Patent classifications
G01N2223/624
On-line coating adhesion determination apparatus of galvannealed steel sheet, and galvannealed steel sheet manufacturing line
An on-line coating adhesion determination apparatus of a galvannealed steel sheet, includes: an X-ray tube which irradiates a galvannealed steel sheet that travels on a transportation line, with X-rays; an optical system which allows the X-rays emitted from the X-ray tube to irradiate the galvannealed steel sheet as a parallel beam and be diffracted; and a detector which measures the intensity of the diffracted X-rays and is installed at a position at which the X-ray diffraction peak corresponding to a crystal lattice spacing d of 1.5 or higher is detected, in which an emitted beam luminance of the X-rays is 20 W/mm.sup.2 or higher, and the width-direction gain of the X-rays in the optical system is 0.15 or higher. The crystal lattice spacing d may be 1.914 . In addition, the energy of the incident X-rays from the X-ray tube may be lower than the excitation energy of Fe-K fluorescence X-ray.
Inspection method for bearing part and inspection apparatus for bearing part
An inspection method for a bearing part includes the steps of: emitting X-rays onto a fatigued portion of a bearing part to be inspected; detecting annular diffracted X-rays (X-ray diffraction ring) diffracted by the fatigued portion; and estimating a use condition of the bearing part to be inspected, based on the detected annular diffracted X-rays (X-ray diffraction ring).
METHOD FOR CALCULATING FILM THICKNESS OF GRAIN BOUNDARY OXIDE LAYER, METHOD FOR DETERMINING PLATING PROPERTIES, METHOD FOR MANUFACTURING PLATED STEEL SHEET, AND FILM THICKNESS CALCULATION DEVICE
A method for calculating a film thickness of a grain boundary oxide layer remaining on a steel sheet after a pickling treatment, may include: an intensity-measuring in which a fluorescent X-ray intensity of an element being contained in the steel sheet and constituting an oxide in the grain boundary oxide layer is measured; and a film thickness-calculating in which a film thickness of the grain boundary oxide layer is calculated based on: a correlation between a pre-extracted fluorescent X-ray intensity and the film thickness of the grain boundary oxide layer; and the fluorescent X-ray intensity measured in the intensity-measuring.
System and method for determining mass fractions in a test sample with wave-length dispersive x-ray fluorescence spectrometers
System, method and computer program product for determining mass fractions of one or more elements in a test sample based on a measurement with a wave-length dispersive x-ray fluorescence (WDX) spectrometer measuring gross intensities associated with respective elements with to-be-determined mass fractions (MFi) in the test sample. A mass fraction module determines mass fractions (MFi) by using a calibration equation (CE1) with the respective measured gross intensity and a respective calculated scattering efficiency as inputs. The calibration equation (CE1) associates net intensities of characteristic fluorescence lines of the sample elements with respective mass fractions. The net intensity for a particular peak is obtained by subtracting a respective calculated scattering efficiency times a scaling factor from the calibration equation (CE1) from the measured gross intensity of the particular peak. The elemental composition of the test sample is determined either via an iteration module or via an EDX quantification module.