Molecular structure of a crystal may be solved based on at least two diffraction tilt series acquired from a sample. The two diffraction tilt series include multiple diffraction patterns of at least one crystal of the sample acquired at different electron doses. In some examples, the two diffraction tilt series are acquired at different magnifications.

A 3D printed hybrid nozzle device combining a microfluidic mixer with a liquid jet injector that addresses the bottleneck of investigating substrate-initiated biological reaction paths employing serial crystallography with XFELs. The hybrid nozzle provides for injecting aqueous protein crystal jets after fast mixing (<5 ms), reaching reaction time points (e.g., about 10 ms to about 150 ms) suitable to resolve enzyme kinetics.

A method and a cryogenic sample positioning system are provided which include: a sample holder cassette that is vertically coupled to a carousel gear through a first shaft. Each sample holder cassette has a first degree of rotation about the first shaft. A first planet drive gear underlies and is vertically coupled to the carousel gear through a second shaft that extends from the carousel gear through the first planet drive gear. The carousel gear has a second degree of rotation about the second shaft that is different from the first degree of rotation. A planet gear that is laterally connected to a second planet drive gear is interposed between each of the carousel gear and the first planet drive gear. Each of the planet gear and the second planet drive gear selectively define the first degree of rotation, without affecting the second degree of rotation of the carousel gear.

A system for sorting of diamonds is provided. The system comprises a conveying system including a conveyer belt to transport material sample including diamonds. Further, the system comprises an x-ray source configured to fire x-rays at the material sample. Furthermore, the system comprises an x-ray luminescence (XRL) detector configured to measure radiated intensity of the x-rays from the material sample. Additionally, the system comprises an x-ray transmission (XRT) detector configured to measure transmitted intensity of the x-rays through the material sample. Also, the system comprises a processor that is configured to: receive the radiated intensity and the transmitted intensity from the XRL detector and the XRT detector respectively; process the radiated intensity and the transmitted intensity to determine an equivalent absorption coefficient; and identify the material sample as diamond based on a comparison of the equivalent absorption coefficient and a pre-stored model species absorption coefficient.

The present invention is directed to solvated crystalline polynuclear metal complexes which solvation is with a polar solvent or a mixture of polar and non-polar solvent. These polar solvated crystalline metal complexes of the present invention can absorb an analyte guest compound, including an polar analyte guest compound, to form a crystal structure analysis sample. The molecular structure of the analyte guest compound can be determined by X-ray crystallography using the crystal structure analysis sample obtained with such solvated crystalline polynuclear metal complexes.

Methods and systems are provided for serial femtosecond crystallography for reducing the vast amount of waste of injected crystals practiced with traditional continuous flow injections. A micrometer-scale 3-D printed water-in-oil droplet generator device includes an oil phase inlet channel, an aqueous phase inlet channel, a droplet flow outlet channel, and two embedded non-contact electrodes. The inlet and outlet channels are connected internally at a junction. The electrodes comprise gallium metal injected within the 3-D printed device. Voltage across the electrodes generates water-in-oil droplets, determines a rate for a series of droplets, or triggers a phase shift in the droplets. An external trigger generates the droplets based on the frequency of an XFEL utilized in droplet detection, thereby synchronizing a series of droplets with x-ray pulses for efficient crystal detection. The generated droplets can be coupled to an SFX with XFEL experiment compatible with common liquid injector such as a GDVN.

An example method includes obtaining one or more three dimensional computer models that model geometric and material properties of a component, and model beam properties of a beam of radiation to be applied to the component; utilizing the one or more three dimensional computer models to obtain simulated radiation imaging data, which includes simulated elastic scattering data, resulting from a simulated application of the beam having the beam properties on a plurality of discretized samples of the component, and which accounts for sequential interactions of rays of the beam with multiple ones of the plurality of discretized samples; obtaining actual radiation imaging data, which includes actual elastic scattering data, of an output beam pattern caused by application of a non-simulated beam of radiation having the beam properties to the component; and performing at least one of: determining whether an anomaly exists in a crystalline structure of the component based a comparison of the simulated elastic scattering data to the actual elastic scattering data; and modifying the actual radiation imaging data based on the simulated elastic scattering data to at least partially remove the actual elastic scattering data from the actual radiation imaging data. A corresponding system is also disclosed.

An example system for analyzing a component includes a radiation source configured to transmit an input radiation beam towards a component, at least a portion of the input radiation beam passing through the component as an output beam pattern; a radiation detector configured to detect the output beam pattern; and a beam adjustment device disposed between the radiation source and the component and configured to modify a radiation intensity profile of the input radiation beam, wherein the beam adjustment device has an adjustable radiation transparency. A method of analyzing a component is also disclosed, which includes transmitting an input radiation beam from a radiation source towards a component, at least a portion of the input radiation beam passing through the component as an output beam pattern; modifying a radiation intensity profile of the input radiation beam by passing the input radiation beam through a beam adjustment device disposed between the radiation source and the component, wherein the beam adjustment has an adjustable radiation transparency; and detecting the output beam pattern at a radiation detector.

A method and a cryogenic sample positioning system are provided which include: a sample holder cassette that is vertically coupled to a carousel gear through a first shaft. Each sample holder cassette has a first degree of rotation about the first shaft. A first planet drive gear underlies and is vertically coupled to the carousel gear through a second shaft that extends from the carousel gear through the first planet drive gear. The carousel gear has a second degree of rotation about the second shaft that is different from the first degree of rotation. A planet gear that is laterally connected to a second planet drive gear is interposed between each of the carousel gear and the first planet drive gear. Each of the planet gear and the second planet drive gear selectively define the first degree of rotation, without affecting the second degree of rotation of the carousel gear.

A method and system for checking a gauge response is described. The method includes positioning samples with known profiles and uniform compositions between a radiation source and a subset of detectors in a detector array linearly arranged in a first direction. Sample signals are generated by irradiating the samples with radiation from the radiation source and detecting radiation transmitted through the samples and to the subset of detectors. The method includes inputting the sample signals into calibrations for each of the subset of detectors and each of the one or more samples, thereby determining values corresponding to each of the one or more samples and each of the subset of detectors. The method determines if the values corresponding to the one or more samples are consistent with the know values of the samples, and thereby provides an indication as to the state of calibration of the gauge.