an internal aperture configured to allow a first portion of an electron beam to bombard the target layer and to block a second portion of the electron beam from bombarding the target. The first portion of the electron beam has a full-width-at-half-maximum width at the target less than or equal to 1 micron. The window is spaced from the internal aperture by a first distance D.sub.1. The apparatus further includes an x-ray detector system having a scintillator, an optical assembly, at least one image sensor configured to receive and respond to visible light by generating electrical signals, and a motorized stage configured to controllably adjust a position of the scintillator such that the scintillator is spaced from the window by a second distance D.sub.2, wherein D.sub.2.sup.2/(D.sub.1+D.sub.2).sup.2 is less than 0.2.

Pre-stressed gamma densitometer window and method of fabrication

A gamma densitometer window is provided along with a method of fabrication thereof. The window comprises a plate of non-metallic, preferably gamma transparent, material having a first face and a second face opposing one another and having an outer edge defined therebetween. The window further comprises a metallic frame member fitted around the outer edge of the plate and adapted to pre-load the plate with a compressive stress that is sufficiently high such that the sum of the compressive stress, tensile stress and shear stress components generated in the plate under high-pressure conditions is always compressive. The method of fabrication shrink fitting the metallic frame member around the outer edge of the plate at a shrink-fit temperature such that the metallic frame member applies a compressive stress to the plate at any temperature below the shrink-fit temperature.

PRE-STRESSED GAMMA DENSITOMETER WINDOW AND METHOD OF FABRICATION
20170010225 · 2017-01-12 ·

A gamma densitometer window is provided along with a method of fabrication thereof. The window comprises a plate of non-metallic, preferably gamma transparent, material having a first face and a second face opposing one another and having an outer edge defined therebetween. The window further comprises a metallic frame member fitted around the outer edge of the plate and adapted to pre-load the plate with a compressive stress that is sufficiently high such that the sum of the compressive stress, tensile stress and shear stress components generated in the plate under high-pressure conditions is always compressive. The method of fabrication shrink fitting the metallic frame member around the outer edge of the plate at a shrink-fit temperature such that the metallic frame member applies a compressive stress to the plate at any temperature below the shrink-fit temperature.

Joint for a scan window formed to a cylinder

A scan window for an imaging system includes at least one flexible sheet made of an X-ray transparent material and having a first end and a second end. The scan window also includes at least one tapered joint formed between the first end and the second end and secured via a bonding agent to form a joined member with the at least one flexible sheet.

JOINT FOR A SCAN WINDOW FORMED TO A CYLINDER

A scan window for an imaging system includes at least one flexible sheet made of an X-ray transparent material and having a first end and a second end. The scan window also includes at least one tapered joint formed between the first end and the second end and secured via a bonding agent to form a joined member with the at least one flexible sheet.