A method for inspecting a sample with a multi-electron beam inspection system (100) is described. The method includes: placing the sample on a movable stage (110) extending in an X-Y-plane; generating a plurality of electron beams (105) propagating toward the sample; focusing the plurality of electron beams on the sample at a plurality of probe positions (106) in a two-dimensional array; scanning the sample surface by moving the movable stage in a predetermined scanning pattern while maintaining the plurality of electron beams stationary; and detecting signal electrons emitted from the sample during the movement of the movable stage for inspecting the sample. Further, a multi-electron beam inspection system (100) for inspecting a sample according to the above method is described.

A fluid pressure loading device applied to an industrial computed tomography scanning test system includes a body, a sample accommodating chamber and at least one fluid medium chamber being provided in the body. Each of the at least one fluid medium chamber is provided therein with a piston, the corresponding fluid medium chamber is separated into two chambers by the piston, one of the two chambers is in communication with an external hydraulic medium via oil lines provided in the body, the other of the two chambers is in communication with the sample accommodating chamber, and one end, facing towards the sample accommodating chamber, of the piston is extendable into the sample accommodating chamber. With the loading device, real-time loading of a test sample can be realized, thus improving a simulation accuracy of the system, and multi-directional loading of the sample can be realized.

A sequential X-ray fluorescence spectrometer according to the present invention includes a total analysis time display unit configured to measure, for each kind of analytical sample, a standard sample which contains a component at a known content as a standard value to determine a measured intensity of each measurement line corresponding to the component. The total analysis time display unit is further configured to calculate, for each component, a counting time which gives a specified analytical precision by using the standard value and the measured intensity and to calculate a total counting time as a sum of the counting times of respective components. The total analysis time display unit is configured to calculate a total analysis time as a sum of the total counting time and a total non-counting time and to output the calculated total analysis time and the calculated counting times of the respective components.

To provide an inspection device capable of imaging a transmission image while changing relative positions of a radiation source, an inspection object, and a detector. An inspection device comprises a radiation generator, a substrate holding unit for holding an inspection object, a detector, a substrate holding unit driving unit and a detector driving unit, a substrate position detection unit and a detector position detection unit, and a control unit, wherein the control unit executes a step for causing the detector to start acquiring an image while the relative positions of the radiation generator, the substrate holding unit and the detector are changing, a step for acquiring information relating to the positions of the substrate holding unit and the detector when the detector starts acquiring an image, and a step for storing the image acquired by the detector and the information relating to the position in association with each other.

In an X-ray inspection apparatus, an X-ray detector starts to acquire an X-ray image before a motor is started and outputs a periodic acquisition timing signal of the X-ray image, a generation circuit control unit generates a motor start signal based on a first signal generated from the acquisition timing signal, and a start signal generation circuit generates and outputs a controller start signal to a controller at an output timing of the acquisition timing signal after receiving the motor start signal. A CT image is generated based on a plurality of the X-ray images that are acquired after a rotation speed of the motor reaches a fixed speed.

In accordance with some embodiments of the present disclosure, systems and methods for determining the leaching profile of cutter on a drilling tool are disclosed. The method includes applying an X-ray impermeable layer to a surface of a leached PCD element with residual infiltrant. The method also includes moving the element through an X-ray beam. The method further includes detecting an X-ray intensity received by an X-ray detector. The method further includes generating a leaching profile of the leached PCD element based on the X-ray intensity.

A radiation analyzing apparatus includes a radiation irradiation unit configured to irradiate an object with a first radiation, a radiation detection unit configured to detect a second radiation generated from the object irradiated with the first radiation, a radiation converging unit configured to disposed between the object and the radiation detection unit and to converge the second radiation on the radiation detection unit, a position changing unit configured to vary a relative positional relationship between the radiation converging unit and the radiation detection unit, and a driving unit configured to change the positional relationship.

There is provided a method for at least partly determining the orientation of an edge-on x-ray detector with respect to the direction of x-rays from an x-ray source. The method includes obtaining (S1) information from measurements, performed by the x-ray detector, representing the intensity of the x-rays at a minimum of two different relative positions of a phantom in relation to the x-ray detector and the x-ray source, the phantom being situated between the x-ray source and the x-ray detector and designed to embed directional information in the x-ray field when exposed to x-rays. The method also includes determining (S2) at least one parameter associated with the orientation of the x-ray detector with respect to the direction of x-rays based on the obtained information from measurements and a geometrical model of the spatial configuration of the x-ray detector, x-ray source and phantom.

A non-destructive inspection system 1 includes a neutron radiation source 3 capable of emitting neutrons N, and a neutron detector 14 capable of detecting neutrons Nb produced via an inspection object 6a among neutrons N emitted from the neutron radiation source 3. The neutron radiation source 3 includes a linear accelerator 11 capable of emitting charged particles P accelerated; a first magnet section 12 including magnets 12a and 12b facing each other, the magnets 12a and 12b being capable of deflecting the charged particles P in a direction substantially perpendicular to a direction of emission of the charged particles P from the linear accelerator 11; and a target section 13 capable of producing neutrons N by being irradiated with the charged particles P that have passed through the first magnet section 12.

A method for operating a measurement system (100) comprises: generating a beam of electromagnetic radiation (25) directed along a central ray (27) using a radiation source (19); moving the radiation source (19) relative to an object region (35) so that the central ray (27) is directed onto a radiation detector (31) during the movement; wherein the moving of the radiation source (19) relative to the object region (35) comprises: rotating the radiation source (19) about a first axis of rotation (D1), wherein the radiation source (19) is disposed eccentrically to the first axis of rotation (D1); rotating the radiation source (19) about a second axis of rotation (D2), wherein the first axis of rotation (D1) and the second axis of rotation (D2) together enclose an acute angle (α) amounting to at most 80°.