A method for evaluation of a resin alloy includes identifying and quantifying individual materials contained in the resin alloy. In addition, the method can identify encapsulation and whether or not a single phase is formed, without an additional equipment, allowing easier analysis and evaluation of various alloy materials through evaluation of physical properties of resin alloys.

The present invention refers to a method for improving a Transmission Kikuchi Diffraction, TKD pattern, wherein the method comprises the steps of: Detecting a TKD pattern (20b) of a sample (12) in an electron microscope (60) comprising at least one active electron lens (61) focussing an electron beam (80) in z-direction on a sample (12) positioned in distance D below the electron lens (61), the detected TKD (20b) pattern comprising a plurality of image points x.sub.D, y.sub.D and mapping each of the detected image points x.sub.D, y.sub.D to an image point of an improved TKD pattern (20a) with the coordinates x.sub.0, y.sub.0 by using and inverting generalized terms of the form x.sub.D=γ*A+(1−γ)*B and y.sub.D=γ*C+(1−γ)*D wherein

[00001]$\gamma =\frac{Z}{D}$ with Z being an extension in the z-direction of a cylindrically symmetric magnetic field B.sub.Z of the electron lens (61), and wherein A, B, C, D are trigonometric expressions depending on the coordinates x.sub.0, y.sub.0, with B and D defining a rotation around a symmetry axis of the magnetic field B.sub.Z, and with A and C defining a combined rotation and contraction operation with respect to the symmetry axis of the magnetic field B.sub.Z. The invention further relates to a measurement system, computer program and computer-readable medium for carrying out the method of the invention.

A diffraction apparatus and a method for non-destructively testing internal crystal orientation uniformity of a workpiece are provided. The apparatus includes: an X-ray irradiation system for irradiating an X-ray to a measured part of a sample under testing, and an X-ray detection system for simultaneously detecting a plurality of diffracted X-rays formed by diffraction of a plurality of parts of the sample under testing, to measure an X-ray diffraction intensity distribution of the sample under testing, where the detected diffracted X-rays are short-wavelength characteristic X-rays, and the X-ray detection system is an array detection system. By the apparatus and the method, the detection efficiency is greatly improved.

Provided are an operation guide system, an operation guide method, and an operation guide program, which are capable of allowing a user to easily understand measurement of an X-ray optical system to be selected. A quantitative phase analysis device includes qualitative phase analysis result acquisition means for acquiring information on a plurality of crystalline phases contained in a sample, and weight ratio calculation means for calculating a weight ratio of the plurality of crystalline phases based on a sum of diffracted intensities corrected with respect to a Lorentz-polarization factor, a chemical formula weight, and a sum of squares of numbers of electrons belonging to each of atoms contained in a chemical formula unit, in the plurality of crystalline phases.

The present invention discloses, a full-view-field quantitative statistical distribution representation method for microstructures of phases in a metal material, comprising the following steps: step a: labeling phases, cloud clutters and matrixes by Labelme, and then making standard feature training samples; step b: building a deep learning-based feature recognition and extraction model by means of BDU-Net; step e: collecting feature maps in the metal material to be detected; step d: automatically recognizing and extracting the phases; and step e: performing in-situ quantitative statistical distribution representation on the phases in the full view field within a large range. The full-view-field quantitative statistical distribution representation method for microstructures of phases in a metal material provided by the present invention realizes automatic, high-speed and high-quality recognition and extraction of features of phases in the metal material

A method of determining opal-C and cristobalite contents of a product that comprises diatomite is disclosed. The method may comprise performing thermal processing to determine a loss on ignition for a representative first portion of a sample of the product; identifying and quantifying primary and secondary peaks present in a first diffraction pattern that results from bulk powder X-ray Diffraction on a representative second portion of the sample; and using a known standard sample of cristobalite to determine whether the primary and secondary peaks present in the first diffraction pattern indicate the presence of opal-C or cristobalite in the product.

Chemical components in a mixture are analysed using scattering data representing the results of a diffraction experiment performed on the mixture. Using non-negative matrix factorisation or another optimisation technique, the scattering data is deconvolved into non-negative basis components that represent contributions to the scattering data from each chemical component and fitting coefficients are derived in respect of the basis components that represent the proportions of chemical components in the mixture.

The present disclosure concerns an electron microscopy method, including the emission of a precessing electron beam and the acquisition, at least partly simultaneous, of an electron diffraction pattern and of intensity values of X rays.

A method for displaying measurement results from X-ray diffraction measurement, in which a sample is irradiated with X-rays and the X-rays diffracted by the sample are detected by an X-ray detector, comprises: (1) forming a one-dimensional diffraction profile by displaying, on the basis of output data from an X-ray detector, a profile in which one orthogonal coordinate axis shows 2 angle values and another orthogonal coordinate axis shows X-ray intensity values; (2) forming a two-dimensional diffraction pattern by linearly displaying X-ray intensity data, for each 2 angle value and on the basis of output data from the X-ray detector; the X-ray intensity data being present in the circumferential direction of a plurality of Debye rings formed at each 2 angle by diffracted X-rays; and (3) displaying the two-dimensional diffraction pattern and the one-dimensional diffraction profile so as to be aligned such that the 2 angle values of both coincide with each other.

An X-ray diffraction analysis method includes, placing a sample on a sample stage and acquiring a two-dimensional X-ray diffraction image from the sample using a two-dimensional detection circuit by irradiating the sample with an X-ray in a state where an X-ray irradiation angle is fixed, specifying a collection of diffraction spots having a predetermined range of diffraction angles from the X-ray diffraction image as a diffraction spot group, counting the number of diffraction spots having predetermined intensity or more in the diffraction spot group, grouping the diffraction spot group based on the number of diffraction spots, and identifying a crystal phase contained in the sample based on a diffraction angle of the grouped diffraction spot group.