A system for quantifying x-ray backscatter system performance may include a support; a plurality of rods mounted on the support; the rods of the plurality of rods arranged parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width; and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, apply a transfer function to generate a transfer curve representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.

The present disclosure relates to X-ray imaging systems and methods. An exemplary system may comprise a distributed X-ray source arrangement, a fixed grating module, an X-ray detecting device, and a computer workstation. In one illustrative implementation, X-ray sources of the distributed incoherent X-ray source arrangement may sequentially generate and emit X-rays to an object to be detected. Further, for each exposure, the X-ray detecting device may receive the X-rays, wherein after a series of stepping exposures and corresponding data acquisitions, at each pixel of the X-ray detecting device, X-ray intensities are represented as an intensity curve; the intensity curve may be compared to an intensity curve in the absence of the object to be detected, and a pixel value at each pixel may be obtained from a variation of the intensity curves; and image information of the object to be detected may be obtained according to such pixel values.

The invention relates to a method for inspecting a sample with an assembly comprising a scanning electron microscope (SEM) and a light microscope (LM). The assembly comprises a sample holder for holding the sample. The sample holder is arranged for inspecting the sample with both the SEM and the LM, preferably at the same time. The method comprising the steps of: capturing a LM image of the sample in its position for imaging with the SEM; determining a position and dimensions of a region of interest in or on the sample using the LM image; determining values to which the SEM parameters need to be set to image the sample at a desired resolution; and capturing a SEM image of the region of interest, preferably using the first electron beam exposure of said region of interest.

A method including inspecting, using an X-ray transmission image, internal defects in a TSV formed in a semiconductor wafer, and detecting the X-rays, and processing an X-ray transmission image. Therein, the detection of X-rays is configured such that: the detection azimuth of the X-rays, and the detection elevation angle of the X-rays relative to the X-ray source are determined on the basis of information on the arrangement interval, depth, and planar shape of structures formed in the sample. The angle of rotation of a rotating stage on which the sample is mounted is adjusted in accordance with the detection azimuth which has been determined, and the X-rays that have been transmitted through the sample are detected with the position of the detector set to the detection elevation angle which has been determined.

A radiation imaging system comprises a radiation imaging apparatus having a plurality of imaging modes, and a control apparatus configured to control imaging of a radiation image with respect to the radiation imaging apparatus. The radiation imaging system comprises: an obtaining unit configured to obtain information with respect to a communication state between the radiation imaging apparatus and the control apparatus; and a display control unit configured to cause a display unit of at least one of the radiation imaging apparatus and the control apparatus to display information indicating a margin in the communication state based on an imaging mode of the radiation imaging apparatus and the information with respect to the communication state.

Provided is a method for determining an atom using four-color X-ray equipment capable of determining which group an atom having a greatest atomic number among atoms constituting a material belongs on the periodic table.

Provided are an object identification device and an object identification method in which objects can be easily identified. The object identification device is provided with a pixel group extraction unit which scans, in units of the image area, an X-ray transferred image obtained from an imaging unit which performs X-ray imaging to an item to be inspected that is supplied, and extracts a plurality of pixel groups including characteristics of a shape of at least a part of the item to be inspected, and a determination unit which determines, with regard to the plurality of pixel groups extracted by the pixel group extraction unit, whether the item to be inspected corresponds to the object by executing all of the series of mappings related to an angle of an n direction by using each of the weight parameters based on the data group read from the memory unit.

An X-ray CT system includes an X-ray tube, an X-ray detector and processing circuitry. The processing circuitry is configured to cyclically change energy of the X-rays during one rotation of the X-ray tube around a subject. The processing circuitry is configured to perform a process including a correcting process addressing a difference in a transmission amount between X-rays having first energy and X-rays having second energy, on at least one selected from between: a plurality of first projection data sets acquired when the X-rays having the first energy were radiated; and a plurality of second projection data sets acquired when the X-rays having the second energy were radiated. The processing circuitry is configured to reconstruct an image on the basis of a combined data set generated on the basis of a plurality of projection data sets including the projection data sets resulting from the process.

A cabinet X-ray image system for obtaining X-ray images and colorized or grey scale density X-ray images of a specimen includes a sampling chamber for containing the specimen, a display, an X-ray system including, an X-ray source, a photon counting X-ray detector, and a specimen platform, and a controller configured to selectively energize the X-ray source, control the photon counting X-ray detector to collect a projection X-ray image of the specimen when the X-ray source is energized, determine the density of different areas of the specimen from data collected from the photon counting X-ray detector of the projection X-ray image, create a density X-ray image of the specimen wherein different areas of the specimen are indicated as a density or range of densities based on the determined density of different areas of the specimen, and selectively display the density X-ray image of the specimen on the display.

An X-ray detector for an X-ray diffraction analysis apparatus comprises a sensor, a readout circuit, a processor and a display output for communicating a display signal to a display device. The sensor detects X-ray photons by converting an X-ray photon incident on the sensor into a sensor output signal. The readout circuit receives the sensor output signal from the sensor and determines an X-ray photon count, by counting the sensor output signal. The processor is configured to calculate an X-ray intensity value using the X-ray photon count, and to generate a display signal for displaying an image representing the X-ray intensity value. The display output is configured to communicate the display signal to a display device for displaying the X-ray intensity value.