G01N2223/426

Computed tomography for non-destructive evaluation of manufactured parts
10969771 · 2021-04-06 ·

A method for using computed tomography for non-destructive evaluation of a part, comprising: providing a computed tomography system; loading predetermined computed tomography system setup information; customizing settings with predetermined algorithmic parameters and functions depending on part features; processing projection counts; processing prior knowledge data relevant to the part; creating masking data from the customized settings; pre-processing reconstruction results based on the customized settings; performing algorithmic adjustments based on prior knowledge data and part geometry; performing algorithm adjustments during iterations; and post-processing reconstruction results.

Method for characterising a part

A method of characterizing a part including obtaining an X-ray tomography image of the part and then a step of correlating the image with a reference wherein the correlation step includes searching among a predefined set of X-ray tomography image transformations for a transformation that minimizes the difference between the image and the reference in order to characterize the inside of the part.

Methods and Systems for Product Failure Prediction based on X-ray Image Re-examination

In one embodiment, an X-ray inspection system may access a first set of X-ray images of one or more first samples that are labeled as being non-conforming. The system may adjust a classification algorithm based on the first set of X-ray images. The classification algorithm may classify samples into conforming or non-conforming categories based on an analysis of corresponding X-ray images. The system may analyze a second set of X-ray images of a number of second samples using the adjusted classification algorithm. The second samples may be previously inspected samples that have been classified as conforming by the classification algorithm during a previous analysis before the classification algorithm is adjusted. The system may identify one or more of the second samples from the second set of X-ray images. Each identified second sample may be classified as non-conforming by the adjusted classification algorithm.

Methods and Systems for Manufacturing Printed Circuit Board based on X-ray Inspection

In one embodiment, an X-ray inspection system may nondestructively inspect a printed circuit board to measure a number of dimensions at a number of pre-determined locations of the printed circuit board. The X-ray inspection system may generate a data set for the printed circuit board based on the measured dimensions. The X-ray inspection system may calculate one or more drilling values based on the data set of the printed circuit board. The X-ray inspection system may provide, to a drilling machine, instructions for drilling a number of plated-through vias based on the calculated drilling values for the printed circuit board.

Methods and Systems for Printed Circuit Board Design Based on Automatic Corrections

In one embodiment, a computing system may access design data of a printed circuit board to be produced by a first manufacturing process. The system may analyze the design data of the printed circuit board using a machine-learning model, wherein the machine-learning model is trained based on X-ray inspection data associated with the first manufacturing process. The system may automatically determine one or more corrections for the design data of the printed circuit board based on the analysis result by the machine-learning model.

Methods and Systems for Defects Detection and Classification Using X-rays
20210010953 · 2021-01-14 ·

In one embodiment, an automated high-speed X-ray inspection system may identify reference objects for an object of interest to be inspected. Each reference object may have a same type and components as the object of interest. The system may generate a reference model for the object of interest based on X-ray images of the reference objects. The system may determine whether the object of interest is associated with one or more defects by comparing an X-ray image of the object of interest to the reference model. The defects may be characterized by one or more pre-determined defect models and may be classified into respective defect categories based on the pre-determined defect models.

Methods and Systems for Process Control Based on X-ray Inspection
20210011177 · 2021-01-14 ·

In one embodiment, an X-ray inspection system may capture one or more X-ray images for samples of interest processed by a first tool. The X-ray inspection system may be inline with the first tool and have an inspection speed of 300 mm.sup.2 per minute or greater. The system may determine, in real-time, metrology information related to the samples of interest based on the X-ray images. The metrology information may indicate that a sample parameter associated with the samples of interest is outside of a pre-determined range. The system may provide instructions or data to one or more of the first tool or one or more second tools to adjust process parameters associated with the respective tools based on metrology information. The adjusted process parameters may reduce a processing error probability, of the respective tool for processing subsequent samples, related to the sample parameter being outside of the pre-determined range.

Methods and Systems for Detecting Defects in Devices Using X-rays

In one embodiment, an automated high-speed X-ray inspection system may generate a first X-ray image of an inspected sample at a first direction substantially orthogonal to a plane of the inspected sample. The first X-ray image may be a high-resolution grayscale image. The system may identify one or more elements of interest of the inspected sample based on the first X-ray image. The first X-ray image may include interfering elements that interfere with the one or more elements of interest in the first X-ray image. The system may determine one or more first features associated with respective elements of interest based on variations of grayscale values in the first X-ray images. The system may determine whether one or more defects are associated with the respective elements of interest based on the one or more first features associated with the element of interest.

COMPUTED TOMOGRAPHY FOR NON-DESTRUCTIVE EVALUATION OF MANUFACTURED PARTS
20200393823 · 2020-12-17 ·

A method for using computed tomography for non-destructive evaluation of a part, comprising: providing a computed tomography system; loading predetermined computed tomography system setup information; customizing settings with predetermined algorithmic parameters and functions depending on part features; processing projection counts; processing prior knowledge data relevant to the part; creating masking data from the customized settings; pre-processing reconstruction results based on the customized settings; performing algorithmic adjustments based on prior knowledge data and part geometry; performing algorithm adjustments during iterations; and post-processing reconstruction results.

METHOD FOR NON-DESTRUCTIVE TESTING OF A TURBOMACHINE PART

A method for controlling the crystallographic orientation of at least one grain of a turbo engine part. The method includes emitting a beam of electromagnetic radiation through an elementary volume of the part and record diffraction information on the electromagnetic radiation passing through the part. This step is repeated on a given area of the part. The method further includes determining the crystal spatial orientation of each of said elementary volumes and deducting the presence of at least one first crystallographic grain for which the elementary volumes are oriented according to the same crystallographic orientation. The method further includes calculating the angular difference between the crystal spatial orientation of said first grain and a predetermined direction taken from the part and comparing it to a first predetermined threshold value and determining a state of use of the part.