There is provided an acquiring method of a projection image of a sample whose shape is uneven with respect to a rotation center, the method comprising the steps of setting the sample S0 at a position of the rotation center C0 provided between an X-ray source 116a and a detector 117, and acquiring the projection image of the sample S0 at each different rotation angle for each different magnification ratio over a rotation angle of 180 or more by rotating the sample S0 around the rotation center C0, and by relatively changing a separation distance between the X-ray source and the rotation center, or a separation distance between the rotation center and the detector in an optical axis direction according to the shape of the sample S0 and the rotation angle of the sample S0.

The presently-disclosed technology improves the resolution of an x-ray microscope so as to obtain super-resolution x-ray images having resolutions beyond the maximum normal resolution of the x-ray microscope. Furthermore, the disclosed technology provides for the rapid generation of the super-resolution x-ray images and so enables real-time super-resolution x-ray imaging for purposes of defect detection, for example. A method of super-resolution x-ray imaging using a super-resolving patch classifier is provided. In addition, a method of training the super-resolving patch classifier is disclosed. Other embodiments, aspects and features are also disclosed.

A method of detecting an anomaly in a crystallographic structure, the method comprising: illuminating the structure with x-ray radiation in a known direction relative to the crystallographic orientation; positioning the structure such that its crystallographic orientation is known; detecting a pattern of the diffracted x-ray radiation transmitted through the structure; generating the simulated pattern based on the known direction relative to the crystallographic orientation; comparing the detected pattern to a simulated pattern for x-ray radiation illuminating in the known direction; and, detecting the anomaly in the crystallographic structure based on the comparison.

The presently-disclosed technology improves the resolution of an x-ray microscope so as to obtain super-resolution x-ray images having resolutions beyond the maximum normal resolution of the x-ray microscope. Furthermore, the disclosed technology provides for the rapid generation of the super-resolution x-ray images and so enables real-time super-resolution x-ray imaging for purposes of defect detection, for example. A method of super-resolution x-ray imaging using a super-resolving patch classifier is provided. In addition, a method of training the super-resolving patch classifier is disclosed. Other embodiments, aspects and features are also disclosed.

An X-ray CT system includes an X-ray tube, an X-ray detector and processing circuitry. The processing circuitry is configured to cyclically change energy of the X-rays during one rotation of the X-ray tube around a subject. The processing circuitry is configured to perform a process including a correcting process addressing a difference in a transmission amount between X-rays having first energy and X-rays having second energy, on at least one selected from between: a plurality of first projection data sets acquired when the X-rays having the first energy were radiated; and a plurality of second projection data sets acquired when the X-rays having the second energy were radiated. The processing circuitry is configured to reconstruct an image on the basis of a combined data set generated on the basis of a plurality of projection data sets including the projection data sets resulting from the process.

An isosurface mesh M is generated by extracting voxels having a certain CT value from volume data obtained by X-ray CT. A gradient vector g of a CT value is calculated at each vertex p of the isosurface mesh M. A plurality of sample points S are generated in positive and negative directions of the calculated gradient vector g. Gradient norms N of CT values at the respective generated sample points S are calculated. The vertex p of the isosurface mesh is moved and corrected to a sample point Sm having the maximum norm Nm calculated.

A radiation imaging apparatus is provided. The apparatus comprises an image capturing unit that is provided with pixels for converting incident radiation into electrical signals and is configured to output first image data, a storage unit configured to store position information of a first pixel which continuously outputs an abnormal pixel value, a replacing unit configured to generate second image data from the first image data by replacing a pixel value of the first pixel with a preset setting value based on the position information and a correction unit configured to detect a second pixel which is not stored in the storage unit and outputs an abnormal pixel value, and correct the pixel value of the second pixel. The correction unit detects and corrects the second pixel based on the second image data that includes the first pixel whose pixel value has been replaced.

An X-ray imaging device includes a color sensor configured to generate a color signal indicating a particular color sensed, an imaging matrix of pixel detector elements that are each configured to detect photon energy and generate an image signal, and a controller that is coupled to the color sensor, the imaging matrix, and the wireless transceiver. The controller is configured to receive a color signal from the color sensor, determine an identifier of the computing device external to the X-ray imaging device based on the color signal, and change at least one operational setting of the X-ray imaging device based on the identifier.

The invention relates to a screening method. The method comprises the step of providing a sample, wherein said sample comprises a sample carrier with a surface structure, as well as an object of interest. The method further comprises the step of acquiring an image of said sample. According to the disclosure, the method comprises the steps of providing information on said surface structure of said sample carrier, which may in particular comprise the step of acquiring an image of said sample carrier. In that case two images are obtained: one more sensitive to the objects of interest, and one more sensitive to the surface structure of the sample carrier. This allows manipulation of the acquired image, using said information on the surface structure of the sample carrier. With this, said manipulated image may be screened for easy and reliable detection of said object of interest.

Disclosed is an image displaying apparatus, including: a hardware processor that: acquires a series of frames of a dynamic image from a radiographic imaging apparatus that generates the series of frames at a predetermined imaging frame rate based on received radiation; stores the acquired series of frames in a storage; selects frames to be used for display from the series of frames stored in the storage by picking up a frame from every predetermined number of frames; and displays an edited dynamic image composed of the selected frames on a display.