Patent classifications
G01N2223/624
SCANNING ELECTRON MICROSCOPE AND METHOD FOR ANALYZING SECONDARY ELECTRON SPIN POLARIZATION
A scanning electron microscope includes a spin detector configured to measure spin polarization of a secondary electron emitted from a sample, and an analysis device configured to analyze measurement data of the spin detector. The analysis device determines a width of a region where the secondary electron spin polarization locally changes in the measurement data. The analysis device further evaluates a strain in the sample based on the width of the region. With a configuration of the scanning electron microscope, it is possible to perform analysis of a strain in a magnetic material with high accuracy.
METHOD FOR MEASURING RESIDUAL STRESS
The present invention is a method for measuring a residual stress in a cast and forged steel product, the method using X-rays, including: irradiating a cast and forged steel product with X-rays; two-dimensionally detecting intensities of diffracted X-rays originating from the X-rays; and calculating a residual stress based on a diffraction ring formed by an intensity distribution of the diffracted X-rays detected in the detecting, wherein, when the residual stress is measured for each of a plurality of measurement positions of the cast and forged steel product, the residual stress for each of the measurement positions is calculated in the calculating based on the diffraction ring for each of the measurement positions and an X-ray elastic constant which varies for each of the measurement positions.
METHODS AND SYSTEMS FOR INCLUSION ANALYSIS
Various methods and systems are provided for analyzing sample inclusions. As one example, a correction factor may be generated based on inclusion properties of a first sample determined using both an optical emission spectrometry (OES) system and a charged-particle microscopy with energy dispersive X-ray spectroscopy (CPM/EDX) system. The OES system may be calibrated with the correction factor. The inclusion properties of a second, different, sample may be determined using the calibrated OES system.
Analysis device
An analyzer capable of having a pressure value converge to a set vacuum value P in a short time is provided. An analyzer includes a sample chamber in which a sample is placed, an analysis chamber including an X-ray tube and a detector, a gate valve switching between a connecting state where the inside of the sample chamber and the inside of the analysis chamber are connected together and a disconnecting state where the insides of the chambers and are disconnected from each other, a vacuum pump and a pressure regulatory valve connected to the inside of the sample chamber and the inside of the analysis chamber, and a control unit controlling the degree of opening of the pressure regulatory valve to set the internal pressure of the sample chamber and the internal pressure of the analysis chamber at respective set pressure values in the connecting state.
METHOD FOR MEASURING STRESS
A method for measuring the stress of a concave section of a test subject which comprises a metal and has a surface and a concave section, the method including: a detection step for detecting, using a two-dimensional detector, a diffraction ring of diffracted X-rays which is formed by causing X-rays to be incident on the concave section and to be diffracted by the concave section; and a calculation step for calculating the stress of the concave section on the basis of the detection results during the detection step. Therein, the detection step involves causing X-rays to be incident on each of a plurality of sites inside the concave section of the test subject, and detecting, using a two-dimensional detector, the diffraction ring formed by the diffraction of the X-rays by the concave section.
Techniques for using oxide thickness measurements for predicting crack formation and growth history in high-temperature metallic components
A method and system to develop the age and history of a crack by exposing a specimen or component to varying predetermined temperature range that covers the designated service temperatures and measuring the thickness of the oxide across the specimen along the thickness direction.
METHOD FOR MEASURING STRESS
A method that measures stress of a test subject including a metal includes: detecting, using a two-dimensional detector, a diffraction ring of diffracted X-rays which is formed by causing X-rays from an irradiation unit to be incident on the test subject and to be diffracted by the test subject; and calculating the stress of the test subject based on detection results during the detection step. Therein, the detection step involves causing X-rays from the irradiation unit to be incident on each of a plurality of sites on the test subject with the irradiation unit angled relative to the test subject in a manner such that the angle of incidence on the test subject is within the range of 5-20, inclusive, and detecting, using a two-dimensional detector, the diffraction ring formed by the diffraction of the X-rays by the test subject.
SYSTEM AND METHOD OF PRODUCING A COMPUTER-GENERATED IMAGE OF A COMPONENT PART USING COMPUTED TOMOGRAPHY
A method of producing a computer-generated image of a component part includes receiving scan data of the component part. The scan data includes a plurality of slices that change direction about a normal vector. The method further includes registering the scan data of the component part and transforming the scan data of the component part into a set of slices arranged in an x-y plane. Further, the method includes aligning the set of slices aligned along the axis along an axis in the x-y plane. In addition, the method includes adjusting the set of slices aligned along the axis using a background model for the component part, the scan data, or both. Thus, the method includes applying a directional filter to the set of slices aligned along the axis and generating the computer-generated image of the component part using the filtered set of slices aligned along the axis.
Controlling process parameters by means of radiographic online determination of material properties when producing metallic strips and sheets
A method and a device for determining the material properties of a polycrystalline, in particular metallic, product during production or quality control of the polycrystalline, in particular metallic, product by means of X-ray diffraction using at least one X-ray source and at least one X-ray detector. In this case, an X-ray generated by the X-ray source is directed onto a surface of the polycrystalline product and the resulting diffraction image of the X-ray is recorded by the X-ray detector. After exiting the X-ray source, the X-ray is passed through an X-ray mirror, wherein the X-ray is both monochromatized and focused, by the X-ray mirror, in the direction of the polycrystalline product and/or the X-ray detector, and then reaches a surface of the metallic product.
METHOD OF EVALUATING CENTRAL SEGREGATION IN STEEL
A method of evaluating central segregation in steel with excellent correlation with HIC susceptibility is provided. A method of evaluating central segregation in steel includes: taking a sample from a steel, the sample having a cross section including a central segregation area; measuring an area ratio of an inclusion containing a segregation metal element in a region to be measured including the central segregation area in the cross section; and evaluating central segregation in the steel based on the area ratio measured.