A control device includes an acquisition unit configured to acquire X-ray transmission images of a jig and a target object using an image acquisition device that radiates X-rays to the target object and captures an image of the X-rays passing through the target object to acquire an X-ray transmission image, a specification unit configured to specify image characteristics of the X-ray transmission image of the jig, a selection unit configured to select a trained model on the basis of the image characteristics from a plurality of trained models constructed through machine training in advance using image data, and a processing unit configured to execute image processing for removing noise from the X-ray transmission image of the target object using the selected trained model.

A laminated scintillator panel having a structure in which a scintillator layer for converting radiation into visible light and a non-scintillator layer are repeatedly laminated in a direction parallel to an incident direction of radiation, wherein the non-scintillator layer transmits the visible light.

Provided is a lattice-shaped laminated scintillator panel with high luminance, a large area, and a thick layer by means completely different from a conventional technique using a silicon wafer.

In one embodiment, an automated high-speed X-ray inspection system may generate a first X-ray image of an inspected sample at a first direction substantially orthogonal to a plane of the inspected sample. The first X-ray image may be a high-resolution grayscale image. The system may identify one or more elements of interest of the inspected sample based on the first X-ray image. The first X-ray image may include interfering elements that interfere with the one or more elements of interest in the first X-ray image. The system may determine one or more first features associated with respective elements of interest based on variations of grayscale values in the first X-ray images. The system may determine whether one or more defects are associated with the respective elements of interest based on the one or more first features associated with the element of interest.

An X-ray inspecting apparatus, with which X-rays of a broad energy band can be detected while manufacturing costs are suppressed, comprises an X-ray radiation device, a line sensor assembly, and other components. The line sensor assembly has a plurality of detection units and other components. Each detection unit has a scintillator, a detection main body including a plurality of elements disposed thereon, and a ceramic substrate supporting the scintillator and detection main body. In the line sensor assembly, the plurality of detection units etc. are aligned in a forward-backward direction so that the scintillators and the detection main bodies of the detection units etc. are aligned without gaps with the scintillators and detection main bodies of adjacent detection units.

The present invention provides: a scintillator which is reduced in the intensity of the afterglow, while having increased luminous intensity; and a charged particle radiation apparatus. A scintillator according to the present invention is characterized in that: a base material, a buffer layer, a light emitting part and a first conductive layer are sequentially stacked in this order; the light emitting part contains one or more elements that are selected from the group consisting of Ga, Zn, In, Al, Cd, Mg, Ca and Sr; and a second conductive layer is provided between the base material and the light emitting part.

An apparatus for detecting X-rays and converting the detected X-ray intensities into digital signals is disclosed. The apparatus places Analog to Digital Conversion (ADC) chips directly under a scintillator array along the X-ray beam direction and uses a shield that is placed between a photodiode substrate and an Analog to Digital Conversion (ADC) chip to block X-rays from directly reaching the dies of the ADC chips, which are sensitive to X-rays. Also an X-ray CT system utilizing the disclosed apparatus for detecting X-rays is provided.

A radiation phase change detection method includes: arranging a two-dimensional optical image pickup element, which includes a scintillator, so that, when a period of a self-image generated through a phase grating is defined as D.sub.1, and a pixel pitch of the two-dimensional optical image pickup element is defined as D.sub.2=kD.sub.1, k falls in a range of 1/2<k≦3/2, and so that interference fringes formed by D.sub.1 and D.sub.2 depending on a relationship in arrangement of the two-dimensional optical image pickup element with respect to the self-image have a period of 2 times D.sub.2 or more and 100 times D.sub.2 or less; acquiring images of the interference fringes before and after insertion of an object; and outputting an image on a phase change of the radiation caused by at least the object.

A detector assembly for a CT imaging system is provided. The detector assembly including a scintillator block including a plurality of pixels, each pixel configured to receive x-ray beams travelling in a transmission direction, a plurality of photodiodes, and a light guide coupled between the scintillator block and the plurality of photodiodes, the light guide including a plurality of light pipes, each light pipe configured to guide light emitted from a pixel of the plurality of pixels into an associated photodiode of the plurality of photodiodes, wherein each pixel has a first cross-sectional area that is substantially perpendicular to the transmission direction, wherein each photodiode has a second cross-sectional area that is substantially perpendicular to the transmission direction, and wherein the first cross-sectional area is different from the second cross-sectional area.

The present approach relates to a detector design that allows detector-based wobble using an electronic control scheme. In one implementation, each detector pixel is divided into sub-pixels. The readout of the sub-pixels can be binned with minimal noise penalty to enable the detector wobble without physically shifting the detector or alternating the physical focal spot location, though, as discussed herein alternation of the focal spot location may be used in conjunction with the present approach to further improve radial and longitudinal imaging resolution as well as suppressing artifacts resulted by limited spatial sampling.

Among other things, a detector array (300) for a radiation imaging system is provided. The detector array comprises a plurality of detector elements. Respective detector elements comprise, among other things, a scintillator (304) and a photodetector (306). In some embodiments, a scintillator is shared amongst two or more of the detector elements. In some embodiments, little to no reflective material, configured to mitigate cross-talk between detector elements, is situated between two or more detector elements.