Patent classifications
G01N2223/601
Nuclear densitometer assemblies for hydraulic fracturing
Disclosed herein are nuclear densitometer assemblies for measuring density of fracturing fluid in a pipe, which includes a nuclear densitometer assembly that may include: a lower plate; a support post extending from the lower plate, the support post capable of supporting a portion of the pipe; an upper plate; a nuclear source coupled to the upper plate; a nuclear detector coupled to the upper plate; wherein a portion of the pipe may be capable of being disposed between the nuclear source and the nuclear detector.
METHOD FOR CALIBRATING A RADIOMETRIC DENSITY MEASURING APPARATUS
The invention relates to a method for calibrating a radiometric apparatus for determining and/or monitoring density of a medium (6) located in a container (1). The method includes method steps as follows: determining the mass attenuation coefficient .sub.C of the empty container (1) with application of the half value thickness N/N.sub.0=0.5 of the radioactive radiation upon passage through the empty container (1) according to the formula: N/N.sub.0I/I.sub.0=e.sup..sup.
SYSTEM AND METHOD FOR COLORIZING A RADIOGRAPH FROM CABINET X-RAY SYSTEMS
The present disclosure relates to the field of a cabinet X-ray incorporating an X-ray tube, an X-ray detector, and a real-time camera, either high definition or standard resolution, for the production of organic and non-organic images and a system and method wherein the attained X-ray radiograph may be colorized to designate different densities. In particular, the disclosure relates to a system and method with corresponding apparatus for capturing a real-time image simultaneously with the X-ray image allowing a cabinet X-ray unit to attain and optimize images either in grayscale or colorized with exact orientation of the 2 images and display the resultant images overlaid/blended upon each other and then saved and transmitted in various formats, i.e. .jpeg., .tiff, DICOM, etc.
Methods for reconstructing an unknown object in a scanned image
A method for assigning attributes to an unknown object includes the steps of scanning the unknown object at least partially overlapping with a background object within an x-ray scanning device to provide dual-energy attenuation images having dual-energy attenuation information representing an overlap region wherein the background object and the unknown object overlap, decomposing the attenuation images into reference material equivalent path length images, removing the background object to provide reference material equivalent path lengths representing the unknown object, converting the reference material equivalent path lengths representing the unknown object into unknown object path lengths multiplied by a predetermined scaling factor, reducing the scaling factor to provide a contour of the unknown object and unknown object path lengths, and, determining a density and effective atomic number of the unknown object.
Methods for removing a background object from an image
There is provided a method for assigning an attribute to an unknown object overlapping with a predetermined background object. The unknown object is scanned overlapping with the background object within an x-ray scanning device to obtain a plurality of dual-energy attenuation images having attenuation information representing the background object and an overlap region wherein the background object and the unknown object overlap. The dual-energy attenuation images are decomposed into reference material equivalent path length images. The reference material equivalent path lengths representing the background object in the overlap region are determined and eliminated from the overlap region to provide reference material equivalent path length images having first and second reference material equivalent path lengths through only the unknown object.
Methods for extending a range for assigning attributes to an object in an image
There is provided a method for assigning an attribute to x-ray attenuation including the steps of acquiring first and second reference material equivalent path length information associated with a first range of dual-energy x-ray attenuation information, acquiring second and third reference material equivalent path length information associated with a second range of dual-energy x-ray attenuation information, and, joining the first the first dual-energy x-ray attenuation information range with the second dual-energy x-ray attenuation information range using coefficients representing dual-energy x-ray attenuation information of the second reference material to define a third dual-energy x-ray attenuation information range upon which may be imposed dual-energy x-ray attenuation values within the third dual-energy x-ray attenuation information range to determine corresponding first reference material equivalent path lengths and third reference material equivalent path lengths.
Methods for assigning a threat or safe condition to an object in an image
A method for assigning one of a safe and threat condition to an object includes determining density and effective atomic number values for a plurality of predetermined safe and threat objects, plotting the values in a probability map to correlate corresponding density and effective atomic number values with each of the safe and threat objects, scanning an object to provide dual-energy attenuation images representing the object, decomposing the attenuation images into dual-reference material equivalent path length images to provide reference material equivalent path lengths representing the object, converting the reference path lengths into object path lengths, determining the effective atomic number for each pixel representing the object, and, imposing the effective atomic number and the mass density of the unknown object onto the probability map to determine a probability that the object is correlated with one of the predetermined safe and threat objects.
ANALYSIS OF ANTIMICROBIAL COATINGS USING XRF
A method of quantifying an antimicrobial coatings using a handheld XRF analyzer is disclosed. The method provides an estimate of the expected level of antimicrobial efficacy for a thin film comprising silicon and/or titanium by obtaining a .sub.14Si or .sub.22Ti peak intensity using XRF spectroscopy and converting the obtained .sub.14Si or .sub.22Ti peak intensity to the expected level of efficacy using a calibration curve. A properly calibrated handheld XRF analyzer allows a user to assess the viability of antimicrobial coatings in the field, such as in a hospital where various fomites may be coated with silane and/or titanium compositions.
Techniques for using oxide thickness measurements for predicting crack formation and growth history in high-temperature metallic components
A method and system to develop the age and history of a crack by exposing a specimen or component to varying predetermined temperature range that covers the designated service temperatures and measuring the thickness of the oxide across the specimen along the thickness direction.
Methods and systems for imaging and analyzing wood blanks and billets
An X-ray system for analyzing materials includes an X-ray source, an X-ray detector and a sample platform, and a controller configured to generate a radiograph of material on the sample platform by selectively energizing the X-ray source to emit X-rays through the material to the X-ray detector along a scanned length of the material, calculate a plurality of measured density values along the scanned length of the material, calculate a plurality of model density values of the material from one or more of settings of the X-ray system, characteristics of the material along the scanned length of the material, and a longitudinal density variation for a particular application, compute a difference between the measured density values and the model density values and determine if the longitudinal density variation has been exceeded, and provide an alert as to whether the longitudinal density variation has been exceeded.