A material characterization system and method for characterizing a stream of material emanating from a material identification, exploration, extraction or processing activity, the system including a source of incident radiation configured to irradiate the stream of material in an irradiation region, one or more detectors adapted to detect radiation emanating from within or passing through the stream of material as a result of the irradiation by the incident radiation and thereby produce a detection signal, and one or more digital processors configured to process the detection signal to characterise the stream of material, wherein the source of incident radiation and the one or more detectors are adapted to be disposed relative to the stream of material so as to irradiate the stream of material and detect the radiation emanating from within or passing through the stream as the stream passes through the irradiation region.

Atomic position data may be obtained from x-ray diffraction data. The x-ray diffraction data for a sample may be squared and/or otherwise operated on to obtain input data for a neural network. The input data may be input to a trained convolutional neural network. The convolutional neural network may have been trained based on pairs of known atomic structures and corresponding neural network inputs. For the neural network input corresponding to the sample and input to the trained convolutional neural network, the convolutional neural network may obtain an atomic structure corresponding to the sample.

Chemical components in a mixture are analysed using scattering data representing the results of a diffraction experiment performed on the mixture. Using non-negative matrix factorisation or another optimisation technique, the scattering data is deconvolved into non-negative basis components that represent contributions to the scattering data from each chemical component and fitting coefficients are derived in respect of the basis components that represent the proportions of chemical components in the mixture.

A method for identifying a material contained in a sample. The sample is subjected to irradiation via ionizing electromagnetic radiation, for example X-rays. The sample is inserted between a source emitting the radiation and a spectrometric detector configured to acquire a spectrum of the radiation transmitted by the sample. The spectrum is subject to different treatment operations to enable classification of the material. The steps are, consecutively: reducing dimensionality, followed by projecting along the predefined projection vectors. Projection makes it possible to establish classification parameters, on the basis of which classification is established.

The invention provides a material characterisation system and method for characterising a stream of material emanating from a material identification, exploration, extraction or processing activity, the system comprising: a source of incident radiation (64) configured to irradiate the stream of material in an irradiation region (18); one or more detectors (300,302,312,1701,1704,1600,1607,1608,1604) adapted to detect radiation emanating from within or passing through the stream of material as a result of the irradiation by the incident radiation (1700) and thereby produce a detection signal (313); and one or more digital processors (304-311,2000-2009) configured to process the detection signal to characterise the stream of material; wherein the source of incident radiation (64) and the one or more detectors (300,302,312,1701,1704,1600,1607,1608,1604) are adapted to be disposed relative to the stream of material so as to irradiate the stream of material and detect the radiation emanating from within or passing through the stream (1700) as the stream passes through the irradiation region (18).

The invention provides a system and method for characterising at least part of a material comprising: a source of incident X-rays (4, 28) configured to irradiate at least part of the material; one or more detectors (300,302,312,1701,1704,1600,1607,1608,1604) adapted to detect radiation emanating from within or passing through the material as a result of the irradiation by the incident radiation (1700) and thereby produce a detection signal (313); and one or more digital processors (304-311,2000-2009) configured to process the detection signal (313) to characterise at least part of the material; wherein the one or more detectors (300,302,312,1701, 1704,1600,1607,1608,1604) and one or more digital processors (304-311,2000-2009) are configured to characterise at least part of the material by performing energy resolved photon counting X-ray transmission spectroscopy analysis.

A method for evaluating the crosslink concentration in a crosslinked rubber is provided. The present invention relates to a method for evaluating the crosslink concentration in a crosslinked rubber by small-angle X-ray scattering or small-angle neutron scattering using measurement samples prepared by swelling the crosslinked rubber to different degrees of swelling.

A method for identifying a material contained in a sample. The sample is subjected to irradiation via ionizing electromagnetic radiation, for example X-rays. The sample is inserted between a source emitting the radiation and a spectrometric detector configured to acquire a spectrum of the radiation transmitted by the sample. The spectrum is subject to different treatment operations to enable classification of the material. The steps are, consecutively: reducing dimensionality, followed by projecting along the predefined projection vectors. Projection makes it possible to establish classification parameters, on the basis of which classification is established.

An analysis device includes an electron beam source that irradiates a sample with a charged particle beam, and a detection unit having a plurality of detection regions that detects electrons emitted from the sample irradiated with the charged particle beam. The analysis device includes an arithmetic processing unit 100 that performs predetermined arithmetic processing on strength distribution of a plurality of detection signals respectively detected by the plurality of detection regions.

Methods and systems for spectroscopic analysis of focused ion beam induced optical emission include accessing a spectrum acquired from a sample responsive to irradiating the sample with an ion beam and identifying the spectral peaks of the spectrum. The emission type of the spectral peak is determined based on a spectral resolution of a light collection system for collecting the spectrum. The emission types include elemental emission, molecular emission, and bandgap emission.